NO314520B1 - Innretning og fremgangsmåte for å måle deformasjon til en mekanisk testpröve - Google Patents

Innretning og fremgangsmåte for å måle deformasjon til en mekanisk testpröve Download PDF

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Publication number
NO314520B1
NO314520B1 NO20000272A NO20000272A NO314520B1 NO 314520 B1 NO314520 B1 NO 314520B1 NO 20000272 A NO20000272 A NO 20000272A NO 20000272 A NO20000272 A NO 20000272A NO 314520 B1 NO314520 B1 NO 314520B1
Authority
NO
Norway
Prior art keywords
sample
light beam
devices
stated
interferometer
Prior art date
Application number
NO20000272A
Other languages
English (en)
Norwegian (no)
Other versions
NO20000272D0 (no
NO20000272L (no
Inventor
Maurice Whelan
Alfredo Carlo Lucia
Original Assignee
Euratom
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Euratom filed Critical Euratom
Publication of NO20000272D0 publication Critical patent/NO20000272D0/no
Publication of NO20000272L publication Critical patent/NO20000272L/no
Publication of NO314520B1 publication Critical patent/NO314520B1/no

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N3/00—Investigating strength properties of solid materials by application of mechanical stress
    • G01N3/02—Details
    • G01N3/06—Special adaptations of indicating or recording means
    • G01N3/068—Special adaptations of indicating or recording means with optical indicating or recording means
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/16—Measuring arrangements characterised by the use of optical techniques for measuring the deformation in a solid, e.g. optical strain gauge
    • G01B11/161—Measuring arrangements characterised by the use of optical techniques for measuring the deformation in a solid, e.g. optical strain gauge by interferometric means
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00—Measuring instruments characterised by the use of optical techniques
    • G01B9/02—Interferometers
    • G01B9/02015—Interferometers characterised by the beam path configuration
    • G01B9/02029—Combination with non-interferometric systems, i.e. for measuring the object
    • G01B9/02031—With non-optical systems, e.g. tactile
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00—Measuring instruments characterised by the use of optical techniques
    • G01B9/02—Interferometers
    • G01B9/0209—Low-coherence interferometers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N3/00—Investigating strength properties of solid materials by application of mechanical stress
    • G01N3/28—Investigating ductility, e.g. suitability of sheet metal for deep-drawing or spinning
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2203/00—Investigating strength properties of solid materials by application of mechanical stress
    • G01N2203/003—Generation of the force
    • G01N2203/005—Electromagnetic means
    • G01N2203/0051—Piezoelectric means
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2203/00—Investigating strength properties of solid materials by application of mechanical stress
    • G01N2203/02—Details not specific for a particular testing method
    • G01N2203/026—Specifications of the specimen
    • G01N2203/0262—Shape of the specimen
    • G01N2203/0278—Thin specimens
    • G01N2203/0282—Two dimensional, e.g. tapes, webs, sheets, strips, disks or membranes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2203/00—Investigating strength properties of solid materials by application of mechanical stress
    • G01N2203/02—Details not specific for a particular testing method
    • G01N2203/04—Chucks, fixtures, jaws, holders or anvils
    • G01N2203/0482—Chucks, fixtures, jaws, holders or anvils comprising sensing means
    • G01N2203/0494—Clamping ring, "whole periphery" clamping

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Biochemistry (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Health & Medical Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Strength Of Materials By Application Of Mechanical Stress (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Instruments For Measurement Of Length By Optical Means (AREA)
  • Measurement Of Length, Angles, Or The Like Using Electric Or Magnetic Means (AREA)
NO20000272A 1997-07-21 2000-01-19 Innretning og fremgangsmåte for å måle deformasjon til en mekanisk testpröve NO314520B1 (no)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
EP97830375A EP0893669B1 (de) 1997-07-21 1997-07-21 Verfahren und Vorrichtung zum Messen der Deformation eines mechanischen Prüfstücks
PCT/EP1998/004531 WO1999005472A1 (en) 1997-07-21 1998-07-20 Device and method for measuring deformation of a mechanical test specimen

Publications (3)

Publication Number Publication Date
NO20000272D0 NO20000272D0 (no) 2000-01-19
NO20000272L NO20000272L (no) 2000-03-17
NO314520B1 true NO314520B1 (no) 2003-03-31

Family

ID=8230723

Family Applications (1)

Application Number Title Priority Date Filing Date
NO20000272A NO314520B1 (no) 1997-07-21 2000-01-19 Innretning og fremgangsmåte for å måle deformasjon til en mekanisk testpröve

Country Status (11)

Country Link
US (1) US6279404B1 (de)
EP (1) EP0893669B1 (de)
JP (1) JP2001511511A (de)
AT (1) ATE219239T1 (de)
CA (1) CA2297152A1 (de)
DE (1) DE69713318T2 (de)
DK (1) DK0893669T3 (de)
ES (1) ES2178747T3 (de)
NO (1) NO314520B1 (de)
PT (1) PT893669E (de)
WO (1) WO1999005472A1 (de)

