LU86742A1 - Dispositif d'analyse interferometrique des deformation d'un corps - Google Patents

Dispositif d'analyse interferometrique des deformation d'un corps Download PDF

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Publication number
LU86742A1
LU86742A1 LU86742A LU86742A LU86742A1 LU 86742 A1 LU86742 A1 LU 86742A1 LU 86742 A LU86742 A LU 86742A LU 86742 A LU86742 A LU 86742A LU 86742 A1 LU86742 A1 LU 86742A1
Authority
LU
Luxembourg
Prior art keywords
reticle
optical
reticles
photosensitive film
systems
Prior art date
Application number
LU86742A
Other languages
English (en)
French (fr)
Inventor
Carlo Albertini
Mario Montagnani
Luciano Pirodda
Original Assignee
Euratom
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Euratom filed Critical Euratom
Priority to LU86742A priority Critical patent/LU86742A1/fr
Priority to DE8888100699T priority patent/DE3862301D1/de
Priority to EP88100699A priority patent/EP0275982B1/de
Priority to AT88100699T priority patent/ATE62545T1/de
Priority to ES88100699T priority patent/ES2021762B3/es
Publication of LU86742A1 publication Critical patent/LU86742A1/fr
Priority to GR91400776T priority patent/GR3002098T3/el

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/245—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures using a plurality of fixed, simultaneously operating transducers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/16—Measuring arrangements characterised by the use of optical techniques for measuring the deformation in a solid, e.g. optical strain gauge
    • G01B11/161—Measuring arrangements characterised by the use of optical techniques for measuring the deformation in a solid, e.g. optical strain gauge by interferometric means
    • G01B11/162—Measuring arrangements characterised by the use of optical techniques for measuring the deformation in a solid, e.g. optical strain gauge by interferometric means by speckle- or shearing interferometry
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/16—Measuring arrangements characterised by the use of optical techniques for measuring the deformation in a solid, e.g. optical strain gauge
    • G01B11/167—Measuring arrangements characterised by the use of optical techniques for measuring the deformation in a solid, e.g. optical strain gauge by projecting a pattern on the object
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/25—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
    • G01B11/254—Projection of a pattern, viewing through a pattern, e.g. moiré

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Investigating Strength Of Materials By Application Of Mechanical Stress (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
LU86742A 1987-01-20 1987-01-20 Dispositif d'analyse interferometrique des deformation d'un corps LU86742A1 (fr)

Priority Applications (6)

Application Number Priority Date Filing Date Title
LU86742A LU86742A1 (fr) 1987-01-20 1987-01-20 Dispositif d'analyse interferometrique des deformation d'un corps
DE8888100699T DE3862301D1 (de) 1987-01-20 1988-01-19 Vorrichtung zur interferometrischen analyse von verformungen eines koerpers.
EP88100699A EP0275982B1 (de) 1987-01-20 1988-01-19 Vorrichtung zur interferometrischen Analyse von Verformungen eines Körpers
AT88100699T ATE62545T1 (de) 1987-01-20 1988-01-19 Vorrichtung zur interferometrischen analyse von verformungen eines koerpers.
ES88100699T ES2021762B3 (es) 1987-01-20 1988-01-19 Dispositivo de analisis interferometrico de deformaciones de un cuerpo.
GR91400776T GR3002098T3 (en) 1987-01-20 1991-06-10 Device for interferometrically analysing the deformations of a body

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
LU86742 1987-01-20
LU86742A LU86742A1 (fr) 1987-01-20 1987-01-20 Dispositif d'analyse interferometrique des deformation d'un corps

Publications (1)

Publication Number Publication Date
LU86742A1 true LU86742A1 (fr) 1988-02-02

Family

ID=19730854

Family Applications (1)

Application Number Title Priority Date Filing Date
LU86742A LU86742A1 (fr) 1987-01-20 1987-01-20 Dispositif d'analyse interferometrique des deformation d'un corps

Country Status (6)

Country Link
EP (1) EP0275982B1 (de)
AT (1) ATE62545T1 (de)
DE (1) DE3862301D1 (de)
ES (1) ES2021762B3 (de)
GR (1) GR3002098T3 (de)
LU (1) LU86742A1 (de)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
IT1290844B1 (it) * 1996-11-14 1998-12-14 Cise Spa Procedimento per la misura in campo delle deformazioni permanenti su componenti metallici di impianto operanti ad alta temperatura e
DE10111301B4 (de) * 2001-03-09 2004-07-08 Stefan Dengler Prüfeinrichtung und Prüfverfahren für verformbare Prüflinge, insbesondere für Reifen
CN108007375B (zh) * 2017-12-18 2019-09-24 齐齐哈尔大学 一种基于合成波长双光源剪切散斑干涉的三维变形测量方法
CN109253696A (zh) * 2018-11-28 2019-01-22 信利光电股份有限公司 基于结构光测量物件尺寸的设备

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2292213A1 (fr) * 1974-11-21 1976-06-18 Cem Comp Electro Mec Procede et dispositif permettant de determiner le signe des lignes de niveau d'un objet

Also Published As

Publication number Publication date
ATE62545T1 (de) 1991-04-15
EP0275982B1 (de) 1991-04-10
DE3862301D1 (de) 1991-05-16
GR3002098T3 (en) 1992-12-30
EP0275982A1 (de) 1988-07-27
ES2021762B3 (es) 1991-11-16

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