KR970077267A - 반도체 제조용 세정 장치 - Google Patents
반도체 제조용 세정 장치 Download PDFInfo
- Publication number
- KR970077267A KR970077267A KR1019960015561A KR19960015561A KR970077267A KR 970077267 A KR970077267 A KR 970077267A KR 1019960015561 A KR1019960015561 A KR 1019960015561A KR 19960015561 A KR19960015561 A KR 19960015561A KR 970077267 A KR970077267 A KR 970077267A
- Authority
- KR
- South Korea
- Prior art keywords
- cleaning device
- cleaning
- semiconductor manufacturing
- ultrapure water
- ultraviolet sterilizing
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Withdrawn
Links
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P72/00—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
- H10P72/04—Apparatus for manufacture or treatment
- H10P72/0402—Apparatus for fluid treatment
- H10P72/0406—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B08—CLEANING
- B08B—CLEANING IN GENERAL; PREVENTION OF FOULING IN GENERAL
- B08B7/00—Cleaning by methods not provided for in a single other subclass or a single group in this subclass
- B08B7/0035—Cleaning by methods not provided for in a single other subclass or a single group in this subclass by radiant energy, e.g. UV, laser, light beam or the like
- B08B7/0057—Cleaning by methods not provided for in a single other subclass or a single group in this subclass by radiant energy, e.g. UV, laser, light beam or the like by ultraviolet radiation
Landscapes
- Treatment Of Water By Ion Exchange (AREA)
- Physical Water Treatments (AREA)
- Separation Using Semi-Permeable Membranes (AREA)
Abstract
Description
Claims (3)
- 반도체 장치를 세정하기 위한 세정 설비와, 배관 시설을 통해 상기 세정 설비에 초순수를 공급하는 초순수 제조 시스템을 갖춘 반도체 제조용 세정 장치에 있어서, 상기 세정 설비의 입구에 설치되고, 상기 초순수 제조시스템에서 상기 배관을 통해 공급되는 초순수를 상기 세정 설비 내로 공급되기 전에 정화시키는 자외선 살균장치를 포함하는 것을 특징으로 하는 반도체 제조용 세정 장치.
- 제1항에 있어서, 상기 자외선 살균 장치는 저압 수은 램프 시스템과 음이온 교환 수지 시스템을 포함하는 것을 특징으로 하는 반도체 제조용 세정 장치.
- 제1항에 있어서, 또한 상기 자외선 살균 장치의 하류에 설치된 승압 펌프를 더 포함하는 것을 특징으로 하는 반도체 제조용 세정 장치.※ 참고사항 : 최초출원 내용에 의하여 공개하는 것임.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| KR1019960015561A KR970077267A (ko) | 1996-05-11 | 1996-05-11 | 반도체 제조용 세정 장치 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| KR1019960015561A KR970077267A (ko) | 1996-05-11 | 1996-05-11 | 반도체 제조용 세정 장치 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| KR970077267A true KR970077267A (ko) | 1997-12-12 |
Family
ID=66219996
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| KR1019960015561A Withdrawn KR970077267A (ko) | 1996-05-11 | 1996-05-11 | 반도체 제조용 세정 장치 |
Country Status (1)
| Country | Link |
|---|---|
| KR (1) | KR970077267A (ko) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR100698525B1 (ko) * | 2000-06-16 | 2007-03-22 | 삼성전자주식회사 | 자외선 살균 기능을 갖는 반도체 웨이퍼 소잉 시스템 |
-
1996
- 1996-05-11 KR KR1019960015561A patent/KR970077267A/ko not_active Withdrawn
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR100698525B1 (ko) * | 2000-06-16 | 2007-03-22 | 삼성전자주식회사 | 자외선 살균 기능을 갖는 반도체 웨이퍼 소잉 시스템 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PA0109 | Patent application |
St.27 status event code: A-0-1-A10-A12-nap-PA0109 |
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| PG1501 | Laying open of application |
St.27 status event code: A-1-1-Q10-Q12-nap-PG1501 |
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| R18-X000 | Changes to party contact information recorded |
St.27 status event code: A-3-3-R10-R18-oth-X000 |
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| PN2301 | Change of applicant |
St.27 status event code: A-3-3-R10-R13-asn-PN2301 St.27 status event code: A-3-3-R10-R11-asn-PN2301 |
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| PN2301 | Change of applicant |
St.27 status event code: A-3-3-R10-R13-asn-PN2301 St.27 status event code: A-3-3-R10-R11-asn-PN2301 |
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| R18-X000 | Changes to party contact information recorded |
St.27 status event code: A-3-3-R10-R18-oth-X000 |
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| PC1203 | Withdrawal of no request for examination |
St.27 status event code: N-1-6-B10-B12-nap-PC1203 |
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| WITN | Application deemed withdrawn, e.g. because no request for examination was filed or no examination fee was paid | ||
| PN2301 | Change of applicant |
St.27 status event code: A-3-3-R10-R13-asn-PN2301 St.27 status event code: A-3-3-R10-R11-asn-PN2301 |
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| R18-X000 | Changes to party contact information recorded |
St.27 status event code: A-3-3-R10-R18-oth-X000 |
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| R18-X000 | Changes to party contact information recorded |
St.27 status event code: A-3-3-R10-R18-oth-X000 |
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| R18-X000 | Changes to party contact information recorded |
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| PN2301 | Change of applicant |
St.27 status event code: A-3-3-R10-R13-asn-PN2301 St.27 status event code: A-3-3-R10-R11-asn-PN2301 |
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| PN2301 | Change of applicant |
St.27 status event code: A-3-3-R10-R13-asn-PN2301 St.27 status event code: A-3-3-R10-R11-asn-PN2301 |
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| R18-X000 | Changes to party contact information recorded |
St.27 status event code: A-3-3-R10-R18-oth-X000 |
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| P22-X000 | Classification modified |
St.27 status event code: A-2-2-P10-P22-nap-X000 |
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| P22-X000 | Classification modified |
St.27 status event code: A-2-2-P10-P22-nap-X000 |