MY159053A - Multiple scan single pass line scan apparatus for solar cell inspection and methodology thereof - Google Patents

Multiple scan single pass line scan apparatus for solar cell inspection and methodology thereof

Info

Publication number
MY159053A
MY159053A MYPI2011000436A MYPI2011000436A MY159053A MY 159053 A MY159053 A MY 159053A MY PI2011000436 A MYPI2011000436 A MY PI2011000436A MY PI2011000436 A MYPI2011000436 A MY PI2011000436A MY 159053 A MY159053 A MY 159053A
Authority
MY
Malaysia
Prior art keywords
solar cell
single pass
pass line
methodology
line scan
Prior art date
Application number
MYPI2011000436A
Inventor
Yang Yi Foo
Koon Yin Goon
Soo Yi Koay
Cowei Ooi
Original Assignee
Tt Vision Tech Sdn Bhd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tt Vision Tech Sdn Bhd filed Critical Tt Vision Tech Sdn Bhd
Priority to MYPI2011000436A priority Critical patent/MY159053A/en
Priority to PCT/MY2012/000006 priority patent/WO2012102603A1/en
Publication of MY159053A publication Critical patent/MY159053A/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/55—Specular reflectivity
    • H—ELECTRICITY
    • H02—GENERATION; CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
    • H02S—GENERATION OF ELECTRIC POWER BY CONVERSION OF INFRARED RADIATION, VISIBLE LIGHT OR ULTRAVIOLET LIGHT, e.g. USING PHOTOVOLTAIC [PV] MODULES
    • H02S50/00—Monitoring or testing of PV systems, e.g. load balancing or fault identification
    • H02S50/10—Testing of PV devices, e.g. of PV modules or single PV cells
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
    • Y02E10/00—Energy generation through renewable energy sources
    • Y02E10/50—Photovoltaic [PV] energy

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Photovoltaic Devices (AREA)

Abstract

THE PRESENT INVENTION RELATES GENERALLY TO A MULTIPLE SCAN SINGLE PASS LINE SCAN APPARATUS FOR SOLAR CELL INSPECTION, COMPRISING AT LEAST ONE LINE SCAN IMAGING DEVICE (601), AT LEAST ONE BEAM SPLITTER (603), AT LEAST ONE LIGHT BEAM (605) ILLUMINATED FROM AN ILLUMINATION SOURCE (607) AND A PAIR OF EQUILATERAL TRIANGULAR PRISM (903,904) TO OBTAIN THE VARIOUS DEFECTS INFORMATION OF THE SOLAR CELL.
MYPI2011000436A 2011-01-28 2011-01-28 Multiple scan single pass line scan apparatus for solar cell inspection and methodology thereof MY159053A (en)

Priority Applications (2)

Application Number Priority Date Filing Date Title
MYPI2011000436A MY159053A (en) 2011-01-28 2011-01-28 Multiple scan single pass line scan apparatus for solar cell inspection and methodology thereof
PCT/MY2012/000006 WO2012102603A1 (en) 2011-01-28 2012-01-20 Multiple scan single pass line scan apparatus for solar cell inspection and methodology thereof

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
MYPI2011000436A MY159053A (en) 2011-01-28 2011-01-28 Multiple scan single pass line scan apparatus for solar cell inspection and methodology thereof

Publications (1)

Publication Number Publication Date
MY159053A true MY159053A (en) 2016-12-15

Family

ID=46581022

Family Applications (1)

Application Number Title Priority Date Filing Date
MYPI2011000436A MY159053A (en) 2011-01-28 2011-01-28 Multiple scan single pass line scan apparatus for solar cell inspection and methodology thereof

Country Status (2)

Country Link
MY (1) MY159053A (en)
WO (1) WO2012102603A1 (en)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9494531B2 (en) 2013-08-09 2016-11-15 Kla-Tencor Corporation Multi-spot illumination for improved detection sensitivity
EP3460999B1 (en) 2017-09-25 2019-08-21 Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. Method and assembly for large-surface testing of optical properties of a layer
CN113465546B (en) * 2021-07-02 2022-09-16 长春理工大学 Laser scanning projection system circular back-reflection cooperative target scanning method
CN115656217B (en) * 2022-10-24 2024-09-24 福建带好路智能科技有限公司 Flaw detection method and device for glass panel
CN116074648A (en) * 2023-03-06 2023-05-05 杭州百子尖科技股份有限公司 Color image acquisition method, device, system and medium based on machine vision
CN116972975A (en) * 2023-08-04 2023-10-31 天合光能股份有限公司 Automatic optical detector and solar cell optical detection method
CN119863480B (en) * 2023-10-19 2026-03-10 宁德时代新能源科技股份有限公司 Method and device for detecting battery diaphragm, computing equipment and readable storage medium

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5003166A (en) * 1989-11-07 1991-03-26 Massachusetts Institute Of Technology Multidimensional range mapping with pattern projection and cross correlation
FR2686697B1 (en) * 1992-01-27 1994-04-29 Aerospatiale DEVICE FOR DETECTING DEFECTS IN TWO - LAYERED PARTS, PARTICULARLY IN SOLAR CELLS.
AU2003280602A1 (en) * 2002-10-30 2004-05-25 Toppan Printing Co., Ltd. Wiring pattern inspection device, inspection method, detection device, and detection method
US20100237895A1 (en) * 2009-03-19 2010-09-23 Kyo Young Chung System and method for characterizing solar cell conversion performance and detecting defects in a solar cell

Also Published As

Publication number Publication date
WO2012102603A1 (en) 2012-08-02

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