MY123047A - Ic-test-board device - Google Patents

Ic-test-board device

Info

Publication number
MY123047A
MY123047A MYPI96001447A MYPI9601447A MY123047A MY 123047 A MY123047 A MY 123047A MY PI96001447 A MYPI96001447 A MY PI96001447A MY PI9601447 A MYPI9601447 A MY PI9601447A MY 123047 A MY123047 A MY 123047A
Authority
MY
Malaysia
Prior art keywords
test board
movable frame
test
blocks
holes
Prior art date
Application number
MYPI96001447A
Inventor
Hiroshi Ota
Original Assignee
Yokogawa Electric Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Yokogawa Electric Corp filed Critical Yokogawa Electric Corp
Publication of MY123047A publication Critical patent/MY123047A/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2886—Features relating to contacting the IC under test, e.g. probe heads; chucks
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/04—Housings; Supporting members; Arrangements of terminals
    • G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)

Abstract

AN IC-TEST-BOARD DEVICE IS MAINLY CONSTRUCTED BY A FIRST TEST BOARD (1), ON WHICH A PLURALITY OF MALE CONNECTORS (11) ARE ARRANGED, AND A SECOND TEST BOARD (2) ON WHICH A PLURALITY OF FEMALE CONNECTORS (21) ARE ARRANGED, WHEREIN EACH FEMALE CONNECTOR HAS AN OPEN/CLOSE LEVER (21A) WHICH IS OPERATED TO OPEN OR CLOSE CONTACTS THEREOF. A MOVABLE FRAME (28) IS PROVIDED BELOW THE SECOND TEST BOARD (2) SO THAT BY MANIPULATING A CLAMP (29), THE MOVABLE FRAME (28) IS MOVED IN PARALLEL WITH THE SECOND TEST BOARD (2). IN ADDITION, BLOCKS ARE ATTACHED TO A LOWER FACE OF THE FIRST TEST BOARD (1) AT ITS BOTH-END SECTIONS WHILST HOLES (23C) ARE CORRESPONDINGLY FORMED THROUGH THE SECOND TEST BOARD (2) AT ITS BOTH-END SECTIONS. THUS, WHEN THE FIRST TEST BOARD (1) IS ASSEMBLED WITH THE SECOND TEST BOARD (2), THE BLOCKS OF THE FIRST TEST BOARD (1) ENGAGE WITH THE HOLES OF THE SECOND TEST BOARD (2). FURTHER, GUIDE HOLES (14A-17A) ARE FORMED THROUGH THE BLOCKS RESPECTIVELY WHILST TAPER PINS (24-27) ARE ATTACHED TO THE MOVABLE FRAME (28). THUS, WHEN THE CLAMP (29) IS MANIPULATED SO AS TO MOVE THE MOVABLE FRAME (28), THE TAPER PINS (24-27) ARE RESPECTIVELY INSERTED INTO THE GUIDE HOLES (14A-17A) OF THE BLOCKS OF THE FIRST TEST BOARD (1) WHICH HAVE BEEN ALREADY INSERTED INTO THE HOLES OF THE SECOND TEST BOARD (2). MOREOVER, THE MOVABLE FRAME (28) HAS A FUNCTION TO OPERATE THE OPEN/CLOSE LEVERS OF THE FEMALE CONNECTORS (21) AT ONCE SO THAT THE FEMALE CONNECTORS (21) ARE PUT IN A CONTACT STATE WITH THE MALE CONNECTORS (11) IF THE CLAMP IS FURTHER MANIPULATED.
MYPI96001447A 1995-04-24 1996-04-16 Ic-test-board device MY123047A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP7123161A JPH08292231A (en) 1995-04-24 1995-04-24 Ic test board apparatus

Publications (1)

Publication Number Publication Date
MY123047A true MY123047A (en) 2006-05-31

Family

ID=14853699

Family Applications (1)

Application Number Title Priority Date Filing Date
MYPI96001447A MY123047A (en) 1995-04-24 1996-04-16 Ic-test-board device

Country Status (6)

Country Link
JP (1) JPH08292231A (en)
KR (1) KR100240892B1 (en)
IE (1) IE75745B1 (en)
MY (1) MY123047A (en)
SG (1) SG55191A1 (en)
TW (1) TW296433B (en)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR101962684B1 (en) * 2017-10-24 2019-03-27 주식회사 수산이앤에스 Board for controller and test apparatus of testing board for controller
KR102407812B1 (en) * 2021-10-15 2022-06-13 (주)티에스에이 Socket removing device of bun-ln board

Also Published As

Publication number Publication date
IE75745B1 (en) 1997-09-24
TW296433B (en) 1997-01-21
KR100240892B1 (en) 2000-01-15
SG55191A1 (en) 1998-12-21
JPH08292231A (en) 1996-11-05
IE960297A1 (en) 1996-10-30
KR960038415A (en) 1996-11-21

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