KR101221925B1 - 플라즈마 저항성 세라믹 피막 및 그 제조 방법 - Google Patents
플라즈마 저항성 세라믹 피막 및 그 제조 방법 Download PDFInfo
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- KR101221925B1 KR101221925B1 KR1020100037304A KR20100037304A KR101221925B1 KR 101221925 B1 KR101221925 B1 KR 101221925B1 KR 1020100037304 A KR1020100037304 A KR 1020100037304A KR 20100037304 A KR20100037304 A KR 20100037304A KR 101221925 B1 KR101221925 B1 KR 101221925B1
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- 238000004519 manufacturing process Methods 0.000 title claims abstract description 30
- 239000000758 substrate Substances 0.000 claims abstract description 62
- 238000000034 method Methods 0.000 claims abstract description 42
- 229920000307 polymer substrate Polymers 0.000 claims abstract description 17
- 238000001771 vacuum deposition Methods 0.000 claims abstract description 14
- 238000000576 coating method Methods 0.000 claims abstract description 12
- 229910052751 metal Inorganic materials 0.000 claims abstract description 12
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- 238000000151 deposition Methods 0.000 claims abstract description 9
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- 238000000313 electron-beam-induced deposition Methods 0.000 claims abstract 2
- 239000012790 adhesive layer Substances 0.000 claims description 17
- 239000000463 material Substances 0.000 claims description 10
- 230000008018 melting Effects 0.000 claims description 6
- 238000002844 melting Methods 0.000 claims description 6
- -1 polytetrafluoroethylene Polymers 0.000 claims description 6
- 239000000126 substance Substances 0.000 claims description 6
- 239000004065 semiconductor Substances 0.000 claims description 5
- PXHVJJICTQNCMI-UHFFFAOYSA-N Nickel Chemical compound [Ni] PXHVJJICTQNCMI-UHFFFAOYSA-N 0.000 claims description 4
- 239000004698 Polyethylene Substances 0.000 claims description 4
- 239000004743 Polypropylene Substances 0.000 claims description 4
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 claims description 4
- 229910052782 aluminium Inorganic materials 0.000 claims description 4
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 claims description 4
- 238000010438 heat treatment Methods 0.000 claims description 4
- SIWVEOZUMHYXCS-UHFFFAOYSA-N oxo(oxoyttriooxy)yttrium Chemical compound O=[Y]O[Y]=O SIWVEOZUMHYXCS-UHFFFAOYSA-N 0.000 claims description 4
- 229920000573 polyethylene Polymers 0.000 claims description 4
- 229920001155 polypropylene Polymers 0.000 claims description 4
- 229920001343 polytetrafluoroethylene Polymers 0.000 claims description 4
- 239000004810 polytetrafluoroethylene Substances 0.000 claims description 4
- 229910052710 silicon Inorganic materials 0.000 claims description 4
- 239000010703 silicon Substances 0.000 claims description 4
- 239000010936 titanium Substances 0.000 claims description 4
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 claims description 2
- FYYHWMGAXLPEAU-UHFFFAOYSA-N Magnesium Chemical compound [Mg] FYYHWMGAXLPEAU-UHFFFAOYSA-N 0.000 claims description 2
- GWEVSGVZZGPLCZ-UHFFFAOYSA-N Titan oxide Chemical compound O=[Ti]=O GWEVSGVZZGPLCZ-UHFFFAOYSA-N 0.000 claims description 2
- RTAQQCXQSZGOHL-UHFFFAOYSA-N Titanium Chemical compound [Ti] RTAQQCXQSZGOHL-UHFFFAOYSA-N 0.000 claims description 2
- HCHKCACWOHOZIP-UHFFFAOYSA-N Zinc Chemical compound [Zn] HCHKCACWOHOZIP-UHFFFAOYSA-N 0.000 claims description 2
- 239000000956 alloy Substances 0.000 claims description 2
- 229910045601 alloy Inorganic materials 0.000 claims description 2
- 229910052802 copper Inorganic materials 0.000 claims description 2
- 239000010949 copper Substances 0.000 claims description 2
- 229920000592 inorganic polymer Polymers 0.000 claims description 2
- 229910052749 magnesium Inorganic materials 0.000 claims description 2
- 239000011777 magnesium Substances 0.000 claims description 2
- 229910052759 nickel Inorganic materials 0.000 claims description 2
- TWNQGVIAIRXVLR-UHFFFAOYSA-N oxo(oxoalumanyloxy)alumane Chemical compound O=[Al]O[Al]=O TWNQGVIAIRXVLR-UHFFFAOYSA-N 0.000 claims description 2
