JPWO2025041264A1 - - Google Patents
Info
- Publication number
- JPWO2025041264A1 JPWO2025041264A1 JP2025541216A JP2025541216A JPWO2025041264A1 JP WO2025041264 A1 JPWO2025041264 A1 JP WO2025041264A1 JP 2025541216 A JP2025541216 A JP 2025541216A JP 2025541216 A JP2025541216 A JP 2025541216A JP WO2025041264 A1 JPWO2025041264 A1 JP WO2025041264A1
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
- G01B11/06—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Length Measuring Devices By Optical Means (AREA)
- General Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- Health & Medical Sciences (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Mathematical Physics (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| PCT/JP2023/030153 WO2025041264A1 (fr) | 2023-08-22 | 2023-08-22 | Spectromètre, système de mesure d'épaisseur, dispositif de calcul d'épaisseur, procédé de production de spectromètre et procédé de calcul d'épaisseur |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPWO2025041264A1 true JPWO2025041264A1 (fr) | 2025-02-27 |
| JPWO2025041264A5 JPWO2025041264A5 (fr) | 2026-05-22 |
Family
ID=94731527
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2025541216A Pending JPWO2025041264A1 (fr) | 2023-08-22 | 2023-08-22 |
Country Status (5)
| Country | Link |
|---|---|
| JP (1) | JPWO2025041264A1 (fr) |
| KR (1) | KR20260038934A (fr) |
| CN (1) | CN121666521A (fr) |
| TW (1) | TW202510132A (fr) |
| WO (1) | WO2025041264A1 (fr) |
Family Cites Families (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2840181B2 (ja) * | 1993-08-20 | 1998-12-24 | 大日本スクリーン製造株式会社 | 多層膜試料の膜厚測定方法 |
| JP5172203B2 (ja) | 2007-05-16 | 2013-03-27 | 大塚電子株式会社 | 光学特性測定装置および測定方法 |
| JP2009139360A (ja) * | 2007-06-05 | 2009-06-25 | Ricoh Co Ltd | 膜厚測定方法および膜厚測定装置および膜厚測定装置を有する画像形成装置、感光体および感光体の製造方法 |
| JP6363819B2 (ja) * | 2012-09-11 | 2018-07-25 | 大塚電子株式会社 | 膜厚測定方法及び膜厚測定装置 |
-
2023
- 2023-08-22 JP JP2025541216A patent/JPWO2025041264A1/ja active Pending
- 2023-08-22 KR KR1020267004867A patent/KR20260038934A/ko active Pending
- 2023-08-22 CN CN202380101333.0A patent/CN121666521A/zh active Pending
- 2023-08-22 WO PCT/JP2023/030153 patent/WO2025041264A1/fr not_active Ceased
-
2024
- 2024-05-08 TW TW113116988A patent/TW202510132A/zh unknown
Also Published As
| Publication number | Publication date |
|---|---|
| KR20260038934A (ko) | 2026-03-19 |
| WO2025041264A1 (fr) | 2025-02-27 |
| CN121666521A (zh) | 2026-03-13 |
| TW202510132A (zh) | 2025-03-01 |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| A521 | Request for written amendment filed |
Free format text: JAPANESE INTERMEDIATE CODE: A523 Effective date: 20260113 |
|
| A621 | Written request for application examination |
Free format text: JAPANESE INTERMEDIATE CODE: A621 Effective date: 20260615 |