Families Citing this family (18)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB9903638D0 (en) * 1999-02-17 1999-04-07 European Community A measurement method and measurement apparatus
JP3549153B2 (ja) * 2000-09-20 2004-08-04 株式会社共和電業 光ファイバ干渉センサ、光ファイバ干渉センサの信号処理システム、信号処理方法および記録媒体
DE10213910B4 (de) * 2002-03-28 2004-05-06 Wieland-Werke Ag Objektivierung von (Oberflächen-)Prüfverfahren durch Bildverarbeitung
JP3955899B2 (ja) * 2002-09-20 2007-08-08 国立大学法人埼玉大学 電子的スペックル干渉法を用いた変形計測方法および装置
JP3944558B2 (ja) * 2003-11-11 2007-07-11 国立大学法人群馬大学 材料試験方法
US20110032511A1 (en) * 2006-03-17 2011-02-10 William Marsh Rice University System and method to measure nano-scale stress and strain in materials
US7730950B2 (en) * 2007-01-19 2010-06-08 Halliburton Energy Services, Inc. Methods for treating intervals of a subterranean formation having variable permeability
US8042405B2 (en) * 2008-07-23 2011-10-25 University Of Kentucky Research Foundation Method and apparatus for characterizing microscale formability of thin sheet materials
KR101706100B1 (ko) * 2011-12-15 2017-02-15 삼성전자주식회사 성형한계선도 획득용 시험장치
CN104315847A (zh) * 2014-09-19 2015-01-28 国家电网公司 一种用于小冲杆蠕变试验的高温加热炉
CN106918501A (zh) * 2016-11-25 2017-07-04 华东理工大学 多尺寸小冲杆试样夹持装置
US20200249138A1 (en) * 2017-10-16 2020-08-06 Imprintec GmbH Device and Method for Automatic Workpiece Inspection
CN108693026A (zh) * 2017-12-22 2018-10-23 宁波诺丁汉大学 一种基于声发射传感器的小冲杆试验系统及其试验方法
CN108645697A (zh) * 2018-05-14 2018-10-12 西南科技大学 一种用于核结构材料的小样品力学性能测试系统
CN108716892B (zh) * 2018-06-27 2019-11-29 安阳工学院 一种带有光学测量的圆柱滚子变形装置及其测量方法
JP7516422B2 (ja) * 2019-05-15 2024-07-16 コーニング インコーポレイテッド 縁部強度試験方法及び装置
CN110823119B (zh) * 2019-11-26 2024-09-03 深圳大学 基于视觉-激光复合测量的高压实验舱测量系统
CN110987677B (zh) * 2019-12-25 2021-08-10 上海交通大学 提高微形变加载精度的方法及装置

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DD137619A1 (de) * 1978-07-11 1979-09-12 Gerd Jaeger Vorrichtung,insbesondere zur digitalen kraftmessung
US4280764A (en) * 1980-02-21 1981-07-28 The United States Of America As Represented By The Secretary Of The Navy Phase-conjugate interferometer
DE3016879C2 (de) * 1980-05-02 1982-12-30 Krautkrämer, GmbH, 5000 Köln Verfahren und Vorrichtung zur zerstörungsfreien Ultraschall-Werkstoffprüfung
DK155250C (da) * 1985-08-13 1989-07-24 Lars Bager Fremgangsmaade og apparat til maaling af afstandsvariationer
US4690001A (en) * 1985-11-13 1987-09-01 Mts Systems Corporation Optical displacement transducer usable as an extensometer
DE3882043D1 (de) * 1988-08-01 1993-07-29 Schenck Ag Carl Durchstossvorrichtung fuer die pruefung von werkstoffproben oder bauteilen.
DE4036120C2 (de) * 1990-11-13 1994-06-23 Steinbichler Hans Verfahren zur Bestimmung der Wegänderung von Strahlen, insbesondere von Lichtstrahlen, und Vorrichtung zur Durchführung des Verfahrens
CA2074289C (en) * 1992-07-21 1999-09-14 Claude Belleville Fabry-perot optical sensing device for measuring a physical parameter
US6128082A (en) * 1998-09-18 2000-10-03 Board Of Trustees Operating Michigan State University Technique and apparatus for performing electronic speckle pattern interferometry
JP3585034B2 (ja) * 2000-12-14 2004-11-04 日産自動車株式会社 高強度レース及びその製造方法

Also Published As

Publication number Publication date
ATE219239T1 (de) 2002-06-15
PT893669E (pt) 2002-11-29
NO20000272D0 (no) 2000-01-19
JP2001511511A (ja) 2001-08-14
NO20000272L (no) 2000-03-17
ES2178747T3 (es) 2003-01-01
DK0893669T3 (da) 2002-10-07
US6279404B1 (en) 2001-08-28
EP0893669B1 (de) 2002-06-12
WO1999005472A1 (en) 1999-02-04
DE69713318T2 (de) 2003-01-16
CA2297152A1 (en) 1999-02-04
DE69713318D1 (de) 2002-07-18
EP0893669A1 (de) 1999-01-27

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