KR970077750A - 광학 반도체 소자 및 이의 제조 방법 - Google Patents
광학 반도체 소자 및 이의 제조 방법 Download PDFInfo
- Publication number
- KR970077750A KR970077750A KR1019970022722A KR19970022722A KR970077750A KR 970077750 A KR970077750 A KR 970077750A KR 1019970022722 A KR1019970022722 A KR 1019970022722A KR 19970022722 A KR19970022722 A KR 19970022722A KR 970077750 A KR970077750 A KR 970077750A
- Authority
- KR
- South Korea
- Prior art keywords
- substrate
- photodetector
- semiconductor device
- region
- overlying
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
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Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01P—MEASURING LINEAR OR ANGULAR SPEED, ACCELERATION, DECELERATION, OR SHOCK; INDICATING PRESENCE, ABSENCE, OR DIRECTION, OF MOVEMENT
- G01P1/00—Details of instruments
- G01P1/02—Housings
- G01P1/023—Housings for acceleration measuring devices
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01P—MEASURING LINEAR OR ANGULAR SPEED, ACCELERATION, DECELERATION, OR SHOCK; INDICATING PRESENCE, ABSENCE, OR DIRECTION, OF MOVEMENT
- G01P15/00—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration
- G01P15/02—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration by making use of inertia forces using solid seismic masses
- G01P15/08—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration by making use of inertia forces using solid seismic masses with conversion into electric or magnetic values
- G01P15/0802—Details
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01P—MEASURING LINEAR OR ANGULAR SPEED, ACCELERATION, DECELERATION, OR SHOCK; INDICATING PRESENCE, ABSENCE, OR DIRECTION, OF MOVEMENT
- G01P15/00—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration
- G01P15/02—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration by making use of inertia forces using solid seismic masses
- G01P15/08—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration by making use of inertia forces using solid seismic masses with conversion into electric or magnetic values
- G01P15/093—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration by making use of inertia forces using solid seismic masses with conversion into electric or magnetic values by photoelectric pick-up
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01P—MEASURING LINEAR OR ANGULAR SPEED, ACCELERATION, DECELERATION, OR SHOCK; INDICATING PRESENCE, ABSENCE, OR DIRECTION, OF MOVEMENT
- G01P15/00—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration
- G01P15/02—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration by making use of inertia forces using solid seismic masses
- G01P15/08—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration by making use of inertia forces using solid seismic masses with conversion into electric or magnetic values
- G01P2015/0805—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration by making use of inertia forces using solid seismic masses with conversion into electric or magnetic values being provided with a particular type of spring-mass-system for defining the displacement of a seismic mass due to an external acceleration
- G01P2015/0808—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration by making use of inertia forces using solid seismic masses with conversion into electric or magnetic values being provided with a particular type of spring-mass-system for defining the displacement of a seismic mass due to an external acceleration for defining in-plane movement of the mass, i.e. movement of the mass in the plane of the substrate
- G01P2015/0811—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration by making use of inertia forces using solid seismic masses with conversion into electric or magnetic values being provided with a particular type of spring-mass-system for defining the displacement of a seismic mass due to an external acceleration for defining in-plane movement of the mass, i.e. movement of the mass in the plane of the substrate for one single degree of freedom of movement of the mass
- G01P2015/0814—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration by making use of inertia forces using solid seismic masses with conversion into electric or magnetic values being provided with a particular type of spring-mass-system for defining the displacement of a seismic mass due to an external acceleration for defining in-plane movement of the mass, i.e. movement of the mass in the plane of the substrate for one single degree of freedom of movement of the mass for translational movement of the mass, e.g. shuttle type
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Pressure Sensors (AREA)
- Light Receiving Elements (AREA)
Abstract
Description
Claims (3)
- 반도체 소자에 있어서, 한 표면(12, 74)을 갖는 하나의 기판(11, 69)과, 상기 기판(11, 69)에 의해 지지되고, 제1부분과 상기 제1부분에 인접한 제2부분을 갖는 제1의 광검출기와, 상기 기판(11, 69)의 표면 위에 놓이고, 상기 제1광검출기의 상기 제2부분 위에 놓이는 제1의 구멍을 갖고, 상기 제1광검출기에 대해 움직임이 가능한 진동 질량(21, 63)을 포함하는 것을 특징으로 하는 반도체 소자.
