KR940017841U - Large Specimen Support for Electron Microscopy (EPMA) - Google Patents

Large Specimen Support for Electron Microscopy (EPMA)

Info

Publication number: KR940017841U
Authority: KR; South Korea
Prior art keywords: epma; electron microscopy; specimen support; large specimen; support
Prior art date: 1992-12-07
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.): Granted

Application number

KR2019920024610U

Other languages

Korean (ko)

Other versions

KR950003424Y1 (en

Inventor

류길열

Original Assignee

포항종합제철 주식회사

재단법인산업과학기술연구소

Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)

1992-12-07

Filing date

1992-12-07

Publication date

1994-07-28

1992-12-07 Application filed by 포항종합제철 주식회사, 재단법인산업과학기술연구소 filed Critical 포항종합제철 주식회사

1992-12-07 Priority to KR92024610U priority Critical patent/KR950003424Y1/en

1994-07-28 Publication of KR940017841U publication Critical patent/KR940017841U/en

1995-04-28 Application granted granted Critical

1995-04-28 Publication of KR950003424Y1 publication Critical patent/KR950003424Y1/en

2002-12-07 Anticipated expiration legal-status Critical

Status Expired - Fee Related legal-status Critical Current

Links

Classifications

- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/02—Details
- H01J37/20—Means for supporting or positioning the object or the material; Means for adjusting diaphragms or lenses associated with the support
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/26—Electron or ion microscopes; Electron or ion diffraction tubes
- H01J37/261—Details

Landscapes

Chemical & Material Sciences (AREA)
Analytical Chemistry (AREA)
Sampling And Sample Adjustment (AREA)

KR92024610U 1992-12-07 1992-12-07 Large Specimen Support for Electron Microscopy (EPMA) Expired - Fee Related KR950003424Y1 (en)

Priority Applications (1)

Application Number	Priority Date	Filing Date	Title
KR92024610U KR950003424Y1 (en)	1992-12-07	1992-12-07	Large Specimen Support for Electron Microscopy (EPMA)

Applications Claiming Priority (1)

Application Number	Priority Date	Filing Date	Title
KR92024610U KR950003424Y1 (en)	1992-12-07	1992-12-07	Large Specimen Support for Electron Microscopy (EPMA)

Publications (2)

Publication Number	Publication Date
KR940017841U true KR940017841U (en)	1994-07-28
KR950003424Y1 KR950003424Y1 (en)	1995-04-28

Family

ID=19345873

Family Applications (1)

Application Number	Title	Priority Date	Filing Date
KR92024610U Expired - Fee Related KR950003424Y1 (en)	1992-12-07	1992-12-07	Large Specimen Support for Electron Microscopy (EPMA)

Country Status (1)

Country	Link
KR (1)	KR950003424Y1 (en)

1992
- 1992-12-07 KR KR92024610U patent/KR950003424Y1/en not_active Expired - Fee Related

