MX2020008158A - Sistema y kit para formación de imágenes de retrodispersión de rayos x con detector retirable. - Google Patents

Sistema y kit para formación de imágenes de retrodispersión de rayos x con detector retirable.

Info

Publication number
MX2020008158A
MX2020008158A MX2020008158A MX2020008158A MX2020008158A MX 2020008158 A MX2020008158 A MX 2020008158A MX 2020008158 A MX2020008158 A MX 2020008158A MX 2020008158 A MX2020008158 A MX 2020008158A MX 2020008158 A MX2020008158 A MX 2020008158A
Authority
MX
Mexico
Prior art keywords
ray
backscatter
kit
movable
ray backscatter
Prior art date
Application number
MX2020008158A
Other languages
English (en)
Inventor
Peter J Rothschild
Howard D Kellogg
Original Assignee
Viken Detection Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Viken Detection Corp filed Critical Viken Detection Corp
Publication of MX2020008158A publication Critical patent/MX2020008158A/es

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01V—GEOPHYSICS; GRAVITATIONAL MEASUREMENTS; DETECTING MASSES OR OBJECTS; TAGS
    • G01V5/00—Prospecting or detecting by the use of ionising radiation, e.g. of natural or induced radioactivity
    • G01V5/20—Detecting prohibited goods, e.g. weapons, explosives, hazardous substances, contraband or smuggled objects
    • G01V5/22—Active interrogation, i.e. by irradiating objects or goods using external radiation sources, e.g. using gamma rays or cosmic rays
    • G01V5/222—Active interrogation, i.e. by irradiating objects or goods using external radiation sources, e.g. using gamma rays or cosmic rays measuring scattered radiation
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/20008—Constructional details of analysers, e.g. characterised by X-ray source, detector or optical system; Accessories therefor; Preparing specimens therefor
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
    • G01N23/043—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material using fluoroscopic examination, with visual observation or video transmission of fluoroscopic images
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/203—Measuring back scattering
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/05—Investigating materials by wave or particle radiation by diffraction, scatter or reflection
    • G01N2223/053—Investigating materials by wave or particle radiation by diffraction, scatter or reflection back scatter
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/10—Different kinds of radiation or particles
    • G01N2223/101—Different kinds of radiation or particles electromagnetic radiation
    • G01N2223/1016—X-ray
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/30—Accessories, mechanical or electrical features
    • G01N2223/301—Accessories, mechanical or electrical features portable apparatus
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/30—Accessories, mechanical or electrical features
    • G01N2223/33—Accessories, mechanical or electrical features scanning, i.e. relative motion for measurement of successive object-parts
    • G01N2223/3301—Accessories, mechanical or electrical features scanning, i.e. relative motion for measurement of successive object-parts beam is modified for scan, e.g. moving collimator
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/40—Imaging
    • G01N2223/401—Imaging image processing
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/40—Imaging
    • G01N2223/421—Imaging digitised image, analysed in real time (recognition algorithms)

Landscapes

  • Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • High Energy & Nuclear Physics (AREA)
  • General Life Sciences & Earth Sciences (AREA)
  • Geophysics (AREA)
  • Multimedia (AREA)
  • Engineering & Computer Science (AREA)
  • Radiology & Medical Imaging (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Apparatus For Radiation Diagnosis (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)

Abstract

Un generador de imágenes de rayos x movible incluye un primer conjunto de detector de rayos x de retrodispersión. El sistema también incluye un segundo conjunto de detector de rayos x de retrodispersión que es fijable de manera retirable con el generador de imágenes de rayos x movible. El generador de imágenes de rayos x movible y el segundo detector de rayos x de retrodispersión incluyen características de fijación complementarias configuradas para asegurar, de manera retirable, el segundo detector de rayos x de retrodispersión con el generador de imágenes de rayos x movible en una disposición que tiene el segundo y primer detectores de rayos x de retrodispersión orientados de manera fija con respecto entre sí.
MX2020008158A 2018-02-02 2019-02-01 Sistema y kit para formación de imágenes de retrodispersión de rayos x con detector retirable. MX2020008158A (es)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US201862625526P 2018-02-02 2018-02-02
US201962796351P 2019-01-24 2019-01-24
PCT/US2019/016436 WO2019152900A1 (en) 2018-02-02 2019-02-01 System and kit for x-ray backscatter imaging with removable detector

Publications (1)

Publication Number Publication Date
MX2020008158A true MX2020008158A (es) 2020-11-24

Family

ID=65494541

Family Applications (1)

Application Number Title Priority Date Filing Date
MX2020008158A MX2020008158A (es) 2018-02-02 2019-02-01 Sistema y kit para formación de imágenes de retrodispersión de rayos x con detector retirable.

