MX363221B - Uso de láseres ajustables en el diseño, fabricación e implementación de elementos ópticos integrados. - Google Patents

Uso de láseres ajustables en el diseño, fabricación e implementación de elementos ópticos integrados.

Info

Publication number
MX363221B
MX363221B MX2016006096A MX2016006096A MX363221B MX 363221 B MX363221 B MX 363221B MX 2016006096 A MX2016006096 A MX 2016006096A MX 2016006096 A MX2016006096 A MX 2016006096A MX 363221 B MX363221 B MX 363221B
Authority
MX
Mexico
Prior art keywords
thin
implementation
manufacture
design
film
Prior art date
Application number
MX2016006096A
Other languages
English (en)
Other versions
MX2016006096A (es
Inventor
l perkins David
Original Assignee
Halliburton Energy Services Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Halliburton Energy Services Inc filed Critical Halliburton Energy Services Inc
Publication of MX2016006096A publication Critical patent/MX2016006096A/es
Publication of MX363221B publication Critical patent/MX363221B/es

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00Measuring arrangements characterised by the use of optical techniques
    • G01B11/02Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G01B11/06Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material
    • G01B11/0616Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material of coating
    • G01B11/0675Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material of coating using interferometry
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/21Polarisation-affecting properties
    • G01N21/211Ellipsometry
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G01N21/39Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using tunable lasers
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/8422Investigating thin films, e.g. matrix isolation method
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01SDEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
    • H01S3/00Lasers, i.e. devices using stimulated emission of electromagnetic radiation in the infrared, visible or ultraviolet wave range
    • H01S3/10Controlling the intensity, frequency, phase, polarisation or direction of the emitted radiation, e.g. switching, gating, modulating or demodulating
    • H01S3/106Controlling the intensity, frequency, phase, polarisation or direction of the emitted radiation, e.g. switching, gating, modulating or demodulating by controlling devices placed within the cavity
    • H01S3/108Controlling the intensity, frequency, phase, polarisation or direction of the emitted radiation, e.g. switching, gating, modulating or demodulating by controlling devices placed within the cavity using non-linear optical devices, e.g. exhibiting Brillouin or Raman scattering
    • H01S3/1083Controlling the intensity, frequency, phase, polarisation or direction of the emitted radiation, e.g. switching, gating, modulating or demodulating by controlling devices placed within the cavity using non-linear optical devices, e.g. exhibiting Brillouin or Raman scattering using parametric generation
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01SDEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
    • H01S3/00Lasers, i.e. devices using stimulated emission of electromagnetic radiation in the infrared, visible or ultraviolet wave range
    • H01S3/10Controlling the intensity, frequency, phase, polarisation or direction of the emitted radiation, e.g. switching, gating, modulating or demodulating
    • H01S3/13Stabilisation of laser output parameters, e.g. frequency or amplitude
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J4/00Measuring polarisation of light
    • G01J4/04Polarimeters using electric detection means

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • General Health & Medical Sciences (AREA)
  • Pathology (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Electromagnetism (AREA)
  • Optics & Photonics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Engineering & Computer Science (AREA)
  • Plasma & Fusion (AREA)
  • Mathematical Physics (AREA)
  • Nonlinear Science (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Semiconductor Lasers (AREA)

Abstract

Se describen sistemas y métodos que utilizan un láser ajustable durante la fabricación de películas finas ópticas. Un sistema descrito incluye un láser ajustable capaz de generar radiación electromagnética, uno o más dispositivos de película fina dispuestos para recibir la radiación electromagnética, cada dispositivo de película fina que incluye una o más capas ópticas depositadas en un sustrato correspondiente y configuradas para generar radiación interactuada de forma óptica luego de recibir la radiación electromagnética, y un transductor óptico dispuesto para recibir la radiación interactuada de forma óptica de cada uno del uno o más dispositivos de película fina y configurado para generar señales de salida que corresponden a la radiación interactuada de forma óptica recibida de cada uno del uno o más dispositivos de película fina.
MX2016006096A 2013-12-19 2013-12-19 Uso de láseres ajustables en el diseño, fabricación e implementación de elementos ópticos integrados. MX363221B (es)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/US2013/076448 WO2015094264A1 (en) 2013-12-19 2013-12-19 Using tunable lasers in the design, manufacture, and implementation of integrated optical elements

Publications (2)

Publication Number Publication Date
MX2016006096A MX2016006096A (es) 2016-12-20
MX363221B true MX363221B (es) 2019-03-15

Family

ID=53403364

Family Applications (1)

Application Number Title Priority Date Filing Date
MX2016006096A MX363221B (es) 2013-12-19 2013-12-19 Uso de láseres ajustables en el diseño, fabricación e implementación de elementos ópticos integrados.

Country Status (4)

Country Link
US (1) US10145675B2 (es)
EP (1) EP3055672A1 (es)
MX (1) MX363221B (es)
WO (1) WO2015094264A1 (es)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US10598815B2 (en) * 2016-09-22 2020-03-24 Halliburton Energy Services, Inc. Dual integrated computational element device and method for fabricating the same
CN112989701B (zh) * 2021-03-15 2022-03-18 华中科技大学 一种sgdbr可调谐半导体激光器的波长调谐方法
US12359554B2 (en) * 2021-03-15 2025-07-15 Saudi Arabian Oil Company Real-time multimodal radiometry for subsurface characterization during high-power laser operations

Family Cites Families (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5152296A (en) * 1990-03-01 1992-10-06 Hewlett-Packard Company Dual-finger vital signs monitor
US6373573B1 (en) * 2000-03-13 2002-04-16 Lj Laboratories L.L.C. Apparatus for measuring optical characteristics of a substrate and pigments applied thereto
AU2002230592A1 (en) * 2000-10-27 2002-05-06 Molecular Devices Corporation Light detection device
JP2008514955A (ja) * 2004-09-28 2008-05-08 シンギュレックス・インコーポレイテッド サンプル分析システムおよび方法
WO2006063094A1 (en) 2004-12-09 2006-06-15 Caleb Brett Usa Inc. In situ optical computation fluid analysis system and method
JP2008539417A (ja) * 2005-04-28 2008-11-13 コーニンクレッカ フィリップス エレクトロニクス エヌ ヴィ 分析物の混合物における分析物の量を求める分光法
WO2008041190A2 (en) * 2006-10-05 2008-04-10 Koninklijke Philips Electronics N.V. Methods and systems for detection with front irradiation
US8125641B2 (en) * 2009-03-27 2012-02-28 N&K Technology, Inc. Method and apparatus for phase-compensated sensitivity-enhanced spectroscopy (PCSES)
US9206386B2 (en) 2011-08-05 2015-12-08 Halliburton Energy Services, Inc. Systems and methods for analyzing microbiological substances
US8902423B2 (en) * 2011-11-23 2014-12-02 University Of South Carolina Classification using multivariate optical computing
US9658149B2 (en) 2012-04-26 2017-05-23 Halliburton Energy Services, Inc. Devices having one or more integrated computational elements and methods for determining a characteristic of a sample by computationally combining signals produced therewith
US8575541B1 (en) 2012-12-13 2013-11-05 Halliburton Energy Services, Inc. Systems and methods for real time monitoring and management of wellbore servicing fluids

Also Published As

Publication number Publication date
US10145675B2 (en) 2018-12-04
MX2016006096A (es) 2016-12-20
US20160258741A1 (en) 2016-09-08
WO2015094264A1 (en) 2015-06-25
EP3055672A1 (en) 2016-08-17

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