KR20170040745A - 편광자의 검사 방법 - Google Patents
편광자의 검사 방법 Download PDFInfo
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- KR20170040745A KR20170040745A KR1020160125734A KR20160125734A KR20170040745A KR 20170040745 A KR20170040745 A KR 20170040745A KR 1020160125734 A KR1020160125734 A KR 1020160125734A KR 20160125734 A KR20160125734 A KR 20160125734A KR 20170040745 A KR20170040745 A KR 20170040745A
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/8806—Specially adapted optical and illumination features
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/8803—Visual inspection
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B5/00—Optical elements other than lenses
- G02B5/30—Polarising elements
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
- G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
- G01M11/02—Testing optical properties
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
- G01N21/958—Inspecting transparent materials or objects, e.g. windscreens
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- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B1/00—Optical elements characterised by the material of which they are made; Optical coatings for optical elements
- G02B1/04—Optical elements characterised by the material of which they are made; Optical coatings for optical elements made of organic materials, e.g. plastics
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- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B1/00—Optical elements characterised by the material of which they are made; Optical coatings for optical elements
- G02B1/10—Optical coatings produced by application to, or surface treatment of, optical elements
- G02B1/14—Protective coatings, e.g. hard coatings
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B5/00—Optical elements other than lenses
- G02B5/30—Polarising elements
- G02B5/3025—Polarisers, i.e. arrangements capable of producing a definite output polarisation state from an unpolarised input state
- G02B5/3033—Polarisers, i.e. arrangements capable of producing a definite output polarisation state from an unpolarised input state in the form of a thin sheet or foil, e.g. Polaroid
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- General Health & Medical Sciences (AREA)
- Immunology (AREA)
- Signal Processing (AREA)
- Computer Vision & Pattern Recognition (AREA)
- Engineering & Computer Science (AREA)
- Polarising Elements (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
- Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
Abstract
(해결 수단) 본 발명의 검사 방법은 비편광부 (2) 를 갖는 편광자 (1) 의 비편광부 (2) 를 포함하는 범위에 광을 조사하고, 편광자 (1) 의 투과광상을 촬상하는 공정을 포함한다. 여기서, 투과광상에 있어서의 비편광부 (2) 와 다른 부위의 콘트라스트 비(비편광부/다른 부위)는 1.5 이상이다.
Description
도 2는 본 발명의 검사 방법의 하나의 실시형태를 나타내는 개략도이다.
도 3은 장척상의 표면 보호 필름의 구체예를 나타내는 개략 평면도이다.
도 4는 편광자와 보호재의 적층의 구체예를 나타내는 개략 사시도이다.
도 5는 본 발명의 하나의 실시형태에 있어서의 편광 필름 적층체의 부분 단면도이다.
도 6 은 본 발명의 하나의 실시형태에 의한 편광판의 개략 사시도이다.
2 비편광부
10 편광 필름 적층체
11 노출부
20 표면 보호 필름
21 관통공
30 보호 필름
40 표면 보호 필름
100 검사 장치
110 광원부
120 촬상부
Claims (8)
- 비편광부를 갖는 편광자의 비편광부를 포함하는 범위에 광을 조사하고, 이 편광자의 투과광상을 촬상하는 공정을 포함하고,
상기 투과광상에 있어서의 비편광부와 다른 부위와의 콘트라스트비(비편광부/다른 부위)는 1.5 이상인, 편광자의 검사 방법. - 제 1 항에 있어서,
상기 비편광부의 형상 및/또는 특성을 검사하는, 편광자의 검사 방법. - 제 1 항에 있어서,
상기 편광자를 보호하는 표면 보호 필름을 개재하여 촬상하는, 편광자의 검사 방법. - 제 3 항에 있어서,
상기 표면 보호 필름과 촬상부 사이에 다른 광학 부재를 개재하지 않고 촬상하는, 편광자의 검사 방법. - 편광자에 비편광부를 형성하는 공정, 및
제 1 항에 기재된 검사 방법에 의해 검사하는 공정을 포함하는, 비편광부를 갖는 편광자의 제조 방법. - 제 5 항에 있어서,
상기 비편광부의 형성 후, 연속하여 상기 검사를 실시하는, 제조 방법. - 제 5 항에 있어서,
편광자에 염기성 용액을 접촉시켜 상기 비편광부를 형성하는, 제조 방법. - 제 7 항에 있어서,
상기 편광자가, 그 적어도 일부가 노출되도록 표면 보호 필름으로 피복된 상태로 상기 염기성 용액의 접촉을 실시하는, 제조 방법.
