LU92620B1 - Rastermikroskop - Google Patents

Rastermikroskop

Info

Publication number
LU92620B1
LU92620B1 LU92620A LU92620A LU92620B1 LU 92620 B1 LU92620 B1 LU 92620B1 LU 92620 A LU92620 A LU 92620A LU 92620 A LU92620 A LU 92620A LU 92620 B1 LU92620 B1 LU 92620B1
Authority
LU
Luxembourg
Prior art keywords
grid microscope
microscope
grid
Prior art date
Application number
LU92620A
Other languages
English (en)
Inventor
Jonas Fölling
Original Assignee
Leica Microsystems
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Leica Microsystems filed Critical Leica Microsystems
Priority to LU92620A priority Critical patent/LU92620B1/de
Priority to US15/536,675 priority patent/US10663707B2/en
Priority to JP2017533247A priority patent/JP2018501515A/ja
Priority to PCT/EP2015/080724 priority patent/WO2016097399A1/de
Priority to EP15817826.9A priority patent/EP3234680A1/de
Application granted granted Critical
Publication of LU92620B1 publication Critical patent/LU92620B1/de

Links

Classifications

    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/0004—Microscopes specially adapted for specific applications
    • G02B21/002—Scanning microscopes
    • G02B21/0024—Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
    • G02B21/0052—Optical details of the image generation
    • G02B21/006—Optical details of the image generation focusing arrangements; selection of the plane to be imaged
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/0004—Microscopes specially adapted for specific applications
    • G02B21/002—Scanning microscopes
    • G02B21/0024—Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
    • G02B21/0052—Optical details of the image generation
    • G02B21/0064—Optical details of the image generation multi-spectral or wavelength-selective arrangements, e.g. wavelength fan-out, chromatic profiling
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/0004—Microscopes specially adapted for specific applications
    • G02B21/002—Scanning microscopes
    • G02B21/0024—Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
    • G02B21/0036—Scanning details, e.g. scanning stages
    • G02B21/0044—Scanning details, e.g. scanning stages moving apertures, e.g. Nipkow disks, rotating lens arrays
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/0004—Microscopes specially adapted for specific applications
    • G02B21/002—Scanning microscopes
    • G02B21/0024—Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
    • G02B21/0052—Optical details of the image generation
    • G02B21/0076—Optical details of the image generation arrangements using fluorescence or luminescence
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/0004—Microscopes specially adapted for specific applications
    • G02B21/002—Scanning microscopes
    • G02B21/0024—Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
    • G02B21/008—Details of detection or image processing, including general computer control
    • G02B21/0084—Details of detection or image processing, including general computer control time-scale detection, e.g. strobed, ultra-fast, heterodyne detection
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/36—Microscopes arranged for photographic purposes or projection purposes or digital imaging or video purposes including associated control and data processing arrangements
    • G02B21/361—Optical details, e.g. image relay to the camera or image sensor
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/36—Microscopes arranged for photographic purposes or projection purposes or digital imaging or video purposes including associated control and data processing arrangements
    • G02B21/365—Control or image processing arrangements for digital or video microscopes
    • G02B21/367—Control or image processing arrangements for digital or video microscopes providing an output produced by processing a plurality of individual source images, e.g. image tiling, montage, composite images, depth sectioning, image comparison

Landscapes

  • Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • General Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Engineering & Computer Science (AREA)
  • Multimedia (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • General Engineering & Computer Science (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Microscoopes, Condenser (AREA)
  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
LU92620A 2014-12-19 2014-12-19 Rastermikroskop LU92620B1 (de)

Priority Applications (5)

Application Number Priority Date Filing Date Title
LU92620A LU92620B1 (de) 2014-12-19 2014-12-19 Rastermikroskop
US15/536,675 US10663707B2 (en) 2014-12-19 2015-12-21 Scanning microscope
JP2017533247A JP2018501515A (ja) 2014-12-19 2015-12-21 走査顕微鏡
PCT/EP2015/080724 WO2016097399A1 (de) 2014-12-19 2015-12-21 Rastermikroskop
EP15817826.9A EP3234680A1 (de) 2014-12-19 2015-12-21 Rastermikroskop

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
LU92620A LU92620B1 (de) 2014-12-19 2014-12-19 Rastermikroskop

Publications (1)

Publication Number Publication Date
LU92620B1 true LU92620B1 (de) 2016-06-20

Family

ID=52440760

Family Applications (1)

Application Number Title Priority Date Filing Date
LU92620A LU92620B1 (de) 2014-12-19 2014-12-19 Rastermikroskop

Country Status (5)

Country Link
US (1) US10663707B2 (de)
EP (1) EP3234680A1 (de)
JP (1) JP2018501515A (de)
LU (1) LU92620B1 (de)
WO (1) WO2016097399A1 (de)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
LU92620B1 (de) * 2014-12-19 2016-06-20 Leica Microsystems Rastermikroskop
EP4671843A1 (de) * 2024-06-25 2025-12-31 Leica Microsystems CMS GmbH Detektionsanordnung, kaskadierte detektionsanordnung und optisches scanmikroskop

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20020020819A1 (en) * 2000-08-08 2002-02-21 Ralf Wolleschensky Method and apparatus for rapid change of fluorescence bands in the detection of dyes in fluorescence microscopy
EP2253983A2 (de) * 2009-05-22 2010-11-24 Olympus Corporation Elektronenrastermikroskopvorrichtung
US20120257037A1 (en) * 2011-04-07 2012-10-11 Valerica Raicu High speed microscope with two-stage scanning for detection of rarities in samples

Family Cites Families (28)