- 광학 반도체 소자에 있어서 하나의 기판(11, 69)과, 제1의 도전형을 갖는 상기 기판(11, 69) 내의 제1의 영역과, 상기 제1의 도전형과 다른 제2의 도전형을 갖고, 상기 제1의 영역에 인접한, 상기 기판(11, 69)내의 제2영역과, 상기 제1영역의 한 부분과 상기 제2영역의 한 부분 위에 놓이는 움직임이 가능한 구조(21, 63)와, 상기 기판(11, 69)의 한 부분 위에 놓이는 전기 절연층으로, 상기 움직임이 가능한 구조(21, 63)는 상기 제2영역의 부분 위에 놓이는 하나의 구멍을 갖고, 상기 구멍은 폭과 길이를 갖고, 상기 움직임이 가능한 구조(21, 63)의 한 부분은 상기 전기 절연층으로부터 일정 거리만큼 분리되고, 상기 구멍의 상기 폭 및 길이는 상기 일정 거리보다 큰, 전기 절연층을 포함하는 것을 특징으로 하는 광학 반도체 소자.
- 반도체 소자를 제조하는 방법에 있어서, 하나의 기판(11, 69)을 제공하는 단계와, 상기 기판(11, 69)내에 광검출기를 형성하는 단계와, 상기 기판(11, 69)의 한 부분 위에, 상기 기판(11, 69)에 대해 움직임이 가능한 진동 질량(21, 63)을 형성하는 단계를 포함하는 것을 특징으로 하는 반도체 소자의 제조 방법.※ 참고사항 : 최초출원 내용에 의하여 공개되는 것임.
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US654,514 | 1996-05-28 | ||
| US08/654,514 US5936294A (en) | 1996-05-28 | 1996-05-28 | Optical semiconductor component and method of fabrication |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| KR970077750A true KR970077750A (ko) | 1997-12-12 |
| KR100528553B1 KR100528553B1 (ko) | 2006-01-27 |
Family
ID=24625183
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| KR1019970022722A Expired - Fee Related KR100528553B1 (ko) | 1996-05-28 | 1997-05-28 | 광학반도체소자및이의제조방법 |
Country Status (5)
| Country | Link |
|---|---|
| US (1) | US5936294A (ko) |
| EP (1) | EP0810440B1 (ko) |
| JP (1) | JP4579352B2 (ko) |
| KR (1) | KR100528553B1 (ko) |
| DE (1) | DE69712128T2 (ko) |
Families Citing this family (18)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| IL122947A (en) * | 1998-01-15 | 2001-03-19 | Armament Dev Authority State O | Micro-electro-opto-mechanical inertial sensor with integrative optical sensing |
| DE19825298C2 (de) * | 1998-06-05 | 2003-02-13 | Fraunhofer Ges Forschung | Verfahren zur Herstellung einer Sensoranordnung und Sensoranordnung |
| EP1097483A2 (de) * | 1998-06-30 | 2001-05-09 | Robert Bosch Gmbh | Vorrichtung zur erfassung elektromagnetischer strahlung |
| DE19923606A1 (de) * | 1998-06-30 | 2000-01-13 | Bosch Gmbh Robert | Vorrichtung zur Erfassung elektromagnetischer Strahlung |
| US6494095B1 (en) * | 2000-03-28 | 2002-12-17 | Opticnet, Inc. | Micro electromechanical switch for detecting acceleration or decelaration |
| JP3453557B2 (ja) * | 2000-12-11 | 2003-10-06 | キヤノン株式会社 | 通信ネットワークを用いた光半導体素子の品質信頼性情報提供システム |
| US6550330B1 (en) * | 2001-03-14 | 2003-04-22 | The United States Of America As Represented By The Secretary Of The Navy | Differential amplification for micro-electro-mechanical ultra-sensitive accelerometer |
| US6581465B1 (en) * | 2001-03-14 | 2003-06-24 | The United States Of America As Represented By The Secretary Of The Navy | Micro-electro-mechanical systems ultra-sensitive accelerometer |
| US7222534B2 (en) * | 2005-03-31 | 2007-05-29 | Pgs Americas, Inc. | Optical accelerometer, optical inclinometer and seismic sensor system using such accelerometer and inclinometer |
| US7516659B2 (en) * | 2006-05-11 | 2009-04-14 | Avago Technologies General Ip (Singapore) Pte. Ltd. | Inertial force sensor |
