KR960015577U - 에스오피(sop) 타입 소켓 - Google Patents

에스오피(sop) 타입 소켓

Info

Publication number
KR960015577U
KR960015577U KR2019940026669U KR19940026669U KR960015577U KR 960015577 U KR960015577 U KR 960015577U KR 2019940026669 U KR2019940026669 U KR 2019940026669U KR 19940026669 U KR19940026669 U KR 19940026669U KR 960015577 U KR960015577 U KR 960015577U
Authority
KR
South Korea
Prior art keywords
type socket
sop type
sop
socket
type
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
KR2019940026669U
Other languages
English (en)
Other versions
KR0117642Y1 (ko
Inventor
한정훈
Original Assignee
엘지반도체주식회사
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 엘지반도체주식회사 filed Critical 엘지반도체주식회사
Priority to KR2019940026669U priority Critical patent/KR0117642Y1/ko
Publication of KR960015577U publication Critical patent/KR960015577U/ko
Application granted granted Critical
Publication of KR0117642Y1 publication Critical patent/KR0117642Y1/ko
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02General constructional details
    • G01R1/04Housings; Supporting members; Arrangements of terminals
    • G01R1/0408Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
    • G01R1/0433Sockets for IC's or transistors
    • G01R1/0441Details
    • G01R1/0466Details concerning contact pieces or mechanical details, e.g. hinges or cams; Shielding
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851Testing of integrated circuits [IC]
    • G01R31/2855Environmental, reliability or burn-in testing
    • G01R31/286External aspects, e.g. related to chambers, contacting devices or handlers
    • G01R31/2863Contacting devices, e.g. sockets, burn-in boards or mounting fixtures

Landscapes

  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Environmental & Geological Engineering (AREA)
  • General Engineering & Computer Science (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
KR2019940026669U 1994-10-13 1994-10-13 에스오피(sop) 타입 소켓 Expired - Fee Related KR0117642Y1 (ko)

Priority Applications (1)

Application Number Priority Date Filing Date Title
KR2019940026669U KR0117642Y1 (ko) 1994-10-13 1994-10-13 에스오피(sop) 타입 소켓

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR2019940026669U KR0117642Y1 (ko) 1994-10-13 1994-10-13 에스오피(sop) 타입 소켓

Publications (2)

Publication Number Publication Date
KR960015577U true KR960015577U (ko) 1996-05-17
KR0117642Y1 KR0117642Y1 (ko) 1998-06-01

Family

ID=19395362

Family Applications (1)

Application Number Title Priority Date Filing Date
KR2019940026669U Expired - Fee Related KR0117642Y1 (ko) 1994-10-13 1994-10-13 에스오피(sop) 타입 소켓

Country Status (1)

Country Link
KR (1) KR0117642Y1 (ko)

Also Published As

Publication number Publication date
KR0117642Y1 (ko) 1998-06-01

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