JPS6479603A - Scanning tunnel microscope - Google Patents
Scanning tunnel microscopeInfo
- Publication number
- JPS6479603A JPS6479603A JP62238010A JP23801087A JPS6479603A JP S6479603 A JPS6479603 A JP S6479603A JP 62238010 A JP62238010 A JP 62238010A JP 23801087 A JP23801087 A JP 23801087A JP S6479603 A JPS6479603 A JP S6479603A
- Authority
- JP
- Japan
- Prior art keywords
- stage
- elements
- stm
- sem
- electrostriction
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Landscapes
- Measurement Of Length, Angles, Or The Like Using Electric Or Magnetic Means (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
Abstract
PURPOSE:To obtain a high performance STM image by solving the problem of the damping properties in the combination apparatus of a scanning tunnel microscope STM and a low power microscope SET, by interposing an electrostriction element between the member connected to the objective lens of the SEM and a specimen stand. CONSTITUTION:The base stand 2 of a specimen stand 9 is connected to the frame body 1b of an objective lens 1 and drive mechanisms of X-, Y- and Z-directions are provided to the stage 9. A scanning needle 4 and the support members 6a, 6b of electrostriction elements 5a-5c are connected to the frame body 1b and the electrostriction elements 7, 8 connected to the members 6a, 6b have slight gaps from the stage 9 and, at the time of the observation by an STM, the elements 7, 8 are extended to press the stage 9 to make it possible to stop the movement and vibration of the stage 9. By this constitution, the elements 7, 8 are contracted at the time of the observation by an SEM to make it possible to drive the stage 9 and the surface of a specimen 3 is irradiated with electron beam from the gaps of the elements 5a-5c so as to be scanned thereby. Therefore, the problem of the damping properties in the combination apparatus of the STM and the SEM is solved and a high performances STM image is obtained.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP62238010A JPH0682042B2 (en) | 1987-09-22 | 1987-09-22 | Scanning tunneling microscope |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP62238010A JPH0682042B2 (en) | 1987-09-22 | 1987-09-22 | Scanning tunneling microscope |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS6479603A true JPS6479603A (en) | 1989-03-24 |
| JPH0682042B2 JPH0682042B2 (en) | 1994-10-19 |
Family
ID=17023803
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP62238010A Expired - Lifetime JPH0682042B2 (en) | 1987-09-22 | 1987-09-22 | Scanning tunneling microscope |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0682042B2 (en) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH0264401A (en) * | 1988-08-31 | 1990-03-05 | Seiko Instr Inc | Scanning tunneling microscope |
| JPH0413904A (en) * | 1990-05-08 | 1992-01-17 | Hitachi Ltd | scanning tunneling microscope |
-
1987
- 1987-09-22 JP JP62238010A patent/JPH0682042B2/en not_active Expired - Lifetime
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH0264401A (en) * | 1988-08-31 | 1990-03-05 | Seiko Instr Inc | Scanning tunneling microscope |
| JPH0413904A (en) * | 1990-05-08 | 1992-01-17 | Hitachi Ltd | scanning tunneling microscope |
| US5256876A (en) * | 1990-05-08 | 1993-10-26 | Hitachi Ltd. | Scanning tunnel microscope equipped with scanning electron microscope |
Also Published As
| Publication number | Publication date |
|---|---|
| JPH0682042B2 (en) | 1994-10-19 |
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