MD4002C2 - Apparatus for measuring the intensity of the magnetic field - Google Patents

Apparatus for measuring the intensity of the magnetic field Download PDF

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Publication number
MD4002C2
MD4002C2 MDA20080080A MD20080080A MD4002C2 MD 4002 C2 MD4002 C2 MD 4002C2 MD A20080080 A MDA20080080 A MD A20080080A MD 20080080 A MD20080080 A MD 20080080A MD 4002 C2 MD4002 C2 MD 4002C2
Authority
MD
Moldova
Prior art keywords
intensity
measuring
magnetic fields
magnetic field
measurement
Prior art date
Application number
MDA20080080A
Other languages
Romanian (ro)
Russian (ru)
Other versions
MD4002B1 (en
Inventor
Ефим ЗАСАВИЦКИЙ
Валериу КАНЦЕР
Original Assignee
Институт Электронной Инженерии И Промышленных Технологий Академии Наук Молдовы
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
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Publication date
Application filed by Институт Электронной Инженерии И Промышленных Технологий Академии Наук Молдовы filed Critical Институт Электронной Инженерии И Промышленных Технологий Академии Наук Молдовы
Priority to MDA20080080A priority Critical patent/MD4002C2/en
Publication of MD4002B1 publication Critical patent/MD4002B1/en
Publication of MD4002C2 publication Critical patent/MD4002C2/en

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  • Geophysics And Detection Of Objects (AREA)
  • Measuring Magnetic Variables (AREA)

Abstract

The invention relates to the measurement technology, namely to apparatuses for measuring the intensity of the magnetic fields and can be used in geological survey, medicine, research and other fields of science and engineering requiring measurement of intensity of the magnetic fields.The apparatus for measuring the intensity of the magnetic field comprises connected in series an adjustable electric current source (2), a superconducting sensitive element (1) with a cooling system and a recording device (3). The superconducting sensitive element (1) is made of a semiconductor from the group A4B6, for example, of lead telluride doped with thallium Pb1-xTlxTe, where x=0.01...0.0225.The result of the invention consists in increasing the accuracy of measurement of intensity of low magnetic fields.
MDA20080080A 2008-03-19 2008-03-19 Apparatus for measuring the intensity of the magnetic field MD4002C2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
MDA20080080A MD4002C2 (en) 2008-03-19 2008-03-19 Apparatus for measuring the intensity of the magnetic field

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
MDA20080080A MD4002C2 (en) 2008-03-19 2008-03-19 Apparatus for measuring the intensity of the magnetic field

Publications (2)

Publication Number Publication Date
MD4002B1 MD4002B1 (en) 2009-12-31
MD4002C2 true MD4002C2 (en) 2010-07-31

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ID=43568863

Family Applications (1)

Application Number Title Priority Date Filing Date
MDA20080080A MD4002C2 (en) 2008-03-19 2008-03-19 Apparatus for measuring the intensity of the magnetic field

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MD (1) MD4002C2 (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
MD323Z (en) * 2009-12-29 2011-08-31 Институт Электронной Инженерии И Промышленных Технологий Академии Наук Молдовы Thermoelectric microwire in glass insulation

Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
SU1527524A1 (en) * 1988-03-22 1989-12-07 МГУ им.М.В.Ломоносова Pressure transducer
US6191581B1 (en) * 1996-07-05 2001-02-20 Thomson-Csf Planar thin-film magnetic field sensor for determining directional magnetic fields
WO2004072672A1 (en) * 2003-02-11 2004-08-26 Allegro Microsystems, Inc. Integrated sensor
UA72826C2 (en) * 2003-03-31 2005-04-15 Inesa Antonivna Bolshakova Magnetic field strength transducer
WO2006042839A1 (en) * 2004-10-18 2006-04-27 Commissariat A L'energie Atomique A method and apparatus for magnetic field measurements using a magnetoresistive sensor
MD3436C2 (en) * 2005-04-25 2008-06-30 Институт Электронной Инженерии И Промышленных Технологий Академии Наук Молдовы Bolometer
MD3688C2 (en) * 2007-03-14 2009-03-31 Институт Электронной Инженерии И Промышленных Технологий Академии Наук Молдовы Semiconductor strain-sensing resistor

Patent Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
SU1527524A1 (en) * 1988-03-22 1989-12-07 МГУ им.М.В.Ломоносова Pressure transducer
US6191581B1 (en) * 1996-07-05 2001-02-20 Thomson-Csf Planar thin-film magnetic field sensor for determining directional magnetic fields
WO2004072672A1 (en) * 2003-02-11 2004-08-26 Allegro Microsystems, Inc. Integrated sensor
UA72826C2 (en) * 2003-03-31 2005-04-15 Inesa Antonivna Bolshakova Magnetic field strength transducer
WO2006042839A1 (en) * 2004-10-18 2006-04-27 Commissariat A L'energie Atomique A method and apparatus for magnetic field measurements using a magnetoresistive sensor
MD3436C2 (en) * 2005-04-25 2008-06-30 Институт Электронной Инженерии И Промышленных Технологий Академии Наук Молдовы Bolometer
MD3688C2 (en) * 2007-03-14 2009-03-31 Институт Электронной Инженерии И Промышленных Технологий Академии Наук Молдовы Semiconductor strain-sensing resistor

Non-Patent Citations (2)

* Cited by examiner, † Cited by third party
Title
Чечерников В. И. Магнитные измерения. Москва, МГУ, 1969, − с. 62-67 *
Чечерников В. И. Магнитные измерения. Москва, МГУ, 1969, с. 62-67 *

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
MD323Z (en) * 2009-12-29 2011-08-31 Институт Электронной Инженерии И Промышленных Технологий Академии Наук Молдовы Thermoelectric microwire in glass insulation

Also Published As

Publication number Publication date
MD4002B1 (en) 2009-12-31

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