KR20020008210A - 열전 재료 및 그 제조 방법 - Google Patents
열전 재료 및 그 제조 방법 Download PDFInfo
- Publication number
- KR20020008210A KR20020008210A KR1020017015478A KR20017015478A KR20020008210A KR 20020008210 A KR20020008210 A KR 20020008210A KR 1020017015478 A KR1020017015478 A KR 1020017015478A KR 20017015478 A KR20017015478 A KR 20017015478A KR 20020008210 A KR20020008210 A KR 20020008210A
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- laminate
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- thermoelectric
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N—ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N10/00—Thermoelectric devices comprising a junction of dissimilar materials, i.e. devices exhibiting Seebeck or Peltier effects
- H10N10/80—Constructional details
- H10N10/85—Thermoelectric active materials
- H10N10/851—Thermoelectric active materials comprising inorganic compositions
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W76/00—Containers; Fillings or auxiliary members therefor; Seals
- H10W76/40—Fillings or auxiliary members in containers, e.g. centering rings
- H10W76/42—Fillings
- H10W76/47—Solid or gel fillings
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N—ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N10/00—Thermoelectric devices comprising a junction of dissimilar materials, i.e. devices exhibiting Seebeck or Peltier effects
- H10N10/01—Manufacture or treatment
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N—ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N10/00—Thermoelectric devices comprising a junction of dissimilar materials, i.e. devices exhibiting Seebeck or Peltier effects
- H10N10/10—Thermoelectric devices comprising a junction of dissimilar materials, i.e. devices exhibiting Seebeck or Peltier effects operating with only the Peltier or Seebeck effects
- H10N10/17—Thermoelectric devices comprising a junction of dissimilar materials, i.e. devices exhibiting Seebeck or Peltier effects operating with only the Peltier or Seebeck effects characterised by the structure or configuration of the cell or thermocouple forming the device
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N—ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N10/00—Thermoelectric devices comprising a junction of dissimilar materials, i.e. devices exhibiting Seebeck or Peltier effects
- H10N10/80—Constructional details
- H10N10/85—Thermoelectric active materials
- H10N10/851—Thermoelectric active materials comprising inorganic compositions
- H10N10/853—Thermoelectric active materials comprising inorganic compositions comprising arsenic, antimony or bismuth
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N—ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N10/00—Thermoelectric devices comprising a junction of dissimilar materials, i.e. devices exhibiting Seebeck or Peltier effects
- H10N10/80—Constructional details
- H10N10/85—Thermoelectric active materials
- H10N10/856—Thermoelectric active materials comprising organic compositions
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- Inorganic Chemistry (AREA)
- Engineering & Computer Science (AREA)
- Manufacturing & Machinery (AREA)
- Powder Metallurgy (AREA)
Abstract
Description
| 재료 | 평균 층상체 두께(D) | α(μV/K) | ρ(μΩ·㎝) | σ(kS/m) | PF(㎽/mK2) | |
| 실시예3 | Bi-Al(체적비1:2) | 300 | 31.3 | 12.0 | 8330 | 8.2 |
| 실시예4 | Bi-Al(체적비1:2) | 100 | 51.0 | 9.55 | 10500 | 27 |
| 비교예4 | Bi-Al(체적비1:2) | 5000 | -17.5 | 28.1 | 3560 | 1.1 |
| 비교예5 | Bi | - | -72.0 | 128 | 782 | 4.1 |
| 비교예6 | Al | - | -3.36 | 2.85 | 35100 | 0.4 |
| 비교예7 | Bi2Te3 | - | 240 | 1660 | 60.2 | 3.5 |
| 비교예8 | Ag-Fe(체적비1:1) | 100 | 4.27 | 4.08 | 24500 | 0.4 |
| 재료 | α의 측정방향 | 평균 층상체 두께(D) | α(μV/K) | 가요성 시험 | κ(W/mK) | |
| 실시예5 | Bi-12나일론(체적비1:2) | 막면방향 | 600 | -75 | ○ | <0.2 |
| 실시예6 | Bi-12나일론(체적비1:2) | 막면방향 | 300 | -75 | ○ | <0.2 |
| 실시예7 | Bi-12나일론(체적비1:2) | 막면수직방향 | 90 | -116 | ○ | - |
| 비교예5 | Bi | - | - | -72 | × | 16 |
| 비교예7 | Bi2Te3 | - | - | 240 | × | 2 |
Claims (18)
- 반금속, 금속, 또는 합성수지로 이루어진 적어도 하나 이상의 층상체와, 반금속으로 이루어진 층상체를 구비한 적층체로 구성되고, 이들 층상체 두께의 평균치가 0.3㎚ 이상 1000㎚ 이하인 것을 특징으로 하는 열전 재료.
