KR970077750A - 광학 반도체 소자 및 이의 제조 방법 - Google Patents

광학 반도체 소자 및 이의 제조 방법 Download PDF

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KR970077750A
KR970077750A KR1019970022722A KR19970022722A KR970077750A KR 970077750 A KR970077750 A KR 970077750A KR 1019970022722 A KR1019970022722 A KR 1019970022722A KR 19970022722 A KR19970022722 A KR 19970022722A KR 970077750 A KR970077750 A KR 970077750A
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substrate
photodetector
semiconductor device
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KR100528553B1 (ko
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주오잉 리사 장
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빈센트 비. 인그라시아
모토로라 인코포레이티드
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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01PMEASURING LINEAR OR ANGULAR SPEED, ACCELERATION, DECELERATION, OR SHOCK; INDICATING PRESENCE, ABSENCE, OR DIRECTION, OF MOVEMENT
    • G01P1/00Details of instruments
    • G01P1/02Housings
    • G01P1/023Housings for acceleration measuring devices
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01PMEASURING LINEAR OR ANGULAR SPEED, ACCELERATION, DECELERATION, OR SHOCK; INDICATING PRESENCE, ABSENCE, OR DIRECTION, OF MOVEMENT
    • G01P15/00Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration
    • G01P15/02Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration by making use of inertia forces using solid seismic masses
    • G01P15/08Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration by making use of inertia forces using solid seismic masses with conversion into electric or magnetic values
    • G01P15/0802Details
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01PMEASURING LINEAR OR ANGULAR SPEED, ACCELERATION, DECELERATION, OR SHOCK; INDICATING PRESENCE, ABSENCE, OR DIRECTION, OF MOVEMENT
    • G01P15/00Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration
    • G01P15/02Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration by making use of inertia forces using solid seismic masses
    • G01P15/08Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration by making use of inertia forces using solid seismic masses with conversion into electric or magnetic values
    • G01P15/093Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration by making use of inertia forces using solid seismic masses with conversion into electric or magnetic values by photoelectric pick-up
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01PMEASURING LINEAR OR ANGULAR SPEED, ACCELERATION, DECELERATION, OR SHOCK; INDICATING PRESENCE, ABSENCE, OR DIRECTION, OF MOVEMENT
    • G01P15/00Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration
    • G01P15/02Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration by making use of inertia forces using solid seismic masses
    • G01P15/08Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration by making use of inertia forces using solid seismic masses with conversion into electric or magnetic values
    • G01P2015/0805Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration by making use of inertia forces using solid seismic masses with conversion into electric or magnetic values being provided with a particular type of spring-mass-system for defining the displacement of a seismic mass due to an external acceleration
    • G01P2015/0808Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration by making use of inertia forces using solid seismic masses with conversion into electric or magnetic values being provided with a particular type of spring-mass-system for defining the displacement of a seismic mass due to an external acceleration for defining in-plane movement of the mass, i.e. movement of the mass in the plane of the substrate
    • G01P2015/0811Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration by making use of inertia forces using solid seismic masses with conversion into electric or magnetic values being provided with a particular type of spring-mass-system for defining the displacement of a seismic mass due to an external acceleration for defining in-plane movement of the mass, i.e. movement of the mass in the plane of the substrate for one single degree of freedom of movement of the mass
    • G01P2015/0814Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration by making use of inertia forces using solid seismic masses with conversion into electric or magnetic values being provided with a particular type of spring-mass-system for defining the displacement of a seismic mass due to an external acceleration for defining in-plane movement of the mass, i.e. movement of the mass in the plane of the substrate for one single degree of freedom of movement of the mass for translational movement of the mass, e.g. shuttle type

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Pressure Sensors (AREA)
  • Light Receiving Elements (AREA)

Abstract

광학 반도체 소자(10)는 한 표면(12, 74)을 갖는 하나의 기판(11)과, 상기 기판(11, 69)에 의해 지지되는 하나의 광검출기(13)와, 상기 기판(11)의 표면(11) 위에 놓이고 상기 광검출기(13)의 한 부분 위에 놓이는 진동 질량(21)을 포함한다. 상기 진동 질량(21)은 상기 광검출기(13)의 베이스 영역(32) 위에 놓이는 하나의 구멍(22)을 갖고, 상기 진동 질량(21)은 상기 기판(11)과 상기 광검출기(13)에 대해 움직임이 가능하다.