Also Published As

Publication number	Publication date
KR950003424Y1 (en)	1995-04-28

Legal Events

Date	Code	Title	Description
1992-12-07	A201	Request for examination
1992-12-07	R17-X000	Change to representative recorded	St.27 status event code: A-3-3-R10-R17-oth-X000
1992-12-07	UA0108	Application for utility model registration	St.27 status event code: A-0-1-A10-A12-nap-UA0108
1992-12-07	UA0201	Request for examination	St.27 status event code: A-1-2-D10-D11-exm-UA0201
1994-07-28	UG1501	Laying open of application	St.27 status event code: A-1-1-Q10-Q12-nap-UG1501
1995-04-28	UG1604	Publication of application	St.27 status event code: A-2-2-Q10-Q13-nap-UG1604
1995-07-13	E701	Decision to grant or registration of patent right
1995-07-13	UE0701	Decision of registration	St.27 status event code: A-1-2-D10-D22-exm-UE0701
1995-09-05	REGI	Registration of establishment
1995-09-05	UR0701	Registration of establishment	St.27 status event code: A-2-4-F10-F11-exm-UR0701
1995-09-05	UR1002	Payment of registration fee	St.27 status event code: A-2-2-U10-U11-oth-UR1002 Fee payment year number: 1
1997-12-30	UR1001	Payment of annual fee	St.27 status event code: A-4-4-U10-U11-oth-UR1001 Fee payment year number: 4
1999-03-24	UR1001	Payment of annual fee	St.27 status event code: A-4-4-U10-U11-oth-UR1001 Fee payment year number: 5
2000-01-21	R18-X000	Changes to party contact information recorded	St.27 status event code: A-5-5-R10-R18-oth-X000
2000-03-24	FPAY	Annual fee payment	Payment date: 20000325 Year of fee payment: 6
2000-03-25	UR1001	Payment of annual fee	St.27 status event code: A-4-4-U10-U11-oth-UR1001 Fee payment year number: 6
2001-04-29	LAPS	Lapse due to unpaid annual fee
2001-04-29	UC1903	Unpaid annual fee	St.27 status event code: A-4-4-U10-U13-oth-UC1903 Not in force date: 20010429 Payment event data comment text: Termination Category : DEFAULT_OF_REGISTRATION_FEE
2002-01-10	UC1903	Unpaid annual fee	St.27 status event code: N-4-6-H10-H13-oth-UC1903 Ip right cessation event data comment text: Termination Category : DEFAULT_OF_REGISTRATION_FEE Not in force date: 20010429
2002-03-21	UN2301	Change of applicant	St.27 status event code: A-5-5-R10-R13-asn-UN2301 St.27 status event code: A-5-5-R10-R11-asn-UN2301
2002-05-15	R18-X000	Changes to party contact information recorded	St.27 status event code: A-5-5-R10-R18-oth-X000
2002-08-13	UN2301	Change of applicant	St.27 status event code: A-5-5-R10-R13-asn-UN2301 St.27 status event code: A-5-5-R10-R11-asn-UN2301
2004-06-15	R18-X000	Changes to party contact information recorded	St.27 status event code: A-5-5-R10-R18-oth-X000
2005-03-04	UN2301	Change of applicant	St.27 status event code: A-5-5-R10-R13-asn-UN2301 St.27 status event code: A-5-5-R10-R11-asn-UN2301
2013-05-14	UN2301	Change of applicant	St.27 status event code: A-5-5-R10-R13-asn-UN2301 St.27 status event code: A-5-5-R10-R11-asn-UN2301
2016-09-28	R18-X000	Changes to party contact information recorded	St.27 status event code: A-5-5-R10-R18-oth-X000
2018-04-30	R18-X000	Changes to party contact information recorded	St.27 status event code: A-5-5-R10-R18-oth-X000
2018-10-24	P22-X000	Classification modified	St.27 status event code: A-4-4-P10-P22-nap-X000
2019-09-25	R18-X000	Changes to party contact information recorded	St.27 status event code: A-5-5-R10-R18-oth-X000
2019-09-30	R18-X000	Changes to party contact information recorded	St.27 status event code: A-5-5-R10-R18-oth-X000
2019-10-10	R18-X000	Changes to party contact information recorded	St.27 status event code: A-5-5-R10-R18-oth-X000
2020-12-27	R18-X000	Changes to party contact information recorded	St.27 status event code: A-5-5-R10-R18-oth-X000
2022-08-04	R18-X000	Changes to party contact information recorded	St.27 status event code: A-5-5-R10-R18-oth-X000
2023-01-18	R18-X000	Changes to party contact information recorded	St.27 status event code: A-5-5-R10-R18-oth-X000
2023-11-07	R18-X000	Changes to party contact information recorded	St.27 status event code: A-5-5-R10-R18-oth-X000
2024-04-04	R18-X000	Changes to party contact information recorded	St.27 status event code: A-5-5-R10-R18-oth-X000
2025-08-27	R18-X000	Changes to party contact information recorded	St.27 status event code: A-5-5-R10-R18-oth-X000
2026-03-04	R18-X000	Changes to party contact information recorded	St.27 status event code: A-5-5-R10-R18-oth-X000

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DE69417423D1 (en)	1999-04-29	PROBE MICROSCOPY
KR940017841U (en)	1994-07-28	Large Specimen Support for Electron Microscopy (EPMA)
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