- 제1항에 있어서, 반금속으로 이루어진 층상체와 금속으로 이루어진 층상체를 구비한 적층체로 구성된 것을 특징으로 하는 열전 재료.
- 제1항 또는 제2항에 있어서, 금속으로 이루어진 층상체는 Ag, Fe, Cu, Ni, Al. Au, Pt, Cr, Zn, Pb 및 Sn 중의 어느 한 금속으로 이루어진 층상체인 것을 특징으로 하는 열전 재료.
- 제1항 내지 제3항 중 어느 한 항에 있어서, 반금속으로 이루어진 층상체는 비스무트(Bi)로 이루어진 층상체이고, 금속으로 이루어진 층상체는 Ag, Fe, Cu, Al, Zn 및 Sn 중의 어느 한 금속으로 이루어진 층상체인 것을 특징으로 하는 열전 재료.
- 제1항에 있어서, 반금속으로 이루어진 층상체와 합성수지로 이루어진 층상체를 구비한 적층체로 구성된 것을 특징으로 하는 열전 재료.
- 제5항에 있어서, 상기 합성수지는 폴리아미드계 수지인 것을 특징으로 하는 열전 재료.
- 제1항 내지 제6항 중 어느 한 항에 있어서, 적층체를 구성하는 층상체는 막면 내에서 불연속인 것을 특징으로 하는 열전 재료.
- 제1항 내지 제7항 중 어느 한 항에 있어서, 층상체 두께의 평균치는 0.3㎚ 이상 100㎚ 이하인 것을 특징으로 하는 열전 재료.
- 제1항 내지 제8항 중 어느 한 항에 기재된 열전 재료로 이루어진 것을 특징으로 하는 열전 소자.
- 제9항에 있어서, 적층체의 두께 방향으로 전류를 흘려 사용되거나 또는 적층체의 두께 방향의 양단에 온도차를 부여하여 사용되는 것을 특징으로 하는 열전 소자.
- 금속으로 이루어진 층상체를 2종류 이상 구비한 적층체로 구성되고, 이들 층상체 두께의 평균치가 0.3㎚ 이상 100㎚ 이하인 열전 소자로서, 적층체의 두께 방향으로 전류를 흘려 사용되거나 또는 적층체의 두께 방향의 양단에 온도차를 부여하여 사용되는 것을 특징으로 하는 열전 소자.
- 제11항에 있어서, 적층체를 구성하는 층상체는 막면 내에서 불연속인 것을 특징으로 하는 열전 소자.
- 제11항 또는 제12항에 있어서, 상기 층상체는 Ag, Fe, Cu, Ni, Al, Au, Pt, Cr, Zn, Pb 및 Sn 중의 어느 한 금속으로 이루어진 것을 특징으로 하는 열전 소자.
- 제11항 내지 제13항 중 어느 한 항에 있어서, 상기 적층체는 Fe, Ni, Al, Pt, Cr 및 Sn 중의 어느 한 금속으로 이루어진 층상체와, Ag, Cu, Au, Zn 및 Pb 중의 어느 한 금속으로 이루어진 층상체를 구비하고 있는 것을 특징으로 하는 열전 소자.
