NL2000410A1 - Werkwijzen voor het bepalen van de kwaliteit van een lichtbron. - Google Patents

Werkwijzen voor het bepalen van de kwaliteit van een lichtbron.

Info

Publication number
NL2000410A1
NL2000410A1 NL2000410A NL2000410A NL2000410A1 NL 2000410 A1 NL2000410 A1 NL 2000410A1 NL 2000410 A NL2000410 A NL 2000410A NL 2000410 A NL2000410 A NL 2000410A NL 2000410 A1 NL2000410 A1 NL 2000410A1
Authority
NL
Netherlands
Prior art keywords
quality
determining
methods
light source
source
Prior art date
Application number
NL2000410A
Other languages
English (en)
Other versions
NL2000410C2 (nl
Inventor
Nan-Jung Chen
Jui-Chung Peng
Kevin Hung
An-Kuo Yang
Original Assignee
Taiwan Semiconductor Mfg
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Taiwan Semiconductor Mfg filed Critical Taiwan Semiconductor Mfg
Publication of NL2000410A1 publication Critical patent/NL2000410A1/nl
Application granted granted Critical
Publication of NL2000410C2 publication Critical patent/NL2000410C2/nl

Links

Classifications

    • G—PHYSICS
    • G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/70—Microphotolithographic exposure; Apparatus therefor
    • G03F7/70058—Mask illumination systems
    • G03F7/70133—Measurement of illumination distribution, in pupil plane or field plane
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/42—Photometry, e.g. photographic exposure meter using electric radiation detectors
    • G01J1/4257—Photometry, e.g. photographic exposure meter using electric radiation detectors applied to monitoring the characteristics of a beam, e.g. laser beam, headlamp beam
    • G—PHYSICS
    • G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/70—Microphotolithographic exposure; Apparatus therefor
    • G03F7/70058—Mask illumination systems
    • G03F7/70125—Use of illumination settings tailored to particular mask patterns

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
  • Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
NL2000410A 2006-07-20 2006-12-28 Werkwijzen voor het bepalen van de kwaliteit van een lichtbron. NL2000410C2 (nl)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US45891506 2006-07-20
US11/458,915 US7738692B2 (en) 2006-07-20 2006-07-20 Methods of determining quality of a light source

Publications (2)

Publication Number Publication Date
NL2000410A1 true NL2000410A1 (nl) 2008-01-22
NL2000410C2 NL2000410C2 (nl) 2008-05-06

Family

ID=38626284

Family Applications (1)

Application Number Title Priority Date Filing Date
NL2000410A NL2000410C2 (nl) 2006-07-20 2006-12-28 Werkwijzen voor het bepalen van de kwaliteit van een lichtbron.

Country Status (7)

Country Link
US (4) US7738692B2 (nl)
JP (1) JP2008028356A (nl)
KR (1) KR100859186B1 (nl)
CN (1) CN101109906B (nl)
DE (1) DE102007020033B4 (nl)
NL (1) NL2000410C2 (nl)
TW (1) TWI327024B (nl)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7738692B2 (en) * 2006-07-20 2010-06-15 Taiwan Semiconductor Manufacturing Co., Ltd. Methods of determining quality of a light source
DE102008002753B4 (de) * 2007-12-19 2010-03-25 Vistec Semiconductor Systems Gmbh Verfahren zur optischen Inspektion, Detektion und Visualisierung von Defekten auf scheibenförmigen Objekten
DE102012205181B4 (de) 2012-03-30 2015-09-24 Carl Zeiss Smt Gmbh Messvorrichtung zum Vermessen einer Beleuchtungseigenschaft
WO2022202420A1 (ja) * 2021-03-24 2022-09-29 株式会社Ｓｃｒｅｅｎホールディングス 基板処理方法、プラズマ発生装置およびプラズマ発生装置の設計方法

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Also Published As

Publication number Publication date
USRE47197E1 (en) 2019-01-08
TW200808033A (en) 2008-02-01
USRE47272E1 (en) 2019-03-05
US8184896B2 (en) 2012-05-22
DE102007020033A1 (de) 2008-01-31
CN101109906A (zh) 2008-01-23
KR20080008936A (ko) 2008-01-24
TWI327024B (en) 2010-07-01
US20080019586A1 (en) 2008-01-24
US7738692B2 (en) 2010-06-15
CN101109906B (zh) 2010-12-08
NL2000410C2 (nl) 2008-05-06
DE102007020033B4 (de) 2014-03-13
US20100214547A1 (en) 2010-08-26
JP2008028356A (ja) 2008-02-07
KR100859186B1 (ko) 2008-09-18

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AD1A A request for search or an international type search has been filed
RD2N Patents in respect of which a decision has been taken or a report has been made (novelty report)

Effective date: 20080220

PD2B A search report has been drawn up