JPS6480077A - Conductivity-modulation mosfet - Google Patents
Conductivity-modulation mosfetInfo
- Publication number
- JPS6480077A JPS6480077A JP62234879A JP23487987A JPS6480077A JP S6480077 A JPS6480077 A JP S6480077A JP 62234879 A JP62234879 A JP 62234879A JP 23487987 A JP23487987 A JP 23487987A JP S6480077 A JPS6480077 A JP S6480077A
- Authority
- JP
- Japan
- Prior art keywords
- regions
- region
- running
- conductivity
- resistance
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D12/00—Bipolar devices controlled by the field effect, e.g. insulated-gate bipolar transistors [IGBT]
- H10D12/411—Insulated-gate bipolar transistors [IGBT]
- H10D12/441—Vertical IGBTs
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D62/00—Semiconductor bodies, or regions thereof, of devices having potential barriers
- H10D62/10—Shapes, relative sizes or dispositions of the regions of the semiconductor bodies; Shapes of the semiconductor bodies
- H10D62/13—Semiconductor regions connected to electrodes carrying current to be rectified, amplified or switched, e.g. source or drain regions
- H10D62/141—Anode or cathode regions of thyristors; Collector or emitter regions of gated bipolar-mode devices, e.g. of IGBTs
- H10D62/142—Anode regions of thyristors or collector regions of gated bipolar-mode devices
Landscapes
- Bipolar Transistors (AREA)
Abstract
PURPOSE:To provide the title conductivity-modulation MOSFET with high resistance to latch up while decreasing the on-resistance by a method wherein p<+> and n<+> high concentration impurity regions are alternately formed below a low concentration anode region of the title MOSFET to form new current routes. CONSTITUTION:N<+> substrate regions 1 and p<+> substrate regions 2 are alternately formed in specified pitches below a p region 3. Thus, the route of electrons running from a source to an n base region 4 to be a drain through a MOS transistor is divided into two parts. One is running from the n base region 4 and an n<+> buffer region 13 to the regions 2 through the regions 3 while the other is running from the region 4 and the region 13 to the regions 1 through the region 3. Consequently, without increasing the hole injection for the conductivity modulation, the quantity of electrons running through the junction of the substrate regions 1, 2 and the regions 3 and 13 formed on the substrate regions 1, 2 can be increased while decreasing the on-resistance.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP62234879A JPS6480077A (en) | 1987-09-21 | 1987-09-21 | Conductivity-modulation mosfet |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP62234879A JPS6480077A (en) | 1987-09-21 | 1987-09-21 | Conductivity-modulation mosfet |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS6480077A true JPS6480077A (en) | 1989-03-24 |
Family
ID=16977754
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP62234879A Pending JPS6480077A (en) | 1987-09-21 | 1987-09-21 | Conductivity-modulation mosfet |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS6480077A (en) |
Cited By (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH03204976A (en) * | 1989-10-20 | 1991-09-06 | Fuji Electric Co Ltd | Semiconductor device |
| DE4114349A1 (en) * | 1990-05-10 | 1991-11-14 | Fuji Electric Co Ltd | Bipolar transistor with insulated gate - has drain zone with inset zone of high impregnation concn. |
| JPH0472669A (en) * | 1990-05-10 | 1992-03-06 | Fuji Electric Co Ltd | Insulated-gate bipolar transistor |
| US5141889A (en) * | 1990-11-30 | 1992-08-25 | Motorola, Inc. | Method of making enhanced insulated gate bipolar transistor |
| US5182626A (en) * | 1989-09-20 | 1993-01-26 | Mitsubishi Denki Kabushiki Kaisha | Insulated gate bipolar transistor and method of manufacturing the same |
| EP0578973A1 (en) * | 1992-06-12 | 1994-01-19 | Kabushiki Kaisha Toshiba | Method of forming short-circuiting regions for insulated gate semiconductor devices |
| US5289019A (en) * | 1991-07-24 | 1994-02-22 | Mitsubishi Denki Kabushiki Kaisha | Insulated gate bipolar transistor |
| JP2003031809A (en) * | 2001-07-17 | 2003-01-31 | Mitsubishi Electric Corp | Insulated gate bipolar transistor |
-
1987
- 1987-09-21 JP JP62234879A patent/JPS6480077A/en active Pending
Cited By (11)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5182626A (en) * | 1989-09-20 | 1993-01-26 | Mitsubishi Denki Kabushiki Kaisha | Insulated gate bipolar transistor and method of manufacturing the same |
| US5292672A (en) * | 1989-09-20 | 1994-03-08 | Mitsubishi Denki Kabushiki Kaisha | Method of manufacturing an insulated gate bipolar transistor |
| JPH03204976A (en) * | 1989-10-20 | 1991-09-06 | Fuji Electric Co Ltd | Semiconductor device |
| DE4114349A1 (en) * | 1990-05-10 | 1991-11-14 | Fuji Electric Co Ltd | Bipolar transistor with insulated gate - has drain zone with inset zone of high impregnation concn. |
| JPH0472669A (en) * | 1990-05-10 | 1992-03-06 | Fuji Electric Co Ltd | Insulated-gate bipolar transistor |
| DE4114349C2 (en) * | 1990-05-10 | 2001-05-31 | Fuji Electric Co Ltd | Insulated Gate Bipolar Transistor (IGBT) |
| US5141889A (en) * | 1990-11-30 | 1992-08-25 | Motorola, Inc. | Method of making enhanced insulated gate bipolar transistor |
| US5289019A (en) * | 1991-07-24 | 1994-02-22 | Mitsubishi Denki Kabushiki Kaisha | Insulated gate bipolar transistor |
| EP0578973A1 (en) * | 1992-06-12 | 1994-01-19 | Kabushiki Kaisha Toshiba | Method of forming short-circuiting regions for insulated gate semiconductor devices |
| JP2003031809A (en) * | 2001-07-17 | 2003-01-31 | Mitsubishi Electric Corp | Insulated gate bipolar transistor |
| US7250639B1 (en) | 2001-07-17 | 2007-07-31 | Mitsubishi Denki Kabushiki Kaisha | Insulated gate bipolar transistor |
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