- 2층 이상의 층상체를 구비한 적층체로 구성되고, 이들 층상체 두께의 평균치가 0.3㎚ 이상 1000㎚ 이하인 열전 재료의 제조 방법에 있어서,상기 적층체를 구성하는 모든 종류의 층상체로 이루어진 초기 적층체를 형성한 후에, 이 초기 적층체를 복수매 중첩하여 압연 또는 1축 프레스를 행함으로써 상기 적층체를 형성하는 것을 특징으로 하는 열전 재료의 제조 방법.
- 제15항에 있어서, 초기 적층체를 복수매 중첩하여 압연 또는 1축 프레스를 실시하여 얻어진 2차 적층체를, 복수매 중첩하여 압연 또는 1축 프레스를 실시하는 것을 1회 실시하거나 복수회 반복하는 것을 특징으로 하는 열전 재료의 제조 방법.
- 제15항 또는 제16항에 있어서, 층상체의 재료로서 평균 입경 0.1㎛ 이상 500㎛ 이하의 분체를 사용하고, 이 분체를 예비 소결한 후에, 상기 초기 적층체를 형성하는 것을 특징으로 하는 열전 재료의 제조 방법.
- 제1항 내지 제8항 중 어느 한 항에 기재된 열전 재료로서, 제15항 내지 제17항 중 어느 한 항에 기재된 제조 방법으로 제조된 것을 특징으로 하는 열전 재료.
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP15572499 | 1999-06-02 | ||
| JPJP-P-1999-00155724 | 1999-06-02 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| KR20020008210A true KR20020008210A (ko) | 2002-01-29 |
| KR100465661B1 KR100465661B1 (ko) | 2005-01-13 |
Family
ID=15612093
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| KR10-2001-7015478A Expired - Fee Related KR100465661B1 (ko) | 1999-06-02 | 2000-06-02 | 열전 재료 및 그 제조 방법 |
Country Status (7)
| Country | Link |
|---|---|
| US (1) | US6710238B1 (ko) |
| EP (1) | EP1193774B1 (ko) |
| JP (1) | JP4814464B2 (ko) |
| KR (1) | KR100465661B1 (ko) |
| AU (1) | AU5104700A (ko) |
| RU (1) | RU2223573C2 (ko) |
| WO (1) | WO2000076006A1 (ko) |
Cited By (6)
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| WO2009059308A3 (en) * | 2007-11-01 | 2009-08-06 | Toyota Eng & Mfg North America | Nanostructured bulk thermoelectric material |
| KR20120085639A (ko) * | 2011-01-24 | 2012-08-01 | 삼성전자주식회사 | 나노 개재물 함유 열전재료, 이를 포함하는 열전모듈과 열전 장치 |
| WO2012102523A3 (en) * | 2011-01-25 | 2012-12-13 | Lg Innotek Co., Ltd. | Thermoelectric device and thermoelectric module having the same, and method of manufacturing the same |
| US9147823B2 (en) | 2011-08-03 | 2015-09-29 | Samsung Electronics Co., Ltd. | Thermoelectric nanocomposite, thermoelectric element, and thermoelectric module |
| KR20160146188A (ko) * | 2015-06-12 | 2016-12-21 | 한국전기연구원 | 침입형 도핑재 첨가에 의한 복합결정구조가 형성된 Te계 열전소재 |
| KR20170003100A (ko) * | 2015-06-30 | 2017-01-09 | 엘지이노텍 주식회사 | 열전 소자 및 이의 제조 방법 |
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| US7560053B2 (en) * | 2005-02-17 | 2009-07-14 | Nobuyoshi Imaoka | Thermoelectric material having a rhombohedral crystal structure |
| US20070084495A1 (en) * | 2005-10-14 | 2007-04-19 | Biprodas Dutta | Method for producing practical thermoelectric devices using quantum confinement in nanostructures |
| US20070084499A1 (en) * | 2005-10-14 | 2007-04-19 | Biprodas Dutta | Thermoelectric device produced by quantum confinement in nanostructures |
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| RU2376681C1 (ru) * | 2008-10-06 | 2009-12-20 | Учреждение Российской академии наук Физико-технический институт им. А.Ф. Иоффе РАН | Термоэлектрический элемент |
