NL7100882A - - Google Patents
Info
- Publication number
- NL7100882A NL7100882A NL7100882A NL7100882A NL7100882A NL 7100882 A NL7100882 A NL 7100882A NL 7100882 A NL7100882 A NL 7100882A NL 7100882 A NL7100882 A NL 7100882A NL 7100882 A NL7100882 A NL 7100882A
- Authority
- NL
- Netherlands
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/26—Testing of individual semiconductor devices
- G01R31/2607—Circuits therefor
- G01R31/2608—Circuits therefor for testing bipolar transistors
Landscapes
- Engineering & Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US517170A | 1970-01-23 | 1970-01-23 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| NL7100882A true NL7100882A (fr) | 1971-07-27 |
Family
ID=21714522
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| NL7100882A NL7100882A (fr) | 1970-01-23 | 1971-01-22 |
Country Status (4)
| Country | Link |
|---|---|
| US (1) | US3683417A (fr) |
| BE (1) | BE761895A (fr) |
| DE (1) | DE2103181A1 (fr) |
| NL (1) | NL7100882A (fr) |
Families Citing this family (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2901087B2 (ja) * | 1989-10-17 | 1999-06-02 | 株式会社東芝 | 半導体集積回路の電源配線設計方法及び電源配線設計装置 |
| US5410490A (en) * | 1991-09-03 | 1995-04-25 | Hewlett-Packard Company | Electromigration verification method and apparatus |
| US5604687A (en) * | 1994-01-31 | 1997-02-18 | Texas Instruments Incorporated | Thermal analysis system and method of operation |
| SE511322C2 (sv) | 1997-12-01 | 1999-09-13 | Ericsson Telefon Ab L M | Metod och system för förbättring av en transistormodell |
| WO2000039786A1 (fr) * | 1998-12-24 | 2000-07-06 | Korg Incorporated | Procede et appareil de production d'effet sonore et support de stockage d'un programme |
| US7299445B2 (en) | 2004-10-29 | 2007-11-20 | Synopsys, Inc. | Nonlinear receiver model for gate-level delay calculation |
| US7353473B2 (en) * | 2006-05-04 | 2008-04-01 | International Business Machines Corporation | Modeling small mosfets using ensemble devices |
-
1970
- 1970-01-23 US US5171A patent/US3683417A/en not_active Expired - Lifetime
-
1971
- 1971-01-22 BE BE761895A patent/BE761895A/fr unknown
- 1971-01-22 NL NL7100882A patent/NL7100882A/xx unknown
- 1971-01-23 DE DE19712103181 patent/DE2103181A1/de active Pending
Also Published As
| Publication number | Publication date |
|---|---|
| DE2103181A1 (de) | 1971-07-29 |
| BE761895A (fr) | 1971-07-01 |
| US3683417A (en) | 1972-08-08 |