MY177498A - A testing and taping machine - Google Patents

A testing and taping machine

Info

Publication number
MY177498A
MY177498A MYPI2015700990A MYPI2015700990A MY177498A MY 177498 A MY177498 A MY 177498A MY PI2015700990 A MYPI2015700990 A MY PI2015700990A MY PI2015700990 A MYPI2015700990 A MY PI2015700990A MY 177498 A MY177498 A MY 177498A
Authority
MY
Malaysia
Prior art keywords
indexing table
semiconductor devices
testing
taping
taping machine
Prior art date
Application number
MYPI2015700990A
Inventor
Abdul Razak Bukhari
Original Assignee
Intotest Sdn Bhd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Intotest Sdn Bhd filed Critical Intotest Sdn Bhd
Priority to MYPI2015700990A priority Critical patent/MY177498A/en
Priority to PCT/MY2016/050016 priority patent/WO2016159755A1/en
Publication of MY177498A publication Critical patent/MY177498A/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2886—Features relating to contacting the IC under test, e.g. probe heads; chucks
    • G01R31/2887—Features relating to contacting the IC under test, e.g. probe heads; chucks involving moving the probe head or the IC under test; docking stations
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/04—Housings; Supporting members; Arrangements of terminals
    • G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
    • G01R1/0433—Sockets for IC's or transistors
    • G01R1/0475—Sockets for IC's or transistors for TAB IC's
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/06705—Apparatus for holding or moving single probes

Landscapes

  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)

Abstract

The present invention discloses an apparatus for testing and taping semiconductor devices comprises: a first indexing table (300) for receiving and orientating the semiconductor devices; a second indexing table (500) carrying a tapping device (505,506) for taping the semiconductor devices, the two tables (300, 500) synchronically operatable to transfer the semiconductor devices from the first indexing table (300) to the second indexing table (500); means (100) for feeding the semiconductor devices to the apparatus; characterised in that instead of feeding the semiconductor device to the second indexing table (500), the feed (100) is fed directly to the first indexing table (300).
MYPI2015700990A 2015-03-27 2015-03-27 A testing and taping machine MY177498A (en)

Priority Applications (2)

Application Number Priority Date Filing Date Title
MYPI2015700990A MY177498A (en) 2015-03-27 2015-03-27 A testing and taping machine
PCT/MY2016/050016 WO2016159755A1 (en) 2015-03-27 2016-03-24 A testing and taping machine

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
MYPI2015700990A MY177498A (en) 2015-03-27 2015-03-27 A testing and taping machine

Publications (1)

Publication Number Publication Date
MY177498A true MY177498A (en) 2020-09-16

Family

ID=57006119

Family Applications (1)

Application Number Title Priority Date Filing Date
MYPI2015700990A MY177498A (en) 2015-03-27 2015-03-27 A testing and taping machine

Country Status (2)

Country Link
MY (1) MY177498A (en)
WO (1) WO2016159755A1 (en)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN107499563B (en) * 2017-08-29 2023-03-03 深圳市三一联光智能设备股份有限公司 Multi-station crystal oscillator test, classification, marking and braiding integrated equipment
CN107380927A (en) * 2017-09-05 2017-11-24 东莞市台工电子机械科技有限公司 A kind of disc type inductor product tests printing packing machine

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2001228098A (en) * 2000-02-14 2001-08-24 Sony Corp Inspection and taping equipment
JP2002120809A (en) * 2000-10-13 2002-04-23 Pioneer Electronic Corp Feed error detection mechanism of article feeder
MY129418A (en) * 2001-06-29 2007-03-30 Canon Machinery Inc Composite processing method and composite processsing apparatus for leadless semiconductor devices
JP5500605B2 (en) * 2009-10-20 2014-05-21 上野精機株式会社 Classification transport apparatus, classification transport method, and program

Also Published As

Publication number Publication date
WO2016159755A1 (en) 2016-10-06

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