Priority Applications (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| KR1020240052898A KR102802263B1 (ko) | 2015-10-05 | 2024-04-19 | 편광자의 검사 방법 |
| KR1020240052896A KR102802262B1 (ko) | 2015-10-05 | 2024-04-19 | 편광자의 검사 방법 |
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2015197685A JP6795883B2 (ja) | 2015-10-05 | 2015-10-05 | 偏光子の製造方法 |
| JPJP-P-2015-197685 | 2015-10-05 |
Related Child Applications (2)
| Application Number | Title | Priority Date | Filing Date |
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| KR1020240052896A Division KR102802262B1 (ko) | 2015-10-05 | 2024-04-19 | 편광자의 검사 방법 |
| KR1020240052898A Division KR102802263B1 (ko) | 2015-10-05 | 2024-04-19 | 편광자의 검사 방법 |
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| Publication Number | Publication Date |
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| KR20170040745A true KR20170040745A (ko) | 2017-04-13 |
| KR102663367B1 KR102663367B1 (ko) | 2024-05-03 |
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| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| KR1020160125734A Active KR102663367B1 (ko) | 2015-10-05 | 2016-09-29 | 편광자의 검사 방법 |
| KR1020240052898A Active KR102802263B1 (ko) | 2015-10-05 | 2024-04-19 | 편광자의 검사 방법 |
| KR1020240052896A Active KR102802262B1 (ko) | 2015-10-05 | 2024-04-19 | 편광자의 검사 방법 |
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| Application Number | Title | Priority Date | Filing Date |
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| KR1020240052898A Active KR102802263B1 (ko) | 2015-10-05 | 2024-04-19 | 편광자의 검사 방법 |
| KR1020240052896A Active KR102802262B1 (ko) | 2015-10-05 | 2024-04-19 | 편광자의 검사 방법 |
Country Status (3)
| Country | Link |
|---|---|
| JP (1) | JP6795883B2 (ko) |
| KR (3) | KR102663367B1 (ko) |
| CN (3) | CN106990470B (ko) |
Families Citing this family (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP6795883B2 (ja) * | 2015-10-05 | 2020-12-02 | 日東電工株式会社 | 偏光子の製造方法 |
| JP6986614B2 (ja) * | 2015-10-05 | 2021-12-22 | 日東電工株式会社 | 偏光子の製造方法 |
| CN109872670B (zh) * | 2017-12-05 | 2021-11-05 | 京东方科技集团股份有限公司 | 显示屏、显示装置、显示电路及其亮度补偿方法 |
| KR102843442B1 (ko) * | 2018-12-11 | 2025-08-06 | 스미또모 가가꾸 가부시끼가이샤 | 편광 필름 및 그 제조 방법 |
| JP7727541B2 (ja) * | 2019-08-13 | 2025-08-21 | 東洋紡株式会社 | 転写用フィルム積層体及びその製造方法 |
| JP7693324B2 (ja) * | 2020-02-14 | 2025-06-17 | 日東電工株式会社 | 粘着剤層付光学積層体および画像表示装置、ならびに、それらの製造方法 |
| KR102940031B1 (ko) * | 2020-02-14 | 2026-03-18 | 닛토덴코 가부시키가이샤 | 점착제층을 구비한 광학 적층체 및 화상 표시 장치, 그리고, 이들의 제조 방법 |
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2015
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2016
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- 2016-09-30 CN CN201610873657.8A patent/CN106990470B/zh active Active
- 2016-09-30 CN CN202110529378.0A patent/CN113341494B/zh active Active
- 2016-09-30 CN CN202110529999.9A patent/CN113341495B/zh active Active
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2024
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| JP2007241314A (ja) | 2007-06-06 | 2007-09-20 | Semiconductor Energy Lab Co Ltd | センサ付き表示装置及び電子機器 |
| KR20100125537A (ko) * | 2009-05-21 | 2010-12-01 | 동우 화인켐 주식회사 | 편광격자 스크린의 제조방법, 편광격자 스크린 및 이것이 구비된 3차원 화상표시장치 |
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| JP2014164085A (ja) * | 2013-02-25 | 2014-09-08 | Nitto Denko Corp | 偏光子および画像表示装置 |
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| WO2015145658A1 (ja) * | 2014-03-27 | 2015-10-01 | 日東電工株式会社 | 偏光子および画像表示装置 |
Also Published As
| Publication number | Publication date |
|---|---|
| CN106990470B (zh) | 2021-06-04 |
| KR20240060758A (ko) | 2024-05-08 |
| KR102802262B1 (ko) | 2025-04-29 |
| CN113341495A (zh) | 2021-09-03 |
| CN106990470A (zh) | 2017-07-28 |
| KR102663367B1 (ko) | 2024-05-03 |
| KR20240060757A (ko) | 2024-05-08 |
| JP6795883B2 (ja) | 2020-12-02 |
| CN113341495B (zh) | 2022-12-06 |
| CN113341494B (zh) | 2023-05-16 |
| JP2017072647A (ja) | 2017-04-13 |
| KR102802263B1 (ko) | 2025-04-29 |
| CN113341494A (zh) | 2021-09-03 |
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