- RVTZCBVAJQQJTK-UHFFFAOYSA-N oxygen(2-);zirconium(4+) Chemical compound [O-2].[O-2].[Zr+4] RVTZCBVAJQQJTK-UHFFFAOYSA-N 0.000 claims description 2
- 229920000515 polycarbonate Polymers 0.000 claims description 2
- 239000004417 polycarbonate Substances 0.000 claims description 2
- VSZWPYCFIRKVQL-UHFFFAOYSA-N selanylidenegallium;selenium Chemical compound [Se].[Se]=[Ga].[Se]=[Ga] VSZWPYCFIRKVQL-UHFFFAOYSA-N 0.000 claims description 2
- 230000003068 static effect Effects 0.000 claims description 2
- 229910052719 titanium Inorganic materials 0.000 claims description 2
- OGIDPMRJRNCKJF-UHFFFAOYSA-N titanium oxide Inorganic materials [Ti]=O OGIDPMRJRNCKJF-UHFFFAOYSA-N 0.000 claims description 2
- 229910052727 yttrium Inorganic materials 0.000 claims description 2
- VWQVUPCCIRVNHF-UHFFFAOYSA-N yttrium atom Chemical compound [Y] VWQVUPCCIRVNHF-UHFFFAOYSA-N 0.000 claims description 2
- 229910052725 zinc Inorganic materials 0.000 claims description 2
- 239000011701 zinc Substances 0.000 claims description 2
- 229910001928 zirconium oxide Inorganic materials 0.000 claims description 2
- 239000011118 polyvinyl acetate Substances 0.000 claims 1
- 229910010293 ceramic material Inorganic materials 0.000 description 7
- 238000005524 ceramic coating Methods 0.000 description 6
- 238000005229 chemical vapour deposition Methods 0.000 description 5
- 229920000642 polymer Polymers 0.000 description 5
- 239000010453 quartz Substances 0.000 description 5
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N silicon dioxide Inorganic materials O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 5
- 230000015572 biosynthetic process Effects 0.000 description 4
- 239000007888 film coating Substances 0.000 description 4
- 238000009501 film coating Methods 0.000 description 4
- 239000002245 particle Substances 0.000 description 4
- PNEYBMLMFCGWSK-UHFFFAOYSA-N aluminium oxide Inorganic materials [O-2].[O-2].[O-2].[Al+3].[Al+3] PNEYBMLMFCGWSK-UHFFFAOYSA-N 0.000 description 3
- 229910018072 Al 2 O 3 Inorganic materials 0.000 description 2
- 239000004372 Polyvinyl alcohol Substances 0.000 description 2
- 230000007774 longterm Effects 0.000 description 2
- 230000000704 physical effect Effects 0.000 description 2
- 229920002451 polyvinyl alcohol Polymers 0.000 description 2
- 238000007740 vapor deposition Methods 0.000 description 2
- 239000002253 acid Substances 0.000 description 1
- 239000000853 adhesive Substances 0.000 description 1
- 230000001070 adhesive effect Effects 0.000 description 1
- 239000011247 coating layer Substances 0.000 description 1
- 230000007547 defect Effects 0.000 description 1
- 230000006866 deterioration Effects 0.000 description 1
- 238000005566 electron beam evaporation Methods 0.000 description 1
- 239000010410 layer Substances 0.000 description 1
- 238000012423 maintenance Methods 0.000 description 1
- 239000012528 membrane Substances 0.000 description 1
- 230000001590 oxidative effect Effects 0.000 description 1
- 238000012805 post-processing Methods 0.000 description 1
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 1
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- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/455—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for introducing gases into reaction chamber or for modifying gas flows in reaction chamber
- C23C16/45563—Gas nozzles
- C23C16/45565—Shower nozzles
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- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
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- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/22—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the deposition of inorganic material, other than metallic material
- C23C16/30—Deposition of compounds, mixtures or solid solutions, e.g. borides, carbides, nitrides
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Abstract
본 발명에 따른 플라즈마 저항성 세라믹 피막 제조 방법은 (a) 고분자 기판이나 박판형 금속 기판과 같은 플렉서블(flexible) 기판을 마련하는 단계; (b) 전자빔 증착, 스퍼터링, 이온플레이팅, CVD, 저압식 에어로졸 증착 등과 같은 진공 증착공정을 이용하여 상기 플렉서블 기판 상에 세라믹 막을 형성하는 단계; 및 (c) 상기 형성된 세라믹 막을 정전 척, 히터, 챔버 라이너, 샤워헤드, CVD용 보트, 포커스링, 월 라이너 등과 같은 피코팅물 표면에 코팅하는 단계;를 포함하는 것을 특징으로 한다.
