PE20141402A1 - AN EMISSION SPECTROMETER AND METHOD OF OPERATION - Google Patents

AN EMISSION SPECTROMETER AND METHOD OF OPERATION

Info

Publication number
PE20141402A1
PE20141402A1 PE2013001595A PE2013001595A PE20141402A1 PE 20141402 A1 PE20141402 A1 PE 20141402A1 PE 2013001595 A PE2013001595 A PE 2013001595A PE 2013001595 A PE2013001595 A PE 2013001595A PE 20141402 A1 PE20141402 A1 PE 20141402A1
Authority
PE
Peru
Prior art keywords
radiation
spectral characteristics
sample
detector
spectral
Prior art date
Application number
PE2013001595A
Other languages
Spanish (es)
Inventor
Paolo Moreschini
Joanna Cohen
Gale Paulsen
Geoffrey Alan Carter
Original Assignee
Tech Resources Pty Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Family has litigation
First worldwide family litigation filed litigation Critical https://patents.darts-ip.com/?family=46580110&utm_source=google_patent&utm_medium=platform_link&utm_campaign=public_patent_search&patent=PE20141402(A1) "Global patent litigation dataset” by Darts-ip is licensed under a Creative Commons Attribution 4.0 International License.
Application filed by Tech Resources Pty Ltd filed Critical Tech Resources Pty Ltd
Publication of PE20141402A1 publication Critical patent/PE20141402A1/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/27—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands using photo-electric detection ; circuits for computing concentration
    • G01N21/274—Calibration, base line adjustment, drift correction
    • G01N21/276—Calibration, base line adjustment, drift correction with alternation of sample and standard in optical path
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/71—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light thermally excited
    • G01N21/718—Laser microanalysis, i.e. with formation of sample plasma

Landscapes

  • Physics & Mathematics (AREA)
  • Analytical Chemistry (AREA)
  • General Physics & Mathematics (AREA)
  • Theoretical Computer Science (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Mathematical Physics (AREA)
  • Biochemistry (AREA)
  • Chemical & Material Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Spectrometry And Color Measurement (AREA)
  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)

Abstract

REFERIDO A UN METODO PARA CALIBRAR UN ESPECTROMETRO DE EMISION QUE DISPONE DE UN DETECTOR CAPAZ DE DETECTAR LOS COMPONENTES ESPECTRALES DE LA RADIACION INCIDENTE, Y UN PASO OPTICO DE MEDICION QUE DIRIGE UN HAZ DE ENERGIA A UNA MUESTRA EN DONDE LA RADIACION EMITIDA POR LA MUESTRA AL IRRADIARLA CON EL HAZ DE ENERGIA ES DIRIGIDA AL DETECTOR DE RADIACION. EL METODO COMPRENDE DIRIGIR RADIACION DE CARACTERISTICAS ESPECTRALES CONOCIDAS A LO LARGO DE UN PASO ALTERNATIVO AL DETECTOR. EL DETECTOR DETECTA CARACTERISTICAS ESPECTRALES DE LA RADIACION Y REALIZA UNA COMPARACION CON LAS CARACTERISTICAS ESPECTRALES CONOCIDAS. LOS DATOS DE DESPLAZAMIENTO SE DETERMINAN EN FUNCION DE CUALQUIER VARIACION ENTRE LAS CARACTERISTICAS ESPECTRALES CONOCIDAS Y LAS DETECTADAS. LOS DATOS DE DESPLAZAMIENTO SE ARCHIVAN Y POSTERIORMENTE SE UTILIZAN PARA AJUSTAR LAS CARACTERISTICAS ESPECTRALES DETECTADAS DE UNA MUESTRA EN EL PASO OPTICO DE MEDICION PARA OBTENER UN ANALISIS ESPECTRAL DE LAS SENALES CALIBRADAS PARA EL DESPLAZAMIENTO DE LA MUESTRA. SU APLICACION PERMITE DETECTAR LA COMPOSICION ELEMENTAL DE UNA MUESTRAREFERRED TO A METHOD TO CALIBRATE AN EMISSION SPECTROMETER THAT HAS A DETECTOR CAPABLE OF DETECTING THE SPECTRAL COMPONENTS OF INCIDENT RADIATION, AND AN OPTICAL MEASUREMENT STEP THAT DIRECTS AN ENERGY BEAM TO A SAMPLE WHERE THE RADIATION IS RADIATION IRRADIATING IT WITH THE ENERGY BEAM IS DIRECTED TO THE RADIATION DETECTOR. THE METHOD INCLUDES DIRECTING RADIATION OF KNOWN SPECTRAL CHARACTERISTICS ALONG AN ALTERNATIVE PASSAGE TO THE DETECTOR. THE DETECTOR DETECTS SPECTRAL CHARACTERISTICS OF RADIATION AND MAKES A COMPARISON WITH THE KNOWN SPECTRAL CHARACTERISTICS. THE DISPLACEMENT DATA IS DETERMINED AS A FUNCTION OF ANY VARIATION BETWEEN THE KNOWN AND DETECTED SPECTRAL CHARACTERISTICS. THE DISPLACEMENT DATA IS ARCHIVED AND SUBSEQUENTLY USED TO ADJUST THE SPECTRAL CHARACTERISTICS DETECTED FROM A SAMPLE IN THE OPTICAL MEASUREMENT STEP TO OBTAIN A SPECTRAL ANALYSIS OF THE CALIBRATED SIGNALS FOR THE DISPLACEMENT OF THE SAMPLE. ITS APPLICATION ALLOWS TO DETECT THE ELEMENTARY COMPOSITION OF A SAMPLE

