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Application filed by Sony Emcs Malaysia Sdn BhdfiledCriticalSony Emcs Malaysia Sdn Bhd
Priority to MYPI9703779priorityCriticalpatent/MY130827A/en
Publication of MY130827ApublicationCriticalpatent/MY130827A/en
Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections
(AREA)
Abstract
A TEST PROBE CONNECTING UNIT (10) COMPRISES A BASE PLATE (12), A PAIR OF GUIDING MEMBERS (30, 32) SLIDABLY MOUNTED ON THE BASE PLATE FOR GUIDING AN ELECTRICAL PRODUCT (18) TO BE TESTED INTO A TESTING POSITION, A FIRST ARRAY OF TEST PROBES (80-90) MOUNTED ON A FIRST SUPPORT MEMBER (60) AND A SECOND ARRAY OF TEST PROBES (126-132) MOUNTED ON A SECOND SUPPORT MEMBER (100), WHEREBY THE FIRST AND SECOND SUPPORT MEMBERS (60, 100) ARE SLIDABLY MOUNTED ON THE BASE PLATE (12) AND ARE ADJUSTABLE ALONG THREE PERPENDICULAR AXES SO THAT THE FIRST AND SECOND ARRAYS OF TEST PROBES (80-90, 126, 132) CAN BE SET RESPECTIVELY IN PREDETERMINED POSITIONS PERMITTING SAME TO BE SIMULTANEOUSLY ENGAGEABLE WITH RESPECTIVE FIRST AND SECOND PATTERNS OF TEST POINTS PROVIDED ON THE ELECTRICAL PRODUCT.(FIG. 2)
MYPI97037791997-08-181997-08-18Test probe connecting unit
MY130827A
(en)