Description

광학 반도체 소자 및 이의 제조 방법
본 내용은 요부공개 건이므로 전문내용을 수록하지 않았음
제1도는 본 발명에 따른 광학 반도체 소자의 한 실시예의 평면도, 제2도는 제1도의 선(2-2)을 따라 취해진 광학 반도체 소자의 단면도, 제3도는 제1도의 선(3-3)을 따라 취해진 광학 반도체 소자의 단면도, 제4도 및 제5도는 제1도의 선(3-3)을 따라 취해진 제작중의 광학 반도체 소자의 단며도, 제6도는 포장 후의, 본 발명에 따른 광학 반도체 소자의 단면도, 제7도는 본 발명에 따른 광학 반도체 소자의 다른 실시예의 단면도.

Claims (3)

  1. 반도체 소자에 있어서, 한 표면(12, 74)을 갖는 하나의 기판(11, 69)과, 상기 기판(11, 69)에 의해 지지되고, 제1부분과 상기 제1부분에 인접한 제2부분을 갖는 제1의 광검출기와, 상기 기판(11, 69)의 표면 위에 놓이고, 상기 제1광검출기의 상기 제2부분 위에 놓이는 제1의 구멍을 갖고, 상기 제1광검출기에 대해 움직임이 가능한 진동 질량(21, 63)을 포함하는 것을 특징으로 하는 반도체 소자.
  2. 광학 반도체 소자에 있어서 하나의 기판(11, 69)과, 제1의 도전형을 갖는 상기 기판(11, 69) 내의 제1의 영역과, 상기 제1의 도전형과 다른 제2의 도전형을 갖고, 상기 제1의 영역에 인접한, 상기 기판(11, 69)내의 제2영역과, 상기 제1영역의 한 부분과 상기 제2영역의 한 부분 위에 놓이는 움직임이 가능한 구조(21, 63)와, 상기 기판(11, 69)의 한 부분 위에 놓이는 전기 절연층으로, 상기 움직임이 가능한 구조(21, 63)는 상기 제2영역의 부분 위에 놓이는 하나의 구멍을 갖고, 상기 구멍은 폭과 길이를 갖고, 상기 움직임이 가능한 구조(21, 63)의 한 부분은 상기 전기 절연층으로부터 일정 거리만큼 분리되고, 상기 구멍의 상기 폭 및 길이는 상기 일정 거리보다 큰, 전기 절연층을 포함하는 것을 특징으로 하는 광학 반도체 소자.
  3. 반도체 소자를 제조하는 방법에 있어서, 하나의 기판(11, 69)을 제공하는 단계와, 상기 기판(11, 69)내에 광검출기를 형성하는 단계와, 상기 기판(11, 69)의 한 부분 위에, 상기 기판(11, 69)에 대해 움직임이 가능한 진동 질량(21, 63)을 형성하는 단계를 포함하는 것을 특징으로 하는 반도체 소자의 제조 방법.
    ※ 참고사항 : 최초출원 내용에 의하여 공개되는 것임.
KR1019970022722A 1996-05-28 1997-05-28 광학반도체소자및이의제조방법 Expired - Fee Related KR100528553B1 (ko)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US654,514 1996-05-28
US08/654,514 US5936294A (en) 1996-05-28 1996-05-28 Optical semiconductor component and method of fabrication

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KR970077750A true KR970077750A (ko) 1997-12-12
KR100528553B1 KR100528553B1 (ko) 2006-01-27

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US (1) US5936294A (ko)
EP (1) EP0810440B1 (ko)
JP (1) JP4579352B2 (ko)
KR (1) KR100528553B1 (ko)
DE (1) DE69712128T2 (ko)

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EP1097483A2 (de) * 1998-06-30 2001-05-09 Robert Bosch Gmbh Vorrichtung zur erfassung elektromagnetischer strahlung
DE19923606A1 (de) * 1998-06-30 2000-01-13 Bosch Gmbh Robert Vorrichtung zur Erfassung elektromagnetischer Strahlung
US6494095B1 (en) * 2000-03-28 2002-12-17 Opticnet, Inc. Micro electromechanical switch for detecting acceleration or decelaration
JP3453557B2 (ja) * 2000-12-11 2003-10-06 キヤノン株式会社 通信ネットワークを用いた光半導体素子の品質信頼性情報提供システム
US6550330B1 (en) * 2001-03-14 2003-04-22 The United States Of America As Represented By The Secretary Of The Navy Differential amplification for micro-electro-mechanical ultra-sensitive accelerometer
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US7222534B2 (en) * 2005-03-31 2007-05-29 Pgs Americas, Inc. Optical accelerometer, optical inclinometer and seismic sensor system using such accelerometer and inclinometer
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DE69712128T2 (de) 2002-10-02
JP4579352B2 (ja) 2010-11-10
EP0810440A3 (en) 1997-12-10
EP0810440A2 (en) 1997-12-03
JPH1090298A (ja) 1998-04-10
DE69712128D1 (de) 2002-05-29
US5936294A (en) 1999-08-10
KR100528553B1 (ko) 2006-01-27
EP0810440B1 (en) 2002-04-24

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