PE2013001595A 2011-01-26 2012-01-11 AN EMISSION SPECTROMETER AND METHOD OF OPERATION PE20141402A1 (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US201161436328P 2011-01-26 2011-01-26

Publications (1)

Publication Number Publication Date
PE20141402A1 true PE20141402A1 (en) 2014-10-29

Family

ID=46580110

Family Applications (1)

Application Number Title Priority Date Filing Date
PE2013001595A PE20141402A1 (en) 2011-01-26 2012-01-11 AN EMISSION SPECTROMETER AND METHOD OF OPERATION

Country Status (7)

Country Link
CN (1) CN103518121A (en)
AU (1) AU2012211024A1 (en)
BR (1) BR112013018523A2 (en)
CA (1) CA2824940A1 (en)
CL (1) CL2013002117A1 (en)
PE (1) PE20141402A1 (en)
WO (1) WO2012100284A1 (en)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2014202618A2 (en) * 2013-06-17 2014-12-24 University Of Neuchâtel Method for determining the configuration of a structure
CN107037012B (en) 2017-04-05 2019-10-25 华中科技大学 Dynamic calibration method of ladder spectrometer for laser-induced breakdown spectrum acquisition
GB2586046B (en) 2019-07-31 2021-12-22 Thermo Fisher Scient Bremen Gmbh Peak determination in two-dimensional optical spectra
CN115839943B (en) * 2023-02-13 2023-07-11 合肥金星智控科技股份有限公司 Laser-induced spectrum system, spectrum calibration method and electronic equipment

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6621574B1 (en) * 2000-05-25 2003-09-16 Inphotonics, Inc. Dual function safety and calibration accessory for raman and other spectroscopic sampling
US7321424B2 (en) * 2004-08-05 2008-01-22 Acton Research Corp. Self-referencing instrument and method thereof for measuring electromagnetic properties
US7502105B2 (en) * 2004-09-15 2009-03-10 General Electric Company Apparatus and method for producing a calibrated Raman spectrum
US7994479B2 (en) * 2006-11-30 2011-08-09 The Science And Technology Facilities Council Infrared spectrometer
TWI379074B (en) * 2007-05-07 2012-12-11 Verity Instr Inc Calibration method of a radiometric optical monitoring system used for fault detection and process monitoring
CN101354287B (en) * 2007-07-24 2010-12-22 杭州远方光电信息有限公司 Spectrometer and method for correcting the same

Also Published As

Publication number Publication date
CL2013002117A1 (en) 2013-12-13
BR112013018523A2 (en) 2017-08-01
AU2012211024A1 (en) 2013-08-01
CA2824940A1 (en) 2012-08-02
WO2012100284A1 (en) 2012-08-02
CN103518121A (en) 2014-01-15

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