KR970051441A - 플래쉬 메모리 장치 - Google Patents
플래쉬 메모리 장치 Download PDFInfo
- Publication number
- KR970051441A KR970051441A KR1019950065657A KR19950065657A KR970051441A KR 970051441 A KR970051441 A KR 970051441A KR 1019950065657 A KR1019950065657 A KR 1019950065657A KR 19950065657 A KR19950065657 A KR 19950065657A KR 970051441 A KR970051441 A KR 970051441A
- Authority
- KR
- South Korea
- Prior art keywords
- flag
- cell block
- flash memory
- memory device
- main
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/70—Masking faults in memories by using spares or by reconfiguring
- G11C29/78—Masking faults in memories by using spares or by reconfiguring using programmable devices
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C7/00—Arrangements for writing information into, or reading information out from, a digital store
- G11C7/06—Sense amplifiers; Associated circuits, e.g. timing or triggering circuits
- G11C7/062—Differential amplifiers of non-latching type, e.g. comparators, long-tailed pairs
Landscapes
- For Increasing The Reliability Of Semiconductor Memories (AREA)
- Read Only Memory (AREA)
- Semiconductor Memories (AREA)
Abstract
Description
Claims (5)
- 플래쉬 메모리 장치에 있어서, 메인셀 블록에 인접하여 접속되며 상기 메인셀 블록에서 불량난 어드레스가 발생될 때 이를 대신 하도록 하는 리던더시셀 블록과, 상기 메인셀 블록을 인에이블 시키도록 하는 로우 디코더와, 상기 메인셀 블록에서 불량난 어드레스가 발생될 때 상기 리던던시셀 블록을 인에이블 시키기 위한 리던던시 로우 디코더와, 상기 메인셀 블록의 불량여부를 나타내 주는 플래그 비트와, 상기 메인셀 블록의 데이터를 센싱하기 위해 컬럼 디코더 및 데이터 비트라인을 통해 상기 메인셀 블록에 접속되는 메인 센스앰프와, 상기 플래그 비트를 센싱해줄수 있는 플래그 센스앰프와, 상기 플래그 센스앰프는 플래그 비트와 접속할 수 있는 플래그 비트 전달게이트를 통해 연결되는 것을 특징으로 하는 플래쉬 메모리 장치.
- 제1항에 있어서, 상기 플래그 비트 블록은 다수의 플래그 셀로 구성되고 상기 플래그셀은 메인셀에서 불량 유무를 기억할 수 있는 소자이면서 메인셀 가드링 안에 위치하는 것을 특징으로 하는 플래쉬 메모리 장치.
- 제1항에 있어서, 상기 플래그 셀은 메인셀의 로우 혹은 컬럼과 직접 연결되어 상기 메인셀이 인에이블 되면 플래그 셀도 인에이블 되어 상기 플래그셀 데이터가 읽기 혹은 쓸때마다 항상 플래그 센스앰프를 통해 센싱되어 리던던시 로우 디코더나 리던던시 컬럼 디코더를 인에이블 시키도록 구성되는 것을 특징으로 하는 플래쉬 메모리 장치.
- 제1항에 있어서, 상기 플래그 센스앰프를 통해 전달된 상기 플래그 비트 데이터가 불량임을 나타내줄 때 메인 로우 디코더 혹은 컬럼디코더는 디스에이블 되도록 구성되는 것을 특징으로 하는 플래쉬 메모리 장치.
- 제1항에 있어서, 상기 1항의 구성을 한 단위로하여 여러 개로 반복 구성되는 것을 특징으로 하는 플래쉬 메모리 장치.※ 참고사항 : 최초출원 내용에 의하여 공개하는 것임.
Priority Applications (4)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| KR1019950065657A KR0172745B1 (ko) | 1995-12-29 | 1995-12-29 | 플래쉬 메모리 장치 |
| GB9626913A GB2308693B (en) | 1995-12-29 | 1996-12-24 | Flash memory device |
| US08/774,263 US5694359A (en) | 1995-12-29 | 1996-12-27 | Flash memory device |
| JP35986096A JPH09204796A (ja) | 1995-12-29 | 1996-12-27 | フラッシュメモリ装置 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| KR1019950065657A KR0172745B1 (ko) | 1995-12-29 | 1995-12-29 | 플래쉬 메모리 장치 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| KR970051441A true KR970051441A (ko) | 1997-07-29 |
| KR0172745B1 KR0172745B1 (ko) | 1999-03-30 |
Family
ID=19447126
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| KR1019950065657A Expired - Fee Related KR0172745B1 (ko) | 1995-12-29 | 1995-12-29 | 플래쉬 메모리 장치 |
Country Status (4)
| Country | Link |
|---|---|
| US (1) | US5694359A (ko) |
| JP (1) | JPH09204796A (ko) |
| KR (1) | KR0172745B1 (ko) |
| GB (1) | GB2308693B (ko) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR100358060B1 (ko) * | 2000-12-29 | 2002-10-25 | 주식회사 하이닉스반도체 | 리페어를 위한 반도체 메모리 장치 |
| KR100372207B1 (ko) * | 1999-02-08 | 2003-02-14 | 산요 덴키 가부시키가이샤 | 반도체 메모리 장치 |
Families Citing this family (17)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6167541A (en) * | 1998-03-24 | 2000-12-26 | Micron Technology, Inc. | Method for detecting or preparing intercell defects in more than one array of a memory device |
| US6185709B1 (en) | 1998-06-30 | 2001-02-06 | International Business Machines Corporation | Device for indicating the fixability of a logic circuit |
| US6108236A (en) * | 1998-07-17 | 2000-08-22 | Advanced Technology Materials, Inc. | Smart card comprising integrated circuitry including EPROM and error check and correction system |
