MY121566A - Autohandler and method of measuring devices using the autohandler. - Google Patents

Autohandler and method of measuring devices using the autohandler.

Info

Publication number
MY121566A
MY121566A MYPI95002989A MYPI9502989A MY121566A MY 121566 A MY121566 A MY 121566A MY PI95002989 A MYPI95002989 A MY PI95002989A MY PI9502989 A MYPI9502989 A MY PI9502989A MY 121566 A MY121566 A MY 121566A
Authority
MY
Malaysia
Prior art keywords
externals
autohandler
devices
electrical characteristics
testing
Prior art date
Application number
MYPI95002989A
Inventor
Toshio Goto
Aritomo Kikuchi
Hisao Hayama
Original Assignee
Advantest Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Advantest Corp filed Critical Advantest Corp
Publication of MY121566A publication Critical patent/MY121566A/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/302—Contactless testing
    • G01R31/308—Contactless testing using non-ionising electromagnetic radiation, e.g. optical radiation
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2832—Specific tests of electronic circuits not provided for elsewhere
    • G01R31/2834—Automated test systems [ATE]; using microprocessors or computers

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Electromagnetism (AREA)
  • Toxicology (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)

Abstract

AN AUTOHANDLER CAPABLE OF EFFECTING THE PRECISE EXTERNALS-EXAMINATION OF DEVICES (10) IN ADDITION TO MEASURING OF THE ELECTRICAL CHARACTERISTICS IN SUBSTANTIALLY THE SAME PERIOD OF TIME AS THAT TAKEN BY MEASURING OF THE ELECTRICAL CHARACTERISTICS ALONE AND A METHOD OF MEASURING DEVICES (L 0) BY THE USE OF THE AUTOHANDLER ARE PROVIDED. A COMPACT AND HIGH PRECISION, AUTOMATIC DEVICE EXTERNALS-EXAMINING APPARATUS IS INCORPORATED IN THE AUTOHANDLER. THE APPARATUS INCLUDES A LIGHTING FIXTURE (29) HAVING A PLURALITY OF BRIGHTNESSCONTROLLABLE LIGHT EMITTING ELEMENTS AND A CAMERA (28) SUCH AS A CCD CAMERA FOR CONVERTING PHOTOGRAPHED IMAGES INTO PIXEL DATA TO BE OUTPUT. OUT OF THE DEVICES (10) WHICH HAVE UNDERGONE THE TESTING FOR THEIR ELECTRICAL CHARACTERISTICS, THOSE WHICH HAVE BEEN SORTED INTO A CATEGORY OR CATEGORIES REQUIRING AN EXTERNALS-EXAMINATION ARE MEASURED FOR THEIR EXTERNALS IN THE EXTERNALS-EXAMINING APPARATUS. THE DEVICES (10) ARE SORTED ON THE BASIS OF THE DATA OF THE TEST RESULTS OF THE ELECTRICAL CHARACTERISTIC TESTING AND THE EXTERNALS-EXAMINING, AND THEN CONVEYED TO CORRESPONDING DEVICESTORAGE MEANS. IT IS THUS TO BE APPRECIATED THAT IT IS POSSIBLE TO AUTOMATICALLY AND ACCURATELY EFFECT THE EXTERNALS-EXAMINATION, NOT TO SPEAK OF THE TESTING OF THE ELECTRICAL CHARACTERISTICS IN ONE PASS THROUGH THE SAME SINGLE AUTOHANDLER. ACCORDINGLY, THE TIME TAKEN BY THE EXTERNALS-INSPECTION MAY GREATLY REDUCED, RESULTING IN AN ENHANCEMENT IN THE THROUGHPUT AND A DECREASE IN THE TESTING COST. (FIG. 1)
MYPI95002989A 1994-10-06 1995-10-06 Autohandler and method of measuring devices using the autohandler. MY121566A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP6268230A JPH08105937A (en) 1994-10-06 1994-10-06 Auto-handler for device tester and device measuring method of the device

Publications (1)

Publication Number Publication Date
MY121566A true MY121566A (en) 2006-02-28

Family

ID=17455720

Family Applications (1)

Application Number Title Priority Date Filing Date
MYPI95002989A MY121566A (en) 1994-10-06 1995-10-06 Autohandler and method of measuring devices using the autohandler.

Country Status (6)

Country Link
JP (1) JPH08105937A (en)
KR (1) KR0162001B1 (en)
CN (1) CN1102239C (en)
DE (1) DE19581448C2 (en)
MY (1) MY121566A (en)
WO (1) WO1996011392A1 (en)

Families Citing this family (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
IL133696A (en) * 1999-12-23 2006-04-10 Orbotech Ltd Cam reference inspection of multi-color and contour images
KR100339014B1 (en) * 2000-06-02 2002-06-03 김종현 Memory module vision detector
JP4588913B2 (en) * 2001-04-13 2010-12-01 ヤマハ発動機株式会社 Parts conveyor
JP4566482B2 (en) * 2001-09-07 2010-10-20 ヤマハ発動機株式会社 Parts testing equipment
KR100468867B1 (en) * 2002-05-02 2005-01-29 삼성테크윈 주식회사 Method for inspecting and sorting part
JP4372599B2 (en) * 2004-03-31 2009-11-25 株式会社 東京ウエルズ Sorting and discharging work
KR100934029B1 (en) * 2007-06-18 2009-12-28 (주)테크윙 How to load test handler
JP5128920B2 (en) * 2007-12-03 2013-01-23 芝浦メカトロニクス株式会社 Substrate surface inspection apparatus and substrate surface inspection method
KR101168316B1 (en) * 2009-12-01 2012-07-25 삼성전자주식회사 Apparatus for inspecting light emitting diode
KR102718248B1 (en) * 2021-12-15 2024-10-16 주식회사 오라컴 Automation system for function test and packaging of flexible circuit board and method for function test and packaging of flexible circuit board using the same

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS62174889A (en) * 1986-01-27 1987-07-31 Fujitsu Ltd Illuminating conditions analyzing method and its device
JPH01236640A (en) * 1988-03-17 1989-09-21 Tokyo Electron Ltd Visual appearance inspecting device for semiconductor chip
JP2587998B2 (en) * 1988-06-08 1997-03-05 株式会社日立製作所 Appearance inspection device
JPH05340889A (en) * 1992-06-10 1993-12-24 Nippon Avionics Co Ltd Method and device for displaying monitoring picture of object
JPH06167459A (en) * 1992-11-30 1994-06-14 Hitachi Ltd Inspecting apparatus for semiconductor device, and loading, tray stacking, holding and positioning devices thereof

Also Published As

Publication number Publication date
KR960706633A (en) 1996-12-09
DE19581448T1 (en) 1997-03-27
DE19581448C2 (en) 2002-06-20
JPH08105937A (en) 1996-04-23
CN1138898A (en) 1996-12-25
WO1996011392A1 (en) 1996-04-18
KR0162001B1 (en) 1999-03-30
CN1102239C (en) 2003-02-26

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