MA50347A - Analyse d'un échantillon de roche - Google Patents

Analyse d'un échantillon de roche

Info

Publication number
MA50347A
MA50347A MA050347A MA50347A MA50347A MA 50347 A MA50347 A MA 50347A MA 050347 A MA050347 A MA 050347A MA 50347 A MA50347 A MA 50347A MA 50347 A MA50347 A MA 50347A
Authority
MA
Morocco
Prior art keywords
analysis
rock sample
rock
sample
Prior art date
Application number
MA050347A
Other languages
English (en)
Inventor
David Jacobi
Jordan Kone
John Longo
Qiushi Sun
Original Assignee
Saudi Arabian Oil Co
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Saudi Arabian Oil Co filed Critical Saudi Arabian Oil Co
Publication of MA50347A publication Critical patent/MA50347A/fr

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N33/00—Investigating or analysing materials by specific methods not covered by groups G01N1/00 - G01N31/00
    • G01N33/24—Earth materials
    • G01N33/241—Earth materials for hydrocarbon content
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
    • G01N23/225—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material using electron or ion
    • G01N23/2251—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material using electron or ion using incident electron beams, e.g. scanning electron microscopy [SEM]
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/0002—Inspection of images, e.g. flaw detection
    • G06T7/0004—Industrial image inspection
    • G06T7/0008—Industrial image inspection checking presence/absence
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/60—Specific applications or type of materials
    • G01N2223/616—Specific applications or type of materials earth materials
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/20091—Measuring the energy-dispersion spectrum [EDS] of diffracted radiation
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
    • G01N23/2206—Combination of two or more measurements, at least one measurement being that of secondary emission, e.g. combination of secondary electron [SE] measurement and back-scattered electron [BSE] measurement
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
    • G01N23/2209—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material using wavelength dispersive spectroscopy [WDS]
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
    • G01N23/223—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/10—Image acquisition modality
    • G06T2207/10056—Microscopic image
    • G06T2207/10061—Microscopic image from scanning electron microscope

Landscapes

  • Engineering & Computer Science (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • General Health & Medical Sciences (AREA)
  • Biochemistry (AREA)
  • Analytical Chemistry (AREA)
  • Geology (AREA)
  • Medicinal Chemistry (AREA)
  • Food Science & Technology (AREA)
  • General Life Sciences & Earth Sciences (AREA)
  • Environmental & Geological Engineering (AREA)
  • Remote Sensing (AREA)
  • Quality & Reliability (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Theoretical Computer Science (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Processing Or Creating Images (AREA)
MA050347A 2017-05-15 2018-05-11 Analyse d'un échantillon de roche MA50347A (fr)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US201762506263P 2017-05-15 2017-05-15

Publications (1)

Publication Number Publication Date
MA50347A true MA50347A (fr) 2020-08-19

Family

ID=62713066

Family Applications (1)

Application Number Title Priority Date Filing Date
MA050347A MA50347A (fr) 2017-05-15 2018-05-11 Analyse d'un échantillon de roche

Country Status (8)

Country Link
US (1) US10739326B2 (fr)
EP (1) EP3635392B1 (fr)
JP (1) JP2020519901A (fr)
CN (1) CN110662961B (fr)
CA (1) CA3058914A1 (fr)
MA (1) MA50347A (fr)
SA (1) SA519410245B1 (fr)
WO (1) WO2018213104A1 (fr)

