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Application filed by Mitsubishi Mat CoporationfiledCriticalMitsubishi Mat Coporation
Priority to MYPI90000210ApriorityCriticalpatent/MY108497A/en
Publication of MY108497ApublicationCriticalpatent/MY108497A/en
Length Measuring Devices With Unspecified Measuring Means
(AREA)
Abstract
THERE IS DISCLOSED A METHOD FOR INSPECTING A PHYSICAL FEATURE ON A SURFACE (1A) OF A MANUFACTURED ARTICLE (1). FIRST, A SENSOR (12; 12A, 12B) IS PROVIDED ADJACENT TO THE ARTICLE (1). THEN, THE SURFACE (1A) OF THE ARTICLE (1) IS SENSED BY THE SENSOR WHILE CAUSING ONE OF THE SENSOR (12; 12A, 12B) AND THE ARTICLE (1) TO ROTATE ABOUT AN AXIS PERPENDICULAR TO THE SURFACE (1A) OF THE ARTICLE (1), TO THEREBY OBTAIN A SIGNAL WHICH HAS PEAKS CORRESPONDING TO THE PHYSICAL FEATURE ON THE SURFACE OF THE ARTICLE (1). SUBSEQUENTLY THE SIGNAL IS PROCESSED AND THE PROCESSED SIGNAL IS ANALYZED BASED ON THE NUMBER OF THE PEAKS, TO THEREBY OBTAIN INFORMATION AS TO THE PHYSICAL FEATURE ON THE SURFACE (1A) OF THE ARTICLE (1). AN INSPECTION APPRATUS SUITABLE FOR PRACTICING THE ABOVE-MENTIONED METHOD IS ALSO DISCLOSED. (FIG. 8)
MYPI90000210A1990-02-091990-02-09Method and apparatus for inspecting quality of manufactured articles
MY108497A
(en)