NO20022416L - Fremgangsmåte og apparat for å korrigere systematisk feil i en bölgelengdemåleinnretning - Google Patents

Fremgangsmåte og apparat for å korrigere systematisk feil i en bölgelengdemåleinnretning

Info

Publication number
NO20022416L
NO20022416L NO20022416A NO20022416A NO20022416L NO 20022416 L NO20022416 L NO 20022416L NO 20022416 A NO20022416 A NO 20022416A NO 20022416 A NO20022416 A NO 20022416A NO 20022416 L NO20022416 L NO 20022416L
Authority
NO
Norway
Prior art keywords
measuring device
systematic error
wavelength measuring
correcting systematic
correcting
Prior art date
Application number
NO20022416A
Other languages
English (en)
Other versions
NO335932B1 (no
NO20022416D0 (no
Inventor
Michael A Davis
David R Fournier
David G Bellemore
Original Assignee
Cidra Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Cidra Corp filed Critical Cidra Corp
Publication of NO20022416D0 publication Critical patent/NO20022416D0/no
Publication of NO20022416L publication Critical patent/NO20022416L/no
Publication of NO335932B1 publication Critical patent/NO335932B1/no

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/28Investigating the spectrum
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00Photometry, e.g. photographic exposure meter
    • G01J1/10Photometry, e.g. photographic exposure meter by comparison with reference light or electric value provisionally void
    • G01J1/16Photometry, e.g. photographic exposure meter by comparison with reference light or electric value provisionally void using electric radiation detectors
    • G01J1/18Photometry, e.g. photographic exposure meter by comparison with reference light or electric value provisionally void using electric radiation detectors using comparison with a reference electric value

Landscapes

  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • General Physics & Mathematics (AREA)
  • Measuring Temperature Or Quantity Of Heat (AREA)
  • Spectrometry And Color Measurement (AREA)
NO20022416A 1999-11-23 2002-05-22 Fremgangsmåte og apparat for å korrigere systematisk feil i en bølgelengdemåleinnretning NO335932B1 (no)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US09/448,003 US6403949B1 (en) 1999-11-23 1999-11-23 Method and apparatus for correcting systematic error in a wavelength measuring device
PCT/US2000/031057 WO2001038837A1 (en) 1999-11-23 2000-11-13 Method and apparatus for correcting systematic error in a wavelength measuring device

Publications (3)

Publication Number Publication Date
NO20022416D0 NO20022416D0 (no) 2002-05-22
NO20022416L true NO20022416L (no) 2002-07-18
NO335932B1 NO335932B1 (no) 2015-03-30

Family

ID=23778633

Family Applications (1)

Application Number Title Priority Date Filing Date
NO20022416A NO335932B1 (no) 1999-11-23 2002-05-22 Fremgangsmåte og apparat for å korrigere systematisk feil i en bølgelengdemåleinnretning

Country Status (7)

Country Link
US (1) US6403949B1 (no)
EP (1) EP1236026B1 (no)
AU (1) AU1599901A (no)
CA (1) CA2391395C (no)
DE (1) DE60025524D1 (no)
NO (1) NO335932B1 (no)
WO (1) WO2001038837A1 (no)

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US6915686B2 (en) 2003-02-11 2005-07-12 Optoplan A.S. Downhole sub for instrumentation
US7159653B2 (en) 2003-02-27 2007-01-09 Weatherford/Lamb, Inc. Spacer sub
US7245382B2 (en) * 2003-10-24 2007-07-17 Optoplan As Downhole optical sensor system with reference
US7145823B2 (en) * 2004-06-30 2006-12-05 Intel Corporation Method and apparatus to implement a temperature control mechanism on a memory device
US7603041B2 (en) * 2005-06-09 2009-10-13 Cubic Corporation Temperature compensated dynamic optical tag modulator system and method
US7413343B2 (en) * 2005-09-16 2008-08-19 Kyocera Wireless Corp. Apparatus for determining a temperature sensing element
TWI262289B (en) * 2005-09-23 2006-09-21 Univ Nat Chiao Tung Optical-fiber raster double-bearing type inclination sensor for sensing stratum displacement
WO2009058890A2 (en) * 2007-10-29 2009-05-07 Cubic Corporation Resonant quantum well modulator driver
JP5215060B2 (ja) * 2008-07-02 2013-06-19 テルモ株式会社 電子体温計及び作動制御方法
US9091151B2 (en) 2009-11-19 2015-07-28 Halliburton Energy Services, Inc. Downhole optical radiometry tool
AU2009356978B2 (en) * 2009-12-23 2013-08-01 Halliburton Energy Services, Inc. Interferometry-based downhole analysis tool
BR112012027653A2 (pt) 2010-06-01 2016-08-16 Halliburton Energy Services Inc método e sistema para medir propriedades de formação
AU2010355321B2 (en) 2010-06-16 2014-02-27 Halliburtion Energy Services, Inc. Downhole sources having enhanced IR emission
TWI445936B (zh) 2011-06-03 2014-07-21 Univ Nat Taiwan Science Tech 支持單點校正之溫度感測系統
US9562844B2 (en) 2014-06-30 2017-02-07 Baker Hughes Incorporated Systems and devices for sensing corrosion and deposition for oil and gas applications
US10209378B2 (en) * 2015-03-26 2019-02-19 Halliburton Energy Services, Inc. Photopeak location systems and methods
TWI577975B (zh) * 2015-06-02 2017-04-11 國立成功大學 光纖感測掃描設備及光纖感測掃描方法
WO2020009701A1 (en) * 2018-07-05 2020-01-09 Halliburton Energy Services, Inc. Intrinsic geological formation carbon to oxygen ratio measurements
US10527784B1 (en) * 2018-11-15 2020-01-07 General Electric Company Systems and methods for providing a stable wavelength reference in an integrated photonic circuit
CN112344973B (zh) * 2020-09-27 2022-07-26 北京遥测技术研究所 一种基于密闭腔金属板控温的光纤光栅标准具及使用方法
US11698308B2 (en) * 2020-10-05 2023-07-11 Openlight Photonics, Inc. Optical temperature measurements in photonic circuits
CN115144094A (zh) * 2022-05-23 2022-10-04 欧梯恩智能科技(苏州)有限公司 光学标准具及其制备方法及在波长解调系统的应用

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Also Published As

Publication number Publication date
NO335932B1 (no) 2015-03-30
WO2001038837A8 (en) 2001-11-29
CA2391395A1 (en) 2001-05-31
EP1236026A1 (en) 2002-09-04
NO20022416D0 (no) 2002-05-22
WO2001038837A1 (en) 2001-05-31
DE60025524D1 (de) 2006-04-06
US6403949B1 (en) 2002-06-11
CA2391395C (en) 2006-08-22
EP1236026B1 (en) 2006-01-11
AU1599901A (en) 2001-06-04

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Legal Events

Date Code Title Description
CHAD Change of the owner's name or address (par. 44 patent law, par. patentforskriften)

Owner name: WEATHERFORD/LAMB INC, US

CREP Change of representative

Representative=s name: HAMSOE PATENTBYRA ANS, POSTBOKS 171, 4301 SANDNES

CHAD Change of the owner's name or address (par. 44 patent law, par. patentforskriften)

Owner name: WEATHERFORD TECHNOLOGY HOLDINGS, US

MK1K Patent expired