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| JP2730662B2 (ja) * | 1993-03-16 | 1998-03-25 | 株式会社ジャパンエナジー | 温度測定素子及び温度測定方法 |
| RU2010396C1 (ru) * | 1993-04-12 | 1994-03-30 | Николай Степанович Лидоренко | Термоэлектрический элемент, батарея термоэлектрических элементов и способ их изготовления |
| JPH1012935A (ja) * | 1996-06-25 | 1998-01-16 | Matsushita Electric Works Ltd | 熱電変換素子の電極接合構造、熱電変換素子の電極接合方法、熱電変換モジュール、及び熱電変換モジュールの製造方法 |
| JP3477019B2 (ja) * | 1997-03-14 | 2003-12-10 | 株式会社東芝 | 熱電変換材料およびその製造方法 |
| WO1998042034A1 (en) * | 1997-03-17 | 1998-09-24 | Massachusetts Institute Of Technology | Superlattice structures for use in a thermoelectric device |
| JP2000183412A (ja) * | 1998-12-16 | 2000-06-30 | Sharp Corp | 積層材料の製造方法および製造装置 |
-
2000
- 2000-06-02 JP JP2001502178A patent/JP4814464B2/ja not_active Expired - Fee Related
- 2000-06-02 EP EP00935534.8A patent/EP1193774B1/en not_active Expired - Lifetime
- 2000-06-02 RU RU2001135849/28A patent/RU2223573C2/ru not_active IP Right Cessation
- 2000-06-02 KR KR10-2001-7015478A patent/KR100465661B1/ko not_active Expired - Fee Related
- 2000-06-02 AU AU51047/00A patent/AU5104700A/en not_active Abandoned
- 2000-06-02 US US09/980,906 patent/US6710238B1/en not_active Expired - Lifetime
- 2000-06-02 WO PCT/JP2000/003610 patent/WO2000076006A1/ja not_active Ceased
Cited By (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2009059308A3 (en) * | 2007-11-01 | 2009-08-06 | Toyota Eng & Mfg North America | Nanostructured bulk thermoelectric material |
| CN101904025B (zh) * | 2007-11-01 | 2012-08-29 | 丰田自动车工程及制造北美公司 | 热电器件,热电材料和形成块体热电材料的方法 |
| KR20120085639A (ko) * | 2011-01-24 | 2012-08-01 | 삼성전자주식회사 | 나노 개재물 함유 열전재료, 이를 포함하는 열전모듈과 열전 장치 |
| WO2012102523A3 (en) * | 2011-01-25 | 2012-12-13 | Lg Innotek Co., Ltd. | Thermoelectric device and thermoelectric module having the same, and method of manufacturing the same |
| US9299905B2 (en) | 2011-01-25 | 2016-03-29 | Lg Innotek Co., Ltd. | Thermoelectric device and thermoelectric module having the same, and method of manufacturing the same |
| US9147823B2 (en) | 2011-08-03 | 2015-09-29 | Samsung Electronics Co., Ltd. | Thermoelectric nanocomposite, thermoelectric element, and thermoelectric module |
| KR20160146188A (ko) * | 2015-06-12 | 2016-12-21 | 한국전기연구원 | 침입형 도핑재 첨가에 의한 복합결정구조가 형성된 Te계 열전소재 |
| KR20170003100A (ko) * | 2015-06-30 | 2017-01-09 | 엘지이노텍 주식회사 | 열전 소자 및 이의 제조 방법 |
Also Published As
| Publication number | Publication date |
|---|---|
| KR100465661B1 (ko) | 2005-01-13 |
| JP4814464B2 (ja) | 2011-11-16 |
| EP1193774A4 (en) | 2006-12-06 |
| US6710238B1 (en) | 2004-03-23 |
| EP1193774A1 (en) | 2002-04-03 |
| RU2223573C2 (ru) | 2004-02-10 |
| AU5104700A (en) | 2000-12-28 |
| WO2000076006A1 (fr) | 2000-12-14 |
| EP1193774B1 (en) | 2014-03-19 |
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