| US7808618B1 (en) * | 2008-01-09 | 2010-10-05 | The Charles Stark Draper Laboratory, Inc. | Methods and apparatus for providing a semiconductor optical flexured mass accelerometer |
| CN101545921B (zh) * | 2008-03-25 | 2011-12-14 | 鸿富锦精密工业(深圳)有限公司 | 加速度计 |
| US20090308158A1 (en) * | 2008-06-13 | 2009-12-17 | Bard Arnold D | Optical Accelerometer |
| US8205497B1 (en) * | 2009-03-05 | 2012-06-26 | Sandia Corporation | Microelectromechanical inertial sensor |
| TWI451089B (zh) * | 2009-11-12 | 2014-09-01 | Pixart Imaging Inc | 光學式偵測方法、光學式微機電偵測計、及其製法 |
| EP2702415A2 (de) * | 2011-04-18 | 2014-03-05 | Donau-Universität Krems | Erfassungsverfahren und sensor |
| US8783106B1 (en) | 2011-12-13 | 2014-07-22 | Sandia Corporation | Micromachined force-balance feedback accelerometer with optical displacement detection |
| US20150323379A1 (en) * | 2014-05-07 | 2015-11-12 | Mao-Jen Wu | Optical Inertial Sensing Module |
Family Cites Families (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4322829A (en) * | 1980-09-11 | 1982-03-30 | Dynamic Systems, Inc. | Fiber optic accelerometer and method of measuring inertial force |
| DE3209043C2 (de) * | 1981-03-12 | 1986-09-25 | Mitutoyo Mfg. Co., Ltd., Tokio/Tokyo | Fotoelektrische Bewegungs-Meßeinrichtung |
| US4428234A (en) * | 1982-03-25 | 1984-01-31 | Walker Clifford G | Phase detection laser accelerometer |
| JPH0664084B2 (ja) * | 1985-04-16 | 1994-08-22 | シュルンベルジェ オーバーシーズ エス.エイ. | 光感震器 |
| DE3518383C1 (de) * | 1985-05-22 | 1986-12-04 | Boge Gmbh, 5208 Eitorf | Beschleunigungsmesser |
| US4879470A (en) * | 1987-01-16 | 1989-11-07 | Canon Kabushiki Kaisha | Photoelectric converting apparatus having carrier eliminating means |
| US5428996A (en) * | 1990-12-24 | 1995-07-04 | Litton Systems, Inc. | Hinge assembly for integrated accelerometer |
| JP3300060B2 (ja) * | 1992-10-22 | 2002-07-08 | キヤノン株式会社 | 加速度センサー及びその製造方法 |
| US5559358A (en) * | 1993-05-25 | 1996-09-24 | Honeywell Inc. | Opto-electro-mechanical device or filter, process for making, and sensors made therefrom |
| US5488864A (en) * | 1994-12-19 | 1996-02-06 | Ford Motor Company | Torsion beam accelerometer with slotted tilt plate |
-
1996
- 1996-05-28 US US08/654,514 patent/US5936294A/en not_active Expired - Fee Related
-
1997
- 1997-05-12 DE DE69712128T patent/DE69712128T2/de not_active Expired - Fee Related
- 1997-05-12 EP EP97107711A patent/EP0810440B1/en not_active Expired - Lifetime
- 1997-05-19 JP JP14474297A patent/JP4579352B2/ja not_active Expired - Fee Related
- 1997-05-28 KR KR1019970022722A patent/KR100528553B1/ko not_active Expired - Fee Related
Also Published As
| Publication number | Publication date |
|---|---|
| DE69712128T2 (de) | 2002-10-02 |
| JP4579352B2 (ja) | 2010-11-10 |
| EP0810440A3 (en) | 1997-12-10 |
| EP0810440A2 (en) | 1997-12-03 |
| JPH1090298A (ja) | 1998-04-10 |
| DE69712128D1 (de) | 2002-05-29 |
| US5936294A (en) | 1999-08-10 |
| KR100528553B1 (ko) | 2006-01-27 |
| EP0810440B1 (en) | 2002-04-24 |
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