KR970053596A - 박막트랜지터 및 그 제조 방법 - Google Patents
박막트랜지터 및 그 제조 방법 Download PDFInfo
- Publication number
- KR970053596A KR970053596A KR1019950051936A KR19950051936A KR970053596A KR 970053596 A KR970053596 A KR 970053596A KR 1019950051936 A KR1019950051936 A KR 1019950051936A KR 19950051936 A KR19950051936 A KR 19950051936A KR 970053596 A KR970053596 A KR 970053596A
- Authority
- KR
- South Korea
- Prior art keywords
- conductive layer
- conductive
- thin film
- film transistor
- channel
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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Classifications
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D30/00—Field-effect transistors [FET]
- H10D30/60—Insulated-gate field-effect transistors [IGFET]
- H10D30/67—Thin-film transistors [TFT]
- H10D30/6729—Thin-film transistors [TFT] characterised by the electrodes
- H10D30/673—Thin-film transistors [TFT] characterised by the electrodes characterised by the shapes, relative sizes or dispositions of the gate electrodes
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D30/00—Field-effect transistors [FET]
- H10D30/01—Manufacture or treatment
- H10D30/021—Manufacture or treatment of FETs having insulated gates [IGFET]
- H10D30/031—Manufacture or treatment of FETs having insulated gates [IGFET] of thin-film transistors [TFT]
- H10D30/0312—Manufacture or treatment of FETs having insulated gates [IGFET] of thin-film transistors [TFT] characterised by the gate electrodes
- H10D30/0314—Manufacture or treatment of FETs having insulated gates [IGFET] of thin-film transistors [TFT] characterised by the gate electrodes of lateral top-gate TFTs comprising only a single gate
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D30/00—Field-effect transistors [FET]
- H10D30/60—Insulated-gate field-effect transistors [IGFET]
- H10D30/67—Thin-film transistors [TFT]
- H10D30/6704—Thin-film transistors [TFT] having supplementary regions or layers in the thin films or in the insulated bulk substrates for controlling properties of the device
- H10D30/6713—Thin-film transistors [TFT] having supplementary regions or layers in the thin films or in the insulated bulk substrates for controlling properties of the device characterised by the properties of the source or drain regions, e.g. compositions or sectional shapes
- H10D30/6715—Thin-film transistors [TFT] having supplementary regions or layers in the thin films or in the insulated bulk substrates for controlling properties of the device characterised by the properties of the source or drain regions, e.g. compositions or sectional shapes characterised by the doping profiles, e.g. having lightly-doped source or drain extensions
- H10D30/6717—Thin-film transistors [TFT] having supplementary regions or layers in the thin films or in the insulated bulk substrates for controlling properties of the device characterised by the properties of the source or drain regions, e.g. compositions or sectional shapes characterised by the doping profiles, e.g. having lightly-doped source or drain extensions the source and the drain regions being asymmetrical
Landscapes
- Thin Film Transistor (AREA)
Abstract
Description
Claims (5)
- 제1전도층의 채널 상부에 제1게이트전도층이 오버랩 되어 형성되고, 상기 제1전도층의 채널 일측에 소오스가 형성되며, 상기 제1전도층의 채널 타측에 오프-셋 영역을 가지고 드레인이 형성되는 탑 게이트 형 박막트랜지스터에 있어서; 상기 오프-셋 영역 상에 형성된 제2게이트전도층을 포함하는 것을 특징으로 하는 박막트랜지스터.
- 제1항에 있어서, 상기 제2게이트전도층은 저농도불순물이 도핑된 폴리실리콘막인 것을 특징으로 하는 박막트랜지스터.
- 박막트랜지스터 제조 방법에 있어서, 제1전도막 패턴을 형성하고, 전체구조상부에 게이트산화막을 형성하는 단계; 상기 제1전도막의 채널지역에 오버랩되는 제2전도막 패턴을 상기 게이트산화막에 형성하는 단계; 전면에 저농도 불순물을 이온주입하는 단계; 상기 제1전도막의 드레인 오프-셋 영역 상에 오버랩되는 제2전도막 패턴을 형성하는 단계; 및 상기 제1전도막의 소오스/드레인 영역에 고농도 불순물을 이온주입하는 단계를 포함하는 것을 특징으로 하는 박막트랜지스터 제조 방법.
- 제3항에 있어서, 상기 제1전도막 내지 제3전도막은 폴리실리콘막인 것을 특징으로 하는 박막트랜지스터 제조 방법.
- 제3항에 있어서, 상기 제3전도막은 저농도 불순물이 도핑된 폴리실리콘막인 것을 특징으로 하는 박막트랜지스터 제조 방법.※ 참고사항 : 최초출원 내용에 의하여 공개하는 것임.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| KR1019950051936A KR0172763B1 (ko) | 1995-12-19 | 1995-12-19 | 박막트랜지스터 및 그 제조 방법 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| KR1019950051936A KR0172763B1 (ko) | 1995-12-19 | 1995-12-19 | 박막트랜지스터 및 그 제조 방법 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| KR970053596A true KR970053596A (ko) | 1997-07-31 |
| KR0172763B1 KR0172763B1 (ko) | 1999-03-30 |
Family
ID=19441368
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| KR1019950051936A Expired - Fee Related KR0172763B1 (ko) | 1995-12-19 | 1995-12-19 | 박막트랜지스터 및 그 제조 방법 |
Country Status (1)
| Country | Link |
|---|---|
| KR (1) | KR0172763B1 (ko) |
-
1995
- 1995-12-19 KR KR1019950051936A patent/KR0172763B1/ko not_active Expired - Fee Related
Also Published As
| Publication number | Publication date |
|---|---|
| KR0172763B1 (ko) | 1999-03-30 |
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