NO20002601L - Metode og utstyr for ikke-destruktiv bestemmelse av restspenninger gjennom optisk holografisk interferometer teknikk - Google Patents

Metode og utstyr for ikke-destruktiv bestemmelse av restspenninger gjennom optisk holografisk interferometer teknikk

Info

Publication number
NO20002601L
NO20002601L NO20002601A NO20002601A NO20002601L NO 20002601 L NO20002601 L NO 20002601L NO 20002601 A NO20002601 A NO 20002601A NO 20002601 A NO20002601 A NO 20002601A NO 20002601 L NO20002601 L NO 20002601L
Authority
NO
Norway
Prior art keywords
equipment
optical holographic
residual stresses
destructive determination
examination
Prior art date
Application number
NO20002601A
Other languages
English (en)
Other versions
NO20002601D0 (no
Inventor
John Petter Fjeldstad
Irina Evgenievna Fjeldstad
Leonid Michailovich Lobanov
Vjacheslav Avtonomovi Pivtorak
Nikolay Georgievich Kuvshinsky
Sergey Gavrilovi Andrushchenko
Vladimir Petrovich Kushniruk
Valeriy Aleksandrovich Pavlov
Vladimir Petrovich Loginov
Peter Dmitrievich Krotenko
Original Assignee
Holo Tech As
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from NO995312A external-priority patent/NO995312D0/no
Application filed by Holo Tech As filed Critical Holo Tech As
Priority to NO20002601A priority Critical patent/NO20002601L/no
Publication of NO20002601D0 publication Critical patent/NO20002601D0/no
Priority to PCT/NO2000/000347 priority patent/WO2001031289A1/en
Priority to JP2001538126A priority patent/JP4623907B2/ja
Priority to AU13120/01A priority patent/AU1312001A/en
Priority to RU2002113768/28A priority patent/RU2002113768A/ru
Priority to CN 00817976 priority patent/CN1270160C/zh
Priority to EP00975012A priority patent/EP1226403A1/en
Publication of NO20002601L publication Critical patent/NO20002601L/no
Priority to NO20021836A priority patent/NO20021836L/no

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01L—MEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER, MECHANICAL EFFICIENCY, OR FLUID PRESSURE
    • G01L5/00—Apparatus for, or methods of, measuring force, work, mechanical power, or torque, specially adapted for specific purposes
    • G01L5/0047—Apparatus for, or methods of, measuring force, work, mechanical power, or torque, specially adapted for specific purposes measuring forces due to residual stresses
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/16—Measuring arrangements characterised by the use of optical techniques for measuring the deformation in a solid, e.g. optical strain gauge
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00—Measuring instruments characterised by the use of optical techniques
    • G01B9/02—Interferometers
    • G01B9/021—Interferometers using holographic techniques
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01L—MEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER, MECHANICAL EFFICIENCY, OR FLUID PRESSURE
    • G01L1/00—Measuring force or stress, in general
    • G01L1/24—Measuring force or stress, in general by measuring variations of optical properties of material when it is stressed, e.g. by photoelastic stress analysis using infrared, visible light, ultraviolet

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Holo Graphy (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)

Abstract

Oppfinnelsen angår en fremgangsmåte og anordning for ikke-destruktiv testing av detaljer, maskinenheter og mekanismer, forskjellige materialer, and særlig en fremgangsmåte og anordning for ikke-destruktiv bestemmelse av egenspenninger som er basert på den optiske holografiske interferometriteknikken. Først registreres et hologram av undersøkelsesområdet av objektet i sin starttilstand. Deretter gjennomføres frigjøringen av egenspenningene i et undersøkelses-punkt i undersøkelsesområdet ved eksponering av overflaten av objektet til en høy-strøm elektrisk puls med rektangulær form. Til slutt lages et interferogram av det nøyaktig samme området av objektet, og egenspenningene ved undersøkelsesområdet bestemmes fra formen og størrelsen av kantene i interferogrammet.
NO20002601A 1999-10-29 2000-05-19 Metode og utstyr for ikke-destruktiv bestemmelse av restspenninger gjennom optisk holografisk interferometer teknikk NO20002601L (no)

Priority Applications (8)

Application Number Priority Date Filing Date Title
NO20002601A NO20002601L (no) 1999-10-29 2000-05-19 Metode og utstyr for ikke-destruktiv bestemmelse av restspenninger gjennom optisk holografisk interferometer teknikk
PCT/NO2000/000347 WO2001031289A1 (en) 1999-10-29 2000-10-19 Method and device for real time non-destructive determination of residual stresses in objects by optical holographic interferometry technique
JP2001538126A JP4623907B2 (ja) 1999-10-29 2000-10-19 光学ホログラム干渉法による、物体中の残留応力のリアルタイム非破壊測定を行うための方法および装置
AU13120/01A AU1312001A (en) 1999-10-29 2000-10-19 Method and device for real time non-destructive determination of residual stresses in objects by optical holographic interferometry technique
RU2002113768/28A RU2002113768A (ru) 1999-10-29 2000-10-19 Способ и устройство для неразрушающего определения в реальном времени остаточных напряжений с использованием технологии оптической голографической интерферометрии
CN 00817976 CN1270160C (zh) 1999-10-29 2000-10-19 用光学全息干涉实时无损测定物体残余应力的方法与设备
EP00975012A EP1226403A1 (en) 1999-10-29 2000-10-19 Method and device for real time non-destructive determination of residual stresses in objects by optical holographic interferometry technique
NO20021836A NO20021836L (no) 1999-10-29 2002-04-18 Holografiske interferometriske målinger

