KR970052674A - 웨이퍼세정장치 - Google Patents
웨이퍼세정장치 Download PDFInfo
- Publication number
- KR970052674A KR970052674A KR1019950059311A KR19950059311A KR970052674A KR 970052674 A KR970052674 A KR 970052674A KR 1019950059311 A KR1019950059311 A KR 1019950059311A KR 19950059311 A KR19950059311 A KR 19950059311A KR 970052674 A KR970052674 A KR 970052674A
- Authority
- KR
- South Korea
- Prior art keywords
- wafer
- cleaning
- ultrapure water
- supply line
- chemical
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Withdrawn
Links
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P72/00—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
- H10P72/04—Apparatus for manufacture or treatment
- H10P72/0402—Apparatus for fluid treatment
- H10P72/0406—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like
- H10P72/0411—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like for wet cleaning or washing
- H10P72/0416—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like for wet cleaning or washing with the semiconductor substrates being dipped in baths or vessels
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P72/00—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
- H10P72/04—Apparatus for manufacture or treatment
- H10P72/0402—Apparatus for fluid treatment
- H10P72/0406—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like
- H10P72/0411—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like for wet cleaning or washing
- H10P72/0414—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like for wet cleaning or washing using mainly spraying means, e.g. nozzles
Landscapes
- Cleaning By Liquid Or Steam (AREA)
- Cleaning Or Drying Semiconductors (AREA)
Abstract
Description
Claims (3)
- 화학세정액의 공급라인(31)이 설치된 프로세서챔버(30)를 구비하여 화학용액으로 웨이퍼를 세정하는 웨이퍼세정장치에 있어서, 상기프로세스챔버(30)의 상부양측에 설치되어 초순수를 분사하는 샤워노즐(36)과;상기 프로세서챔버(30)내에 초순수를 공급하는 초순수공급라인(34)을 구비하여, 상기 화학세정액으로 웨이퍼를 세정한 다음 상기 샤워노즐(36) 및 상기 초순수공급라인(36)에서 분사되는 초순수로 그 웨이퍼를 세척하는 것을 특징으로 하는 웨이퍼세정장치.
- 제1항에 있어서, 상기 프로세스챔버(30)의 저부에 설치되어서 상기 웨이퍼를 세척하기 위해 제공되는 질소가스버블러(35)를 부가하는 것을 특징으로 하는 웨이퍼세정장치.
- 제1항 또는 제2항에 있어서, 상기 프로세스챔버(30)의 화학세정액을 신속히 외부로 배출될 수 있는 배출구(32)를 부가하는 것을 특징으로 하는 웨이퍼세정장치.※ 참고사항 : 최초출원 내용에 의하여 공개하는 것임.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| KR1019950059311A KR970052674A (ko) | 1995-12-27 | 1995-12-27 | 웨이퍼세정장치 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| KR1019950059311A KR970052674A (ko) | 1995-12-27 | 1995-12-27 | 웨이퍼세정장치 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| KR970052674A true KR970052674A (ko) | 1997-07-29 |
Family
ID=66618827
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| KR1019950059311A Withdrawn KR970052674A (ko) | 1995-12-27 | 1995-12-27 | 웨이퍼세정장치 |
Country Status (1)
| Country | Link |
|---|---|
| KR (1) | KR970052674A (ko) |
-
1995
- 1995-12-27 KR KR1019950059311A patent/KR970052674A/ko not_active Withdrawn
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PA0109 | Patent application |
St.27 status event code: A-0-1-A10-A12-nap-PA0109 |
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| PG1501 | Laying open of application |
St.27 status event code: A-1-1-Q10-Q12-nap-PG1501 |
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| R18-X000 | Changes to party contact information recorded |
St.27 status event code: A-3-3-R10-R18-oth-X000 |
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| PN2301 | Change of applicant |
St.27 status event code: A-3-3-R10-R13-asn-PN2301 St.27 status event code: A-3-3-R10-R11-asn-PN2301 |
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| PN2301 | Change of applicant |
St.27 status event code: A-3-3-R10-R13-asn-PN2301 St.27 status event code: A-3-3-R10-R11-asn-PN2301 |
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| R18-X000 | Changes to party contact information recorded |
St.27 status event code: A-3-3-R10-R18-oth-X000 |
|
| PC1203 | Withdrawal of no request for examination |
St.27 status event code: N-1-6-B10-B12-nap-PC1203 |
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| WITN | Application deemed withdrawn, e.g. because no request for examination was filed or no examination fee was paid | ||
| PN2301 | Change of applicant |
St.27 status event code: A-3-3-R10-R13-asn-PN2301 St.27 status event code: A-3-3-R10-R11-asn-PN2301 |
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| R18-X000 | Changes to party contact information recorded |
St.27 status event code: A-3-3-R10-R18-oth-X000 |
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| R18-X000 | Changes to party contact information recorded |
St.27 status event code: A-3-3-R10-R18-oth-X000 |
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| R18-X000 | Changes to party contact information recorded |
St.27 status event code: A-3-3-R10-R18-oth-X000 |
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| PN2301 | Change of applicant |
St.27 status event code: A-3-3-R10-R13-asn-PN2301 St.27 status event code: A-3-3-R10-R11-asn-PN2301 |
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| PN2301 | Change of applicant |
St.27 status event code: A-3-3-R10-R13-asn-PN2301 St.27 status event code: A-3-3-R10-R11-asn-PN2301 |
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| R18-X000 | Changes to party contact information recorded |
St.27 status event code: A-3-3-R10-R18-oth-X000 |
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| P22-X000 | Classification modified |
St.27 status event code: A-2-2-P10-P22-nap-X000 |
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| P22-X000 | Classification modified |
St.27 status event code: A-2-2-P10-P22-nap-X000 |