MD3257G2 - Process for gallium and arsenic recovery from waste formed after epitaxial growth of semiconductor layers of the type A3B5 - Google Patents

Process for gallium and arsenic recovery from waste formed after epitaxial growth of semiconductor layers of the type A3B5 Download PDF

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Publication number
MD3257G2
MD3257G2 MDA20060083A MD20060083A MD3257G2 MD 3257 G2 MD3257 G2 MD 3257G2 MD A20060083 A MDA20060083 A MD A20060083A MD 20060083 A MD20060083 A MD 20060083A MD 3257 G2 MD3257 G2 MD 3257G2
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MD
Moldova
Prior art keywords
gallium
arsenic
solution
arsenate
waste
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Application number
MDA20060083A
Other languages
Romanian (ro)
Russian (ru)
Other versions
MD3257F1 (en
Inventor
Симион БАРАНОВ
Борис ЧИНИК
Джоан РЕДУИНГ
Original Assignee
Производственно-Коммерческая Фирма "Discret Element" Ооо
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
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Publication date
Application filed by Производственно-Коммерческая Фирма "Discret Element" Ооо filed Critical Производственно-Коммерческая Фирма "Discret Element" Ооо
Priority to MDA20060083A priority Critical patent/MD3257G2/en
Publication of MD3257F1 publication Critical patent/MD3257F1/en
Publication of MD3257G2 publication Critical patent/MD3257G2/en

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  • Manufacture And Refinement Of Metals (AREA)
  • Removal Of Specific Substances (AREA)

Abstract

The invention relates to processes for gallium and arsenic recovery from waste formed after epitaxial growth of semiconductor layers.The process for gallium and arsenic recovery from waste formed after epitaxial growth of semiconductor layers of the type A3B5 includes dissolution of waste in the 33% nitric acid solution in hydrochloric acid, modification of the pH solution from 0,5…1,5 up to 3,0…4,5 by addition of a base solution with further precipitation of the gallium arsenate. The obtained precipitate is filtered, washed with deionized water and dried at the temperature of 90…120°C during 60 min; then it is decomposed into gallium oxide and arsenic oxide. The arsenic is reduced with carbon from oxide at the temperature of 680…780°C, and gallium is reduced into a graphite container at the temperature of 750…860°C in hydrogen flux.The gallium arsenate precipitate may also be obtained by additional dissolution, up to saturation, of the GaAs plates in the acid solution obtained at the waste dissolution, and the saturated solution is stored during 22 days at the room temperature for spontaneous precipitation of arsenate, afterwards the solution with arsenate is heated up to 60°C, in vacuum, during 2…4 hours.
MDA20060083A 2006-03-17 2006-03-17 Process for gallium and arsenic recovery from waste formed after epitaxial growth of semiconductor layers of the type A3B5 MD3257G2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
MDA20060083A MD3257G2 (en) 2006-03-17 2006-03-17 Process for gallium and arsenic recovery from waste formed after epitaxial growth of semiconductor layers of the type A3B5

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
MDA20060083A MD3257G2 (en) 2006-03-17 2006-03-17 Process for gallium and arsenic recovery from waste formed after epitaxial growth of semiconductor layers of the type A3B5

Publications (2)

Publication Number Publication Date
MD3257F1 MD3257F1 (en) 2007-02-28
MD3257G2 true MD3257G2 (en) 2007-09-30

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MDA20060083A MD3257G2 (en) 2006-03-17 2006-03-17 Process for gallium and arsenic recovery from waste formed after epitaxial growth of semiconductor layers of the type A3B5

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Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
MD176Z (en) * 2009-04-15 2010-10-31 Институт Электронной Инженерии И Промышленных Технологий Академии Наук Молдовы Process for the manufacture of high-voltage diode
MD196Z (en) * 2009-04-15 2010-11-30 Институт Электронной Инженерии И Промышленных Технологий Академии Наук Молдовы High-temperature diode column

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5967330A (en) * 1982-10-08 1984-04-17 Dowa Mining Co Ltd Separation of gallium
MD2937C2 (en) * 2004-02-05 2006-09-30 Производственно-Коммерческая Фирма "Discret Element" Ооо process for cleaning of machining attachments from waste after epitaxial growth of semiconductor layers of the type A3B5

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5967330A (en) * 1982-10-08 1984-04-17 Dowa Mining Co Ltd Separation of gallium
MD2937C2 (en) * 2004-02-05 2006-09-30 Производственно-Коммерческая Фирма "Discret Element" Ооо process for cleaning of machining attachments from waste after epitaxial growth of semiconductor layers of the type A3B5

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
MD176Z (en) * 2009-04-15 2010-10-31 Институт Электронной Инженерии И Промышленных Технологий Академии Наук Молдовы Process for the manufacture of high-voltage diode
MD196Z (en) * 2009-04-15 2010-11-30 Институт Электронной Инженерии И Промышленных Технологий Академии Наук Молдовы High-temperature diode column

Also Published As

Publication number Publication date
MD3257F1 (en) 2007-02-28

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