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JP3634985B2 (ja) 1999-08-26 2005-03-30 住友大阪セメント株式会社 光学的表面検査機構及び光学的表面検査装置
DE10065784C2 (de) * 2000-12-30 2003-12-04 Leica Microsystems Verfahren zum Auffinden von Kontaktstellen zwischen Zellen in einer stimulierbaren mikroskopischen Probe bei einer Kalziummigration und Scanmikroskop zur Durchführung des Verfahrens
EP1620631B1 (de) * 2003-05-02 2007-07-11 Baker Hughes Incorporated Aufzeichnungsvorrichtung für kontinuierliche daten für einen bohrlochprobenbehälter
US7539308B2 (en) * 2003-05-23 2009-05-26 General Dynamics Advanced Information Systems, Inc. Quantum steganography
US7609382B2 (en) * 2003-05-23 2009-10-27 General Dynamics Advanced Information System, Inc, System and method of detecting entangled photons
US7304314B2 (en) * 2003-11-26 2007-12-04 General Dynamics Advanced Information Systems Inc. Quantum cross-ambiguity function generator
US7831048B2 (en) * 2003-12-17 2010-11-09 General Dynamics Advanced Information Systems, Inc. Secure quantum key distribution using entangled photons
JP4414771B2 (ja) * 2004-01-08 2010-02-10 オリンパス株式会社 共焦点顕微分光装置
US7292342B2 (en) * 2004-01-30 2007-11-06 General Dynamics Advanced Information Systems Inc. Entangled photon fourier transform spectroscopy
US7362420B2 (en) * 2004-03-24 2008-04-22 General Dynamics Advanced Information Systems, Inc. Entangled-photons range finding system and method
US7408637B2 (en) * 2004-03-24 2008-08-05 General Dynamics Advanced Information Systems, Inc. Entangled photon spectroscopy for stand-off detection and characterization
JP4804727B2 (ja) * 2004-06-24 2011-11-02 オリンパス株式会社 光走査型共焦点顕微鏡
JP4709278B2 (ja) * 2005-05-23 2011-06-22 エフ． ヘスス ハラルド 光変換可能な光学標識を用いる光学顕微鏡法
US7706694B2 (en) * 2005-07-25 2010-04-27 General Dynamics Advanced Information Systems, Inc. Processor for entangled complex signals
DE102008029458B4 (de) * 2008-06-20 2019-02-07 Carl Zeiss Microscopy Gmbh Verfahren zum Aufzeichnen von Impulssignalen
FI20096067A0 (fi) * 2009-10-15 2009-10-15 Valtion Teknillinen Raman-säteilyn mittaus
DE102009060793A1 (de) * 2009-12-22 2011-07-28 Carl Zeiss Microlmaging GmbH, 07745 Hochauflösendes Mikroskop und Verfahren zur zwei- oder dreidimensionalen Positionsbestimmung von Objekten
DE102010007730B4 (de) * 2010-02-12 2021-08-26 Leica Microsystems Cms Gmbh Verfahren und Vorrichtung zum Einstellen eines geeigneten Auswerteparameters für ein Fluoreszenzmikroskop
DE102010036709A1 (de) * 2010-07-28 2012-02-02 Leica Microsystems Cms Gmbh Einrichtung und Verfahren zur mikroskopischen Bildaufnahme einer Probenstruktur
JP2012208050A (ja) * 2011-03-30 2012-10-25 Tokyo Electron Ltd 測定装置及びプラズマ処理装置
DE102011017078B4 (de) * 2011-04-15 2019-01-31 Leica Microsystems Cms Gmbh Weitfeld-Mikroskop-Beleuchtungssystem, Verwendung desselben und Weitfeld-Beleuchtungsverfahren
DE102011086230B4 (de) * 2011-11-11 2023-02-23 Leica Microsystems Cms Gmbh Verfahren und Vorrichtung zur Beleuchtung und Detektion in der RESOLFT-Mikroskopie
DE102011055294B4 (de) * 2011-11-11 2013-11-07 Leica Microsystems Cms Gmbh Mikroskopische Einrichtung und Verfahren zur dreidimensionalen Lokalisierung von punktförmigen Objekten in einer Probe
JP6257156B2 (ja) * 2013-03-04 2018-01-10 オリンパス株式会社 顕微鏡装置
DE102013102988A1 (de) * 2013-03-22 2014-09-25 Leica Microsystems Cms Gmbh Lichtmikroskopisches Verfahren zur Lokalisierung von Punktobjekten
DE102013106895B4 (de) * 2013-07-01 2015-09-17 Leica Microsystems Cms Gmbh Lichtmikroskopisches Verfahren zur Lokalisierung von Punktobjekten
US9690086B2 (en) * 2013-11-20 2017-06-27 Leica Microsystems Cms Gmbh Wide-field microscope illumination system and wide-field illumination method
LU92620B1 (de) * 2014-12-19 2016-06-20 Leica Microsystems Rastermikroskop

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20020020819A1 (en) * 2000-08-08 2002-02-21 Ralf Wolleschensky Method and apparatus for rapid change of fluorescence bands in the detection of dyes in fluorescence microscopy
EP2253983A2 (de) * 2009-05-22 2010-11-24 Olympus Corporation Elektronenrastermikroskopvorrichtung
US20120257037A1 (en) * 2011-04-07 2012-10-11 Valerica Raicu High speed microscope with two-stage scanning for detection of rarities in samples

Also Published As

Publication number Publication date
US20170351071A1 (en) 2017-12-07
US10663707B2 (en) 2020-05-26
EP3234680A1 (de) 2017-10-25
JP2018501515A (ja) 2018-01-18
WO2016097399A1 (de) 2016-06-23

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