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WO2020091880A1 (fr) * 2018-10-31 2020-05-07 Exxonmobil Upstream Research Company Microanalyse de roche à grain fin pour analyse de qualité de réservoir
KR102178444B1 (ko) * 2018-12-19 2020-11-13 주식회사 포스코 미세 조직 분석 장치
US11371827B2 (en) * 2019-06-11 2022-06-28 Halliburton Energy Services, Inc. Multiple scale analysis of core sample to estimate surface roughness
CN111751394B (zh) * 2020-04-17 2021-08-27 山东大学 基于图像与xrf矿物反演的岩性识别方法及系统
CN111751512A (zh) * 2020-05-27 2020-10-09 中国石油天然气股份有限公司 一种白云岩或松散沉积物微生物成因确定方法
CN111999325B (zh) * 2020-08-20 2023-07-25 合肥工业大学 一种基性岩中原位锆石的寻找方法
JP7500065B2 (ja) * 2020-08-20 2024-06-17 国立研究開発法人産業技術総合研究所 鉱石分析のための情報処理方法及びシステム
AT524288B1 (de) * 2020-09-16 2024-05-15 Gatan Inc Computergestütztes Verfahren zur Bestimmung eines Elementanteiles eines Bestimmungselementes kleiner Ordnungszahl, insbesondere eines Li-Anteiles, und Vorrichtung zur Datenverarbeitung hierzu
CN114518343B (zh) * 2020-11-20 2025-10-31 中国石油天然气股份有限公司 页岩油储层纹理参数的获取方法、装置及计算机设备
EP4024039B1 (fr) * 2020-12-30 2023-10-25 FEI Company Acquisition de données et techniques de traitement pour une reconstruction tridimensionnelle
US11584889B2 (en) * 2021-01-04 2023-02-21 Saudi Arabian Oil Company Synthetic source rock with tea
CN113435456B (zh) 2021-02-08 2025-04-01 中国石油化工股份有限公司 基于机器学习的岩石薄片组分识别方法、装置及介质
CN113049521B (zh) * 2021-03-29 2023-09-26 自然资源实物地质资料中心 识别碳酸盐岩的方法、装置及设备、存储介质
US11851610B2 (en) * 2021-12-14 2023-12-26 Saudi Arabian Oil Company Sequestration of carbon dioxide in organic-rich geological formations
US12254602B2 (en) * 2022-02-23 2025-03-18 Applied Materials Israel Ltd. Reducing backscattered electron induced errors
CN115064011B (zh) * 2022-03-02 2024-08-09 上海广为电器工具有限公司 元素周期展示系统以及展示方法
CN114486962B (zh) * 2022-04-01 2022-06-14 中国科学院地质与地球物理研究所 复杂成分样品含轻元素矿物的定量识别方法、系统和设备
EP4310485B1 (fr) * 2022-07-21 2026-03-18 FEI Company Procédé d'examen d'un échantillon à l'aide d'un microscope à particules chargées
CN115356462B (zh) * 2022-08-22 2024-10-22 中国地质大学（北京） 一种花岗岩熔体硫含量确定方法及系统
CN116342370B (zh) * 2023-03-08 2023-10-31 西藏巨龙铜业有限公司 一种基于gpu的地球化学数据一体化处理方法及系统
CN116087249B (zh) * 2023-04-10 2023-06-30 中国科学院地质与地球物理研究所 一种用于识别矿物分布和含量的方法、系统和电子设备
CN119649313B (zh) * 2025-02-20 2025-04-11 陕西省一八五煤田地质有限公司 一种基于影像数据的矿区沉降监测方法及系统
CN120044066A (zh) * 2025-04-23 2025-05-27 中国科学院地质与地球物理研究所 一种快速定位月壤样品中高镁物质的方法

Family Cites Families (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3697549B2 (ja) * 1999-02-15 2005-09-21 日本電子株式会社 粒子線装置における試料物質同定装置
US6140643A (en) 1999-03-09 2000-10-31 Exxonmobil Upstream Research Company Method for identification of unknown substances
US8101907B2 (en) 2006-04-19 2012-01-24 Baker Hughes Incorporated Methods for quantitative lithological and mineralogical evaluation of subsurface formations
WO2009070365A1 (fr) * 2007-11-27 2009-06-04 Exxonmobil Upstream Research Company Procédé pour déterminer les propriétés de réservoirs d'hydrocarbure à partir de données géophysiques
US8170799B2 (en) * 2008-11-24 2012-05-01 Ingrain, Inc. Method for determining in-situ relationships between physical properties of a porous medium from a sample thereof
US9507047B1 (en) * 2011-05-10 2016-11-29 Ingrain, Inc. Method and system for integrating logging tool data and digital rock physics to estimate rock formation properties
WO2013169973A1 (fr) * 2012-05-11 2013-11-14 Ingrain, Inc. Procédé et système pour analyse de déblais tomographique assistée par ordinateur à plusieurs énergies
US9188555B2 (en) * 2012-07-30 2015-11-17 Fei Company Automated EDS standards calibration
US9778215B2 (en) * 2012-10-26 2017-10-03 Fei Company Automated mineral classification
EP3014315B1 (fr) * 2013-06-27 2022-08-03 CGG Services SAS Procédé et système de mesure de fracturabilité
US9183656B2 (en) * 2014-03-11 2015-11-10 Fei Company Blend modes for mineralogy images
WO2016049204A1 (fr) * 2014-09-25 2016-03-31 Ingrain, Inc. Procédés et systèmes de modification de pore numérique
WO2017011658A2 (fr) * 2015-07-14 2017-01-19 Conocophillips Company Prévision d'une réponse de récupération de pétrole améliorée
CN105181717B (zh) * 2015-09-22 2017-12-15 同济大学 基于能量色散x射线谱的煤矸石物相分析方法

Also Published As

Publication number Publication date
JP2020519901A (ja) 2020-07-02
WO2018213104A1 (fr) 2018-11-22
US10739326B2 (en) 2020-08-11
CN110662961B (zh) 2022-06-03
EP3635392B1 (fr) 2022-07-06
EP3635392A1 (fr) 2020-04-15
SA519410245B1 (ar) 2022-07-24
CN110662961A (zh) 2020-01-07
US20180328905A1 (en) 2018-11-15
CA3058914A1 (fr) 2018-11-22

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