Country Status (9)

Country Link
US (3) US10794843B2 (es)
EP (1) EP3746816A1 (es)
KR (1) KR20200110807A (es)
CN (1) CN111699413A (es)
AU (1) AU2019215207A1 (es)
CA (1) CA3089726A1 (es)
MX (1) MX2020008158A (es)
SA (1) SA520412541B1 (es)
WO (1) WO2019152900A1 (es)

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CN104170051B (zh) 2012-02-03 2017-05-31 拉皮斯坎系统股份有限公司 组合散射和透射的多视图成像系统
US10670740B2 (en) 2012-02-14 2020-06-02 American Science And Engineering, Inc. Spectral discrimination using wavelength-shifting fiber-coupled scintillation detectors
CN107209282B (zh) 2014-11-20 2019-12-20 爱康公司 X射线扫描系统和方法
US10168445B2 (en) 2015-03-20 2019-01-01 Rapiscan Systems, Inc. Hand-held portable backscatter inspection system
EP3319111B1 (en) 2015-06-30 2020-06-24 Vatech Co., Ltd. Portable x-ray generation device having electric field emission x-ray source
US10770195B2 (en) 2017-04-05 2020-09-08 Viken Detection Corporation X-ray chopper wheel assembly
MX2020008158A (es) * 2018-02-02 2020-11-24 Viken Detection Corp Sistema y kit para formación de imágenes de retrodispersión de rayos x con detector retirable.
CN112424644A (zh) 2018-06-20 2021-02-26 美国科学及工程股份有限公司 波长偏移片耦合的闪烁检测器
CN114930466B (zh) * 2019-08-02 2025-05-27 维德雷技术公司 封闭式x射线斩波轮
SE544422C2 (en) 2020-05-25 2022-05-17 RTI Group AB X-ray sensing detector assembly
CN115698774A (zh) 2020-06-02 2023-02-03 维肯检测公司 X射线成像设备和方法
US11175245B1 (en) 2020-06-15 2021-11-16 American Science And Engineering, Inc. Scatter X-ray imaging with adaptive scanning beam intensity
CN114166875B (zh) * 2020-09-11 2024-01-12 同方威视技术股份有限公司 背散射检查系统
CN114166874A (zh) * 2020-09-11 2022-03-11 同方威视技术股份有限公司 背散射检查系统和方法
CN116547524A (zh) * 2020-10-30 2023-08-04 维肯检测公司 X射线管检查系统
US11340361B1 (en) 2020-11-23 2022-05-24 American Science And Engineering, Inc. Wireless transmission detector panel for an X-ray scanner
GB2624599A (en) 2021-10-01 2024-05-22 Rapiscan Holdings Inc Methods and systems for the concurrent generation of multiple substantially similar X-ray beams
EP4551976A2 (en) 2022-07-07 2025-05-14 Viken Detection Corporation Rotating hoop chopper wheel for x-ray imagers
DE102023106834A1 (de) * 2023-03-20 2024-09-26 Bayerische Motoren Werke Aktiengesellschaft Verfahren zum Überprüfen einer Verbindung eines Kontaktiersystems einer Traktionsbatterie
WO2024228921A2 (en) 2023-04-29 2024-11-07 Videray Technologies, Inc. Handheld x-ray system including a stand-alone detector panel
US12517070B2 (en) * 2023-10-25 2026-01-06 The Boeing Company Integrated backscatter X-ray assemblies for detecting backscatter X-rays reflected by target area of article under test and associated methods
USD1099326S1 (en) * 2024-03-04 2025-10-21 Viken Detection Corporation Handheld X-ray scanner

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US9995829B2 (en) * 2008-12-10 2018-06-12 Koninklijke Philips N.V. Autonomous detector module as a building block for scalable PET and SPECT systems
CN201340400Y (zh) 2009-01-20 2009-11-04 江苏天瑞仪器股份有限公司 带有一体化散热装置的手持式x射线荧光光谱仪
WO2010136911A1 (en) 2009-05-28 2010-12-02 Koninklijke Philips Electronics, N.V. Multi-detector array imaging system
US8483356B2 (en) * 2009-10-29 2013-07-09 Rapiscan Systems, Inc. Mobile aircraft inspection system
MX2013011842A (es) * 2011-04-15 2013-11-01 American Science & Eng Inc Sistema de retrodispersion con tamaño variable de arreglo de detector.
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WO2013112819A1 (en) * 2012-01-27 2013-08-01 American Science And Engineering, Inc. Hand-held x-ray backscatter imaging device
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Also Published As

Publication number Publication date
US10794843B2 (en) 2020-10-06
AU2019215207A1 (en) 2020-08-20
SA520412541B1 (ar) 2022-12-11
KR20200110807A (ko) 2020-09-25
US20220091054A1 (en) 2022-03-24
WO2019152900A1 (en) 2019-08-08
EP3746816A1 (en) 2020-12-09
US20200326291A1 (en) 2020-10-15
US20190242834A1 (en) 2019-08-08
CA3089726A1 (en) 2019-08-08
US11448606B2 (en) 2022-09-20
CN111699413A (zh) 2020-09-22

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