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
NO995312A NO995312D0 (no) 1999-10-29 1999-10-29 FremgangsmÕte og anordning for ikke-destruktiv bestemmelse av restspenninger i objekter ved hjelp av holografisk interferometrisk teknikk
NO20002601A NO20002601L (no) 1999-10-29 2000-05-19 Metode og utstyr for ikke-destruktiv bestemmelse av restspenninger gjennom optisk holografisk interferometer teknikk

Publications (2)

Publication Number Publication Date
NO20002601D0 NO20002601D0 (no) 2000-05-19
NO20002601L true NO20002601L (no) 2001-04-30

Family

ID=26649010

Family Applications (1)

Application Number Title Priority Date Filing Date
NO20002601A NO20002601L (no) 1999-10-29 2000-05-19 Metode og utstyr for ikke-destruktiv bestemmelse av restspenninger gjennom optisk holografisk interferometer teknikk

Country Status (7)

Country Link
EP (1) EP1226403A1 (no)
JP (1) JP4623907B2 (no)
CN (1) CN1270160C (no)
AU (1) AU1312001A (no)
NO (1) NO20002601L (no)
RU (1) RU2002113768A (no)
WO (1) WO2001031289A1 (no)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6765677B1 (en) 2000-10-25 2004-07-20 Holotech A.S. Method and device for non-destructive real-time measurements of residual stresses in planar and non-planar objects

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SE0300666D0 (sv) * 2003-03-10 2003-03-10 Faahraeus Holographic Technolo Stress measurement
JP4328349B2 (ja) 2006-11-29 2009-09-09 株式会社日立製作所 残留応力測定方法及び装置
JP2009014606A (ja) * 2007-07-06 2009-01-22 Hitachi Ltd 残留応力測定装置及び残留応力測定方法
JP4488060B2 (ja) * 2007-11-14 2010-06-23 富士ゼロックス株式会社 成形不能部検出装置、成形不能部検出システム、成形不能部検出プログラムおよび成形不能部検出方法
JP5356894B2 (ja) * 2009-04-06 2013-12-04 ポリプラスチックス株式会社 残留応力算出方法及び残留応力分布導出方法
GB201117343D0 (en) * 2011-10-07 2011-11-23 Airbus Uk Ltd Method and apparatus for measuring residual stresses in a component
CN102865948A (zh) * 2012-09-27 2013-01-09 辽宁忠旺集团有限公司 一种铝合金薄板对接焊焊接残余应力测定方法
RU2523073C1 (ru) * 2013-03-21 2014-07-20 Российская Федерация, от имени которой выступает Министерство промышленности и торговли Российской Федерации (Минпромторг России) Устройство для определения механических напряжений на поверхности металлической конструкции путем введения фиксированного количества теплоты
EP3149767A4 (en) * 2014-05-29 2018-01-24 Brown University Optical system and methods for the determination of stress in a substrate
CN104697467B (zh) * 2015-02-12 2017-05-24 中北大学 基于线激光扫描的焊缝外观形状及表面缺陷检测方法
CN108181032B (zh) * 2017-12-21 2020-11-03 重庆市铜梁区华亿来铝材加工厂 一种残余应力检测方法
US10837761B1 (en) * 2019-04-30 2020-11-17 The Boeing Company Component heating sub-systems and methods for laser shearography testing systems
CN111982374B (zh) * 2020-08-04 2025-04-04 溧阳卓越新材料科技有限公司 一种铝塑膜冲壳残留应力在线检测方法

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US4249423A (en) * 1979-05-11 1981-02-10 General Electric Company Semi-nondestructive residual stress measurement
WO1985003123A1 (en) * 1984-01-05 1985-07-18 Industrial Holographics, Inc. Apparatus for the practice of double exposure interferometric non-destructive testing
SU1758419A1 (ru) 1990-05-30 1992-08-30 Институт Физико-Технических Проблем Севера Со Ан Ссср Способ определени остаточных напр жений
JPH04186106A (ja) * 1990-11-21 1992-07-02 Kowa Co 光学測定方法および装置
JPH04223208A (ja) * 1990-12-25 1992-08-13 Nippon Telegr & Teleph Corp <Ntt> 実時間変形・形状解析方法及び装置
US5432595A (en) * 1993-07-13 1995-07-11 Pechersky; Martin J. Method for measuring residual stresses in materials by plastically deforming the material and interference pattern comparison
WO1995010023A1 (en) * 1993-10-05 1995-04-13 Kabushikigaisya Hutech Non-destructive inspection method for mechanical behaviour of article
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Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6765677B1 (en) 2000-10-25 2004-07-20 Holotech A.S. Method and device for non-destructive real-time measurements of residual stresses in planar and non-planar objects

Also Published As

Publication number Publication date
JP4623907B2 (ja) 2011-02-02
CN1415066A (zh) 2003-04-30
RU2002113768A (ru) 2004-01-27
NO20002601D0 (no) 2000-05-19
AU1312001A (en) 2001-05-08
JP2003514247A (ja) 2003-04-15
WO2001031289A1 (en) 2001-05-03
CN1270160C (zh) 2006-08-16
EP1226403A1 (en) 2002-07-31

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