Description
도 2는 플렉서블 기판 상에 세라믹 막이 형성된 예를 나타낸 것이다.
도 3은 플렉서블 기판이 제거된 상태에서 세라믹 막이 피코팅물에 부착된 예를 나타낸 것이다.
도 4는 접착층이 형성된 상태에서 세라믹 막이 피코팅물에 부착된 예를 나타낸 것이다.
S120 : 세라믹 막 형성 단계
S130 : 세라믹 피막 코팅 단계
210 : 플렉서블 기판
220 : 세라믹 막
301 : 피코팅물
510 : 접착층
Claims (27)
- (a) 플렉서블 기판(flexible)을 마련하는 단계;
(b) 진공 증착공정을 이용하여 상기 플렉서블 기판 상에 세라믹 막을 형성하는 단계; 및
(c) 상기 형성된 세라믹 막을 피코팅물 표면에 코팅하는 단계;를 포함하고,
상기 (c) 단계는 상기 플렉서블 기판을 제거한 후, 잔류하는 상기 세라믹 막에 접착층을 형성하고, 상기 접착층이 상기 피코팅물에 접착되도록 코팅하는 것을 특징으로 하는 플라즈마 저항성 세라믹 피막 제조 방법.
- 제1항에 있어서,
상기 피코팅물은 플라즈마 환경에 노출되는 부품인 것을 특징으로 하는 플라즈마 저항성 세라믹 피막 제조 방법.
- 제2항에 있어서,
상기 부품은 반도체 또는 디스플레이 제조용 공정 챔버 내부 부품인 것을 특징으로 하는 플라즈마 저항성 세라믹 피막 제조 방법.
- 제3항에 있어서,
상기 부품은 정전 척(electro static chuck), 히터(heater), 챔버 라이너(chamber liner), 샤워헤드(showerhead), CVD용 보트(boat), 포커스링(focus ring) 및 월 라이너(wall liner) 중에서 어느 하나인 것을 특징으로 하는 플라즈마 저항성 세라믹 피막 제조 방법.
- 삭제
- 삭제
- 제1항에 있어서,
상기 플렉서블 기판의 제거는 열처리 방법 또는 화학처리 방법에 의하여 실시되는 것을 특징으로 하는 플라즈마 저항성 세라믹 피막 제조 방법.
- 삭제
- 제1항에 있어서,
상기 (c) 단계는 상기 플렉서블 기판의 제거에 의하여 노출되는 면의 반대면에 접착층을 형성한 후 상기 접착층이 상기 피코팅물에 접착되도록 코팅하는 것을 특징으로 하는 플라즈마 저항성 세라믹 피막 제조 방법.
- 삭제
- 삭제
- 제1항에 있어서,
상기 진공 증착공정은 전자빔 증착, 스퍼터링, 이온플레이팅, CVD 및 저압식 에어로졸 증착 중에서 선택되는 것을 특징으로 하는 플라즈마 저항성 세라믹 피막 제조 방법.
- 제1항에 있어서,
상기 (b) 단계는 상기 플렉서블 기판의 융점보다 낮은 온도에서 실시되는 것을 특징으로 하는 플라즈마 저항성 세라믹 피막 제조 방법.
- 제1항에 있어서,
상기 (b) 단계에서 형성되는 세라믹 막은 이트륨 산화물, 알루미늄 산화물, 지르코늄 산화물 및 티타늄 산화물 중에서 하나 이상인 것을 특징으로 하는 플라즈마 저항성 세라믹 피막 제조 방법.
- 제1항에 있어서,
상기 (b) 단계에서 형성되는 세라믹 막은 이트륨(Y), 알루미늄(Al), 지르코늄(Zr) 및 티타늄(Ti) 중에서 하나 이상을 포함하는 합금의 산화물인 것을 특징으로 하는 플라즈마 저항성 세라믹 피막 제조 방법.
- 제1항에 있어서,
상기 (b) 단계에서, 상기 세라믹 막은 0.5 ㎛ ~ 100 ㎛ 두께로 형성되는 것을 특징으로 하는 플라즈마 저항성 세라믹 피막 제조 방법.
