KR20100006830A - 범퍼 검사장치 - Google Patents
범퍼 검사장치 Download PDFInfo
- Publication number
- KR20100006830A KR20100006830A KR1020080066969A KR20080066969A KR20100006830A KR 20100006830 A KR20100006830 A KR 20100006830A KR 1020080066969 A KR1020080066969 A KR 1020080066969A KR 20080066969 A KR20080066969 A KR 20080066969A KR 20100006830 A KR20100006830 A KR 20100006830A
- Authority
- KR
- South Korea
- Prior art keywords
- bumper
- light source
- inspection
- image sensor
- base material
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
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Classifications
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K13/00—Apparatus or processes specially adapted for manufacturing or adjusting assemblages of electric components
- H05K13/08—Monitoring manufacture of assemblages
- H05K13/081—Integration of optical monitoring devices in assembly lines; Processes using optical monitoring devices specially adapted for controlling devices or machines in assembly lines
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- G—PHYSICS
- G06—COMPUTING OR CALCULATING; COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T7/00—Image analysis
- G06T7/0002—Inspection of images, e.g. flaw detection
- G06T7/0004—Industrial image inspection
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K13/00—Apparatus or processes specially adapted for manufacturing or adjusting assemblages of electric components
- H05K13/0061—Tools for holding the circuit boards during processing; handling transport of printed circuit boards
- H05K13/0076—Straightening or aligning terminal leads of pins mounted on boards, during transport of the boards
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- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K3/00—Apparatus or processes for manufacturing printed circuits
- H05K3/40—Forming printed elements for providing electric connections to or between printed circuits
- H05K3/4007—Surface contacts, e.g. bumps
Landscapes
- Engineering & Computer Science (AREA)
- Manufacturing & Machinery (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Operations Research (AREA)
- Quality & Reliability (AREA)
- Computer Vision & Pattern Recognition (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Theoretical Computer Science (AREA)
- Length Measuring Devices By Optical Means (AREA)
Abstract
Description
Claims (5)
- 인쇄회로기판(PCB)에 돌출되도록 실장되는 다수개의 범퍼가 면상에 돌출 형성된 검사모재가 로딩되는 테이블;상기 검사모재상의 전면에 빛을 균일하게 조사하는 광원;상기 검사모재의 전면에 배치되어, 상기 광원에 의하여 조사된 상기 검사모재를 미소 화소단위로 이미지 센싱하는 이미지 센서; 그리고상기 이미지 센서에 의하여 센싱된 상기 검사모재상의 범퍼의 돌출높이를 검출하여 범퍼의 불량유무를 판정하는 범퍼높이검출수단을 포함하여 이루어지는 범퍼 검사장치.
- 제 1항에 있어서,상기 광원은 상기 범퍼의 전면측에 배치되며, 상기 이미지센서의 양측으로 각각 경사지게 쌍으로 배치됨을 특징으로 하는 범퍼 검사장치.
- 제 1항에 있어서,상기 광원은 상기 이미지 센서의 후위에 만곡된 구면형태로 마련되는 것을 특징으로 하는 범퍼 검사장치.
- 제 1항에 있어서,상기 광원에는 다수개의 LED(발광 다이오드)가 실장되는 것을 특징으로 하는 범퍼높이 검사장치.
- 제 1항에 있어서,상기 광원은 광원본체의 일측에 마련된 광원지지대에 결합되어 상기 이미지 센서의 양측으로 위치되며, 상기 광원지지대로부터 상기 광원의 경사도를 가변시키는 광원회전축이 내장되는 것을 특징으로 하는 범퍼 검사장치.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| KR1020080066969A KR101005077B1 (ko) | 2008-07-10 | 2008-07-10 | 범퍼 검사장치 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| KR1020080066969A KR101005077B1 (ko) | 2008-07-10 | 2008-07-10 | 범퍼 검사장치 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| KR20100006830A true KR20100006830A (ko) | 2010-01-22 |
| KR101005077B1 KR101005077B1 (ko) | 2010-12-30 |
Family
ID=41815910
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| KR1020080066969A Expired - Fee Related KR101005077B1 (ko) | 2008-07-10 | 2008-07-10 | 범퍼 검사장치 |
Country Status (1)
| Country | Link |
|---|---|
| KR (1) | KR101005077B1 (ko) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US11330746B2 (en) * | 2018-02-28 | 2022-05-10 | Raytheon Company | Device and method for reworking flip chip components |
| KR20240071959A (ko) * | 2022-11-14 | 2024-05-23 | 오즈레이 주식회사 | 검사체와 조명모듈간 거리에 대응해 조명모듈의 밝기를 조절하는 방법 |
Family Cites Families (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP3870494B2 (ja) * | 1997-06-30 | 2007-01-17 | スズキ株式会社 | 表面欠陥検査装置 |
| JPH11295047A (ja) * | 1998-04-06 | 1999-10-29 | Omron Corp | 照明装置 |
| JP2001298036A (ja) * | 2000-02-08 | 2001-10-26 | Toshiba Corp | バンプ高さ測定方法、バンプ位置測定方法およびバンプ高さ測定装置、バンプ位置測定装置ならびに半導体装置の製造方法、半導体装置の実装方法 |
| KR100745380B1 (ko) | 2006-05-09 | 2007-08-02 | 에이티아이 주식회사 | 플립 칩 - 볼 그리드 어레이 평면 및 입체 검사장치 |
-
2008
- 2008-07-10 KR KR1020080066969A patent/KR101005077B1/ko not_active Expired - Fee Related
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US11330746B2 (en) * | 2018-02-28 | 2022-05-10 | Raytheon Company | Device and method for reworking flip chip components |
| KR20240071959A (ko) * | 2022-11-14 | 2024-05-23 | 오즈레이 주식회사 | 검사체와 조명모듈간 거리에 대응해 조명모듈의 밝기를 조절하는 방법 |
Also Published As
| Publication number | Publication date |
|---|---|
| KR101005077B1 (ko) | 2010-12-30 |
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