NL180881C - Diffraktiemeter voor x-straling en koelinrichting daarvoor. - Google Patents

Diffraktiemeter voor x-straling en koelinrichting daarvoor.

Info

Publication number: NL180881C
Authority: NL; Netherlands
Prior art keywords: diffrak; meter; radiation; cooling device; device therefor
Prior art date: 1973-10-24

Application number

NLAANVRAGE7413948,A

Other languages

English (en)

Dutch (nl)

Other versions

NL7413948A (nl

Original Assignee

Nicolet Instrument Corp

Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)

1973-10-24

Filing date

1974-10-24

Publication date

1987-05-04

1974-10-24 Application filed by Nicolet Instrument Corp filed Critical Nicolet Instrument Corp

1975-04-28 Publication of NL7413948A publication Critical patent/NL7413948A/xx

1987-05-04 Application granted granted Critical

1987-05-04 Publication of NL180881C publication Critical patent/NL180881C/xx

Links

Classifications

- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
- G01N23/20008—Constructional details of analysers, e.g. characterised by X-ray source, detector or optical system; Accessories therefor; Preparing specimens therefor
- G01N23/20025—Sample holders or supports therefor
- G01N23/20033—Sample holders or supports therefor provided with temperature control or heating means

Landscapes

Chemical & Material Sciences (AREA)
Crystallography & Structural Chemistry (AREA)
Physics & Mathematics (AREA)
Health & Medical Sciences (AREA)
Life Sciences & Earth Sciences (AREA)
Analytical Chemistry (AREA)
Biochemistry (AREA)
General Health & Medical Sciences (AREA)
General Physics & Mathematics (AREA)
Immunology (AREA)
Pathology (AREA)
Analysing Materials By The Use Of Radiation (AREA)
Details Of Measuring And Other Instruments (AREA)

NLAANVRAGE7413948,A 1973-10-24 1974-10-24 Diffraktiemeter voor x-straling en koelinrichting daarvoor. NL180881C (nl)

Applications Claiming Priority (1)

Application Number	Priority Date	Filing Date	Title
US409098A US3860815A (en)	1973-10-24	1973-10-24	X-ray diffractometer having means for cooling crystal mounted thereon

Publications (2)

Publication Number	Publication Date
NL7413948A NL7413948A (nl)	1975-04-28
NL180881C true NL180881C (nl)	1987-05-04

Family

ID=23619040

Family Applications (1)

Application Number	Title	Priority Date	Filing Date
NLAANVRAGE7413948,A NL180881C (nl)	1973-10-24	1974-10-24	Diffraktiemeter voor x-straling en koelinrichting daarvoor.

Country Status (7)

Country	Link
US (1)	US3860815A (it)
JP (1)	JPS5735421B2 (it)
DE (1)	DE2449399C3 (it)
FR (1)	FR2252570B1 (it)
GB (1)	GB1480477A (it)
IT (1)	IT1024656B (it)
NL (1)	NL180881C (it)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number	Priority date	Publication date	Assignee	Title
US3992624A (en) *	1975-04-29	1976-11-16	The United States Of America As Represented By The Secretary Of The Army	Apparatus and method of X-ray topography at cryogenic temperature
DE8423909U1 (de) *	1984-08-11	1985-01-03	Kernforschungsanlage Jülich GmbH, 5170 Jülich	Eulerwiege fuer tieftemperatur-diffraktometrie
US6404849B1 (en) *	1999-08-11	2002-06-11	Abbott Laboratories	Automated sample handling for X-ray crystallography

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number	Priority date	Publication date	Assignee	Title
US3189741A (en) *	1963-09-06	1965-06-15	Picker X Ray Corp	Goniostat

1973
- 1973-10-24 US US409098A patent/US3860815A/en not_active Expired - Lifetime
1974
- 1974-10-11 GB GB44216/74A patent/GB1480477A/en not_active Expired
- 1974-10-17 DE DE2449399A patent/DE2449399C3/de not_active Expired
- 1974-10-22 FR FR7435493A patent/FR2252570B1/fr not_active Expired
- 1974-10-22 IT IT70137/74A patent/IT1024656B/it active
- 1974-10-23 JP JP12231674A patent/JPS5735421B2/ja not_active Expired
- 1974-10-24 NL NLAANVRAGE7413948,A patent/NL180881C/xx not_active IP Right Cessation

Also Published As

Publication number	Publication date
JPS50113284A (it)	1975-09-05
IT1024656B (it)	1978-07-20
FR2252570A1 (it)	1975-06-20
NL7413948A (nl)	1975-04-28
JPS5735421B2 (it)	1982-07-29
DE2449399A1 (de)	1975-05-07
DE2449399C3 (de)	1979-09-27
US3860815A (en)	1975-01-14
GB1480477A (en)	1977-07-20
DE2449399B2 (de)	1979-02-01
FR2252570B1 (it)	1976-10-22

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Legal Events

Date	Code	Title	Description
1981-11-16	CNR	Transfer of rights (patent application after its laying open for public inspection)	Free format text: NICOLET INSTRUMENT CORPORATION
1981-12-01	BC	A request for examination has been filed
1985-01-01	A85	Still pending on 85-01-01
1992-06-16	V1	Lapsed because of non-payment of the annual fee