| US6324103B2 (en) | 1998-11-11 | 2001-11-27 | Hitachi, Ltd. | Semiconductor integrated circuit device, memory module, storage device and the method for repairing semiconductor integrated circuit device |
| JP4587500B2 (ja) * | 1998-11-11 | 2010-11-24 | ルネサスエレクトロニクス株式会社 | 半導体集積回路、メモリモジュール、記憶媒体、及び半導体集積回路の救済方法 |
| US6397313B1 (en) | 1999-10-19 | 2002-05-28 | Advanced Micro Devices, Inc. | Redundant dual bank architecture for a simultaneous operation flash memory |
| US6141251A (en) * | 2000-01-28 | 2000-10-31 | Silicon Storage Technology, Inc. | Non-volatile memory array having an index used in programming and erasing |
| US6813735B1 (en) | 2000-10-02 | 2004-11-02 | Fasl, Llc. | I/O based column redundancy for virtual ground with 2-bit cell flash memory |
| US6728123B2 (en) | 2002-04-15 | 2004-04-27 | International Business Machines Corporation | Redundant array architecture for word replacement in CAM |
| KR100460993B1 (ko) | 2002-12-27 | 2004-12-09 | 주식회사 하이닉스반도체 | 워드라인 리페어가 가능한 플래시 메모리 소자 |
| EP1624463A1 (en) * | 2004-07-14 | 2006-02-08 | STMicroelectronics S.r.l. | A Programmable memory device with an improved redundancy structure |
| US8049293B2 (en) | 2005-03-07 | 2011-11-01 | Sony Corporation | Solid-state image pickup device, electronic apparatus using such solid-state image pickup device and method of manufacturing solid-state image pickup device |
| TW201101476A (en) * | 2005-06-02 | 2011-01-01 | Sony Corp | Semiconductor image sensor module and method of manufacturing the same |
| JP4796360B2 (ja) | 2005-09-07 | 2011-10-19 | 富士通セミコンダクター株式会社 | 冗長置換方法、半導体記憶装置及び情報処理装置 |
| US7656727B2 (en) * | 2007-04-25 | 2010-02-02 | Hewlett-Packard Development Company, L.P. | Semiconductor memory device and system providing spare memory locations |
| TWI404076B (zh) * | 2008-01-07 | 2013-08-01 | Powerchip Technology Corp | 記憶體裝置以及資料讀取方法 |
| CN102455979B (zh) * | 2010-10-18 | 2014-08-20 | 英业达股份有限公司 | 受损存储单元的资料保护方法 |
Family Cites Families (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5426607A (en) * | 1988-04-27 | 1995-06-20 | Sharp Kabushiki Kaisha | Redundant circuit for memory having redundant block operatively connected to special one of normal blocks |
| US5128944A (en) * | 1989-05-26 | 1992-07-07 | Texas Instruments Incorporated | Apparatus and method for providing notification of bit-cell failure in a redundant-bit-cell memory |
| JP2837433B2 (ja) * | 1989-06-05 | 1998-12-16 | 三菱電機株式会社 | 半導体記憶装置における不良ビット救済回路 |
| JPH0734314B2 (ja) * | 1989-07-13 | 1995-04-12 | 株式会社東芝 | 半導体記憶装置 |
| US5334880A (en) * | 1991-04-30 | 1994-08-02 | International Business Machines Corporation | Low voltage programmable storage element |
| US5311462A (en) * | 1991-12-19 | 1994-05-10 | Intel Corporation | Physical placement of content addressable memories |
| US5502676A (en) * | 1995-04-24 | 1996-03-26 | Motorola, Inc. | Integrated circuit memory with column redundancy having shared read global data lines |
-
1995
- 1995-12-29 KR KR1019950065657A patent/KR0172745B1/ko not_active Expired - Fee Related
-
1996
- 1996-12-24 GB GB9626913A patent/GB2308693B/en not_active Expired - Fee Related
- 1996-12-27 US US08/774,263 patent/US5694359A/en not_active Expired - Lifetime
- 1996-12-27 JP JP35986096A patent/JPH09204796A/ja active Pending
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR100372207B1 (ko) * | 1999-02-08 | 2003-02-14 | 산요 덴키 가부시키가이샤 | 반도체 메모리 장치 |
| KR100358060B1 (ko) * | 2000-12-29 | 2002-10-25 | 주식회사 하이닉스반도체 | 리페어를 위한 반도체 메모리 장치 |
Also Published As
| Publication number | Publication date |
|---|---|
| GB9626913D0 (en) | 1997-02-12 |
| US5694359A (en) | 1997-12-02 |
| KR0172745B1 (ko) | 1999-03-30 |
| JPH09204796A (ja) | 1997-08-05 |
| GB2308693B (en) | 1999-10-06 |
| GB2308693A (en) | 1997-07-02 |
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