JPS6488341A - Infrared spectrochemical analysis apparatus - Google Patents
Infrared spectrochemical analysis apparatusInfo
- Publication number
- JPS6488341A JPS6488341A JP24757587A JP24757587A JPS6488341A JP S6488341 A JPS6488341 A JP S6488341A JP 24757587 A JP24757587 A JP 24757587A JP 24757587 A JP24757587 A JP 24757587A JP S6488341 A JPS6488341 A JP S6488341A
- Authority
- JP
- Japan
- Prior art keywords
- light
- optical path
- interference
- sample
- mirror
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 230000003287 optical effect Effects 0.000 abstract 4
- 238000000862 absorption spectrum Methods 0.000 abstract 2
- 238000010521 absorption reaction Methods 0.000 abstract 1
- 230000035945 sensitivity Effects 0.000 abstract 1
- 230000003595 spectral effect Effects 0.000 abstract 1
Landscapes
- Investigating Or Analysing Materials By Optical Means (AREA)
Abstract
PURPOSE:To easily obtain the IR absorption spectrum of a single component even with a sample in which different materials unidentifiable by an ordinary visible light image co-exist by providing polarizing means movable freely to the inside and outside of an optical path between an optical path and the sample to said optical path. CONSTITUTION:A polarizer 2 and an eyepiece 5 are moved to the outside of the optical path and an IR light source 13 is lighted up. The IR light emitted from the light source 13 is split by an interferometer 11 to interference light. The interference light is projected by a concave mirror 19 to a mirror 17 rotated in a desired direction and after the light reflects on the mirror 17, the light traces the same course as the course of visible light and transmits the sample 3; thereafter, the light passes a stop 10 which is so adjusted as to allow the passage of only the light transmitted through a part to be analyzed. The interference light past the stop 10 arrives at a high- sensitivity detector 12 after condensing 14 and is detected 12. The detected light is converted to an electric signal which is sent to a computing means 15 by which the processing such as Fourier transform is executed in accordance with the interference conditions of the interferometer 11 and the spectral intensity is calculated. The IR absorption spectrum obtd. in such a manner exactly reflects the IR absorption characteristic of the part to be analyzed.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP24757587A JPS6488341A (en) | 1987-09-30 | 1987-09-30 | Infrared spectrochemical analysis apparatus |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP24757587A JPS6488341A (en) | 1987-09-30 | 1987-09-30 | Infrared spectrochemical analysis apparatus |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS6488341A true JPS6488341A (en) | 1989-04-03 |
Family
ID=17165536
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP24757587A Pending JPS6488341A (en) | 1987-09-30 | 1987-09-30 | Infrared spectrochemical analysis apparatus |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS6488341A (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH04294255A (en) * | 1991-03-22 | 1992-10-19 | Shimadzu Corp | Photoluminescence measuring device |
Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS61273516A (en) * | 1985-05-29 | 1986-12-03 | Japan Spectroscopic Co | Fourier transform microscope |
-
1987
- 1987-09-30 JP JP24757587A patent/JPS6488341A/en active Pending
Patent Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS61273516A (en) * | 1985-05-29 | 1986-12-03 | Japan Spectroscopic Co | Fourier transform microscope |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH04294255A (en) * | 1991-03-22 | 1992-10-19 | Shimadzu Corp | Photoluminescence measuring device |
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