MA71549A - Dispositif de sonde de test - Google Patents

Dispositif de sonde de test

Info

Publication number
MA71549A
MA71549A MA71549A MA71549A MA71549A MA 71549 A MA71549 A MA 71549A MA 71549 A MA71549 A MA 71549A MA 71549 A MA71549 A MA 71549A MA 71549 A MA71549 A MA 71549A
Authority
MA
Morocco
Prior art keywords
test probe
probe device
test
probe
Prior art date
Application number
MA71549A
Other languages
English (en)
Inventor
Arno IHLE
Johannes Kirn
Original Assignee
FeinmetallGesellschaft mit beschränkter Haftung
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by FeinmetallGesellschaft mit beschränkter Haftung filed Critical FeinmetallGesellschaft mit beschränkter Haftung
Publication of MA71549A publication Critical patent/MA71549A/fr

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/06711—Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
    • G01R1/06733—Geometry aspects
    • G01R1/06738—Geometry aspects related to tip portion
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/06711—Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
    • G01R1/06716—Elastic
    • G01R1/06722—Spring-loaded
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/06772—High frequency probes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
    • G01R1/07314—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being perpendicular to test object, e.g. bed of nails or probe with bump contacts on a rigid support
    • G01R1/07328—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being perpendicular to test object, e.g. bed of nails or probe with bump contacts on a rigid support for testing printed circuit boards
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/06711—Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
    • G01R1/06733—Geometry aspects

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Geometry (AREA)
  • Measuring Leads Or Probes (AREA)
  • Tests Of Electronic Circuits (AREA)
MA71549A 2022-07-21 2023-07-21 Dispositif de sonde de test MA71549A (fr)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
DE202022104119.9U DE202022104119U1 (de) 2022-07-21 2022-07-21 Prüfstiftvorrichtung
EP23744809.7A EP4558834A1 (fr) 2022-07-21 2023-07-21 Dispositif de sonde de test
PCT/EP2023/070253 WO2024018047A1 (fr) 2022-07-21 2023-07-21 Dispositif de sonde de test

Publications (1)

Publication Number Publication Date
MA71549A true MA71549A (fr) 2025-05-30

Family

ID=83806417

Family Applications (1)

Application Number Title Priority Date Filing Date
MA71549A MA71549A (fr) 2022-07-21 2023-07-21 Dispositif de sonde de test

Country Status (9)

Country Link
US (1) US20260029429A1 (fr)
EP (1) EP4558834A1 (fr)
JP (1) JP2025525740A (fr)
KR (1) KR20250043442A (fr)
CN (1) CN119585624A (fr)
DE (1) DE202022104119U1 (fr)
MA (1) MA71549A (fr)
MX (1) MX2025000812A (fr)
WO (1) WO2024018047A1 (fr)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN119716174B (zh) * 2025-02-28 2025-08-01 荣耀终端股份有限公司 射频测试探针结构和射频测试系统

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE202011001670U1 (de) 2011-01-18 2011-03-31 Ingun Prüfmittelbau Gmbh Hochfrequenz-Prüfstift Vorrichtung
DE202019106239U1 (de) 2019-11-08 2020-12-04 Ingun Prüfmittelbau Gmbh Hochfrequenz-Prüfstiftvorrichtung
DE202019106237U1 (de) * 2019-11-08 2020-12-04 Ingun Prüfmittelbau Gmbh Hochfrequenz-Prüfstiftvorrichtung
DE202020102142U1 (de) * 2020-04-17 2020-07-16 Feinmetall Gmbh Prüfkopf zur elektrischen Berührungskontaktierung
DE202022101265U1 (de) * 2022-03-08 2022-05-30 Ingun Prüfmittelbau Gmbh Prüfstiftvorrichtung

Also Published As

Publication number Publication date
EP4558834A1 (fr) 2025-05-28
JP2025525740A (ja) 2025-08-07
KR20250043442A (ko) 2025-03-28
WO2024018047A1 (fr) 2024-01-25
CN119585624A (zh) 2025-03-07
MX2025000812A (es) 2025-04-02
US20260029429A1 (en) 2026-01-29
DE202022104119U1 (de) 2022-10-07

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