- 제1항에 있어서,
상기 플렉서블 기판은 고분자 기판을 이용하는 것을 특징으로 하는 플라즈마 저항성 세라믹 피막 제조 방법.
- 제17항에 있어서,
상기 고분자 기판은 200℃까지 변형을 발생시키지 않는 것을 이용하는 것을 특징으로 하는 플라즈마 저항성 세라믹 피막 제조 방법.
- 제18항에 있어서,
상기 고분자 기판은 실리콘계 무기고분자, 폴리테트라플루오로에틸렌(PTFE), 폴리카보네이트(PC), 폴리에틸렌(PE), 폴리비닐아세테이트(PVA) 및 폴리프로필렌(PP) 중에서 선택되는 재질로 형성된 것을 특징으로 하는 플라즈마 저항성 세라믹 피막 제조 방법.
- 삭제
- 삭제
- 삭제
- 삭제
- 제1항에 있어서,
상기 플렉서블 기판은 박판형 금속 기판을 이용하는 것을 특징으로 하는 플라즈마 저항성 세라믹 피막 제조 방법.
- 제24항에 있어서,
상기 박판형 금속 기판은 600℃까지 변형을 발생시키지 않는 것을 이용하는 것을 특징으로 하는 플라즈마 저항성 세라믹 피막 제조 방법.
- 제25항에 있어서,
상기 박판형 금속 기판은 알루미늄, 마그네슘, 구리, 니켈 및 아연 중에서 선택되는 재질로 형성된 것을 특징으로 하는 플라즈마 저항성 세라믹 피막 제조 방법.
- 삭제
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Families Citing this family (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US9034199B2 (en) | 2012-02-21 | 2015-05-19 | Applied Materials, Inc. | Ceramic article with reduced surface defect density and process for producing a ceramic article |
| US9212099B2 (en) | 2012-02-22 | 2015-12-15 | Applied Materials, Inc. | Heat treated ceramic substrate having ceramic coating and heat treatment for coated ceramics |
| US9090046B2 (en) | 2012-04-16 | 2015-07-28 | Applied Materials, Inc. | Ceramic coated article and process for applying ceramic coating |
| US9604249B2 (en) | 2012-07-26 | 2017-03-28 | Applied Materials, Inc. | Innovative top-coat approach for advanced device on-wafer particle performance |
| US9343289B2 (en) | 2012-07-27 | 2016-05-17 | Applied Materials, Inc. | Chemistry compatible coating material for advanced device on-wafer particle performance |
| US9865434B2 (en) * | 2013-06-05 | 2018-01-09 | Applied Materials, Inc. | Rare-earth oxide based erosion resistant coatings for semiconductor application |
| US9850568B2 (en) | 2013-06-20 | 2017-12-26 | Applied Materials, Inc. | Plasma erosion resistant rare-earth oxide based thin film coatings |
| US11047035B2 (en) | 2018-02-23 | 2021-06-29 | Applied Materials, Inc. | Protective yttria coating for semiconductor equipment parts |
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| KR100242897B1 (ko) * | 1994-03-15 | 2000-03-02 | 조셉 제이. 스위니 | 플라즈마 처리챔버의 가열된 금속 표면들을 화학적으로 공격성인 기체상의 종들로 부터 보호하기 위한 방법 및 그에 사용되는 세라믹 보호층(ceramic protection for heated metal surface of plasma processing chamber exposed to chemically aggressive gaseous environment therein and method of protecting such heated metal surface) |
| JP2000178749A (ja) | 1998-12-21 | 2000-06-27 | Toshiba Mach Co Ltd | プラズマcvd装置 |
| JP2008041927A (ja) | 2006-08-07 | 2008-02-21 | Shinko Electric Ind Co Ltd | 静電チャックの製造方法 |
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| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR100242897B1 (ko) * | 1994-03-15 | 2000-03-02 | 조셉 제이. 스위니 | 플라즈마 처리챔버의 가열된 금속 표면들을 화학적으로 공격성인 기체상의 종들로 부터 보호하기 위한 방법 및 그에 사용되는 세라믹 보호층(ceramic protection for heated metal surface of plasma processing chamber exposed to chemically aggressive gaseous environment therein and method of protecting such heated metal surface) |
| JP2000178749A (ja) | 1998-12-21 | 2000-06-27 | Toshiba Mach Co Ltd | プラズマcvd装置 |
| JP2008041927A (ja) | 2006-08-07 | 2008-02-21 | Shinko Electric Ind Co Ltd | 静電チャックの製造方法 |
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| KR20110117845A (ko) | 2011-10-28 |
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