JPS6479364A - Material having c-axis oriented bi2wo6 crystal film and production thereof - Google Patents

Material having c-axis oriented bi2wo6 crystal film and production thereof

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Publication number
JPS6479364A
JPS6479364A JP23679487A JP23679487A JPS6479364A JP S6479364 A JPS6479364 A JP S6479364A JP 23679487 A JP23679487 A JP 23679487A JP 23679487 A JP23679487 A JP 23679487A JP S6479364 A JPS6479364 A JP S6479364A
Authority
JP
Japan
Prior art keywords
bi2wo6
vapor deposited
crystal
axis oriented
crystal film
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP23679487A
Other languages
Japanese (ja)
Other versions
JPH089768B2 (en
Inventor
Toshio Takada
Takahito Terajima
Hisanori Bando
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Research Institute for Production Development
Original Assignee
Research Institute for Production Development
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Research Institute for Production Development filed Critical Research Institute for Production Development
Priority to JP23679487A priority Critical patent/JPH089768B2/en
Publication of JPS6479364A publication Critical patent/JPS6479364A/en
Publication of JPH089768B2 publication Critical patent/JPH089768B2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

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  • Physical Vapour Deposition (AREA)

Abstract

PURPOSE:To form a C-axis oriented Bi2WO6 crystal film in a low temp. range by repeating the operations of first evaporating Bi onto the surface of a base material on which a vapor deposited layer of SO3 is formed, then evaporating WO3 thereof to form the vapor deposited layer. CONSTITUTION:The vapor deposited WO3 layer is formed on the surface of the substrate consisting of an MgO single crystal, etc., in a vacuum vessel where a slight quantity of oxygen exists to form the base material having the (001) face of the WO3 single crystal on the surface. The substrate is heated to evaporate the Bi first so that the vapor deposited Bi2O2 layer corresponding to the thickness of the Bi2O2 in the C-axis direction of the unit lattice of the Bi2O6 crystal is formed thereon. The WO3 is then evaporated to form the vapor deposited layer corresponding to the thickness of the WO4 in the C-axis direction of the unit lattice of the Bi2WO6 crystal. The evaporation of the Bi and WO3 is repeated. The evaporation of the WO3 is otherwise substd. partly with the evaporation of MoO3. The material having the C-axis oriented Bi2WO6 crystal film which is preferably as a dielectric or piezo-electric material is thereby obtd.
JP23679487A 1987-09-21 1987-09-21 Material having C-axis oriented Bi-2 under WO-6-based crystal film and manufacturing method thereof Expired - Lifetime JPH089768B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP23679487A JPH089768B2 (en) 1987-09-21 1987-09-21 Material having C-axis oriented Bi-2 under WO-6-based crystal film and manufacturing method thereof

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP23679487A JPH089768B2 (en) 1987-09-21 1987-09-21 Material having C-axis oriented Bi-2 under WO-6-based crystal film and manufacturing method thereof

Publications (2)

Publication Number Publication Date
JPS6479364A true JPS6479364A (en) 1989-03-24
JPH089768B2 JPH089768B2 (en) 1996-01-31

Family

ID=17005890

Family Applications (1)

Application Number Title Priority Date Filing Date
JP23679487A Expired - Lifetime JPH089768B2 (en) 1987-09-21 1987-09-21 Material having C-axis oriented Bi-2 under WO-6-based crystal film and manufacturing method thereof

Country Status (1)

Country Link
JP (1) JPH089768B2 (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN110273165A (en) * 2019-07-24 2019-09-24 台州学院 A kind of method that lower temperature plasma technology prepares oxygen defect type bismuth tungstate optoelectronic pole
CN117535649A (en) * 2023-11-07 2024-02-09 南开大学 Method for preparing two-dimensional wide-forbidden-band bismuth tungstate semiconductor nano-film by chemical vapor deposition
CN120117655A (en) * 2025-03-04 2025-06-10 天津理工大学 A bismuth sulfide/bismuth tungstate/tungsten trioxide photoanode and its preparation method and application in photoelectrocatalytic hydrogen evolution

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN110273165A (en) * 2019-07-24 2019-09-24 台州学院 A kind of method that lower temperature plasma technology prepares oxygen defect type bismuth tungstate optoelectronic pole
CN117535649A (en) * 2023-11-07 2024-02-09 南开大学 Method for preparing two-dimensional wide-forbidden-band bismuth tungstate semiconductor nano-film by chemical vapor deposition
CN120117655A (en) * 2025-03-04 2025-06-10 天津理工大学 A bismuth sulfide/bismuth tungstate/tungsten trioxide photoanode and its preparation method and application in photoelectrocatalytic hydrogen evolution

Also Published As

Publication number Publication date
JPH089768B2 (en) 1996-01-31

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