PL127953U1 - System przechwytywania obrazów i stanowisko kontroli jakości z systemem przechwytywania obrazów - Google Patents

System przechwytywania obrazów i stanowisko kontroli jakości z systemem przechwytywania obrazów

Info

Publication number
PL127953U1
PL127953U1 PL127953U PL12795317U PL127953U1 PL 127953 U1 PL127953 U1 PL 127953U1 PL 127953 U PL127953 U PL 127953U PL 12795317 U PL12795317 U PL 12795317U PL 127953 U1 PL127953 U1 PL 127953U1
Authority
PL
Poland
Prior art keywords
field
quality control
control station
illuminator
angle
Prior art date
Application number
PL127953U
Other languages
English (en)
Inventor
Matthieu Richard
Francis Pilloud
Original Assignee
Bobst Mex Sa
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Bobst Mex Sa filed Critical Bobst Mex Sa
Publication of PL127953U1 publication Critical patent/PL127953U1/pl

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8806—Specially adapted optical and illumination features
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/002—Measuring arrangements characterised by the use of optical techniques for measuring two or more coordinates
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/8901—Optical details; Scanning details
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8806—Specially adapted optical and illumination features
    • G01N2021/8822—Dark field detection
    • G01N2021/8825—Separate detection of dark field and bright field
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/8914—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the material examined
    • G01N2021/8917—Paper, also ondulated
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/892—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the flaw, defect or object feature examined
    • G01N21/896—Optical defects in or on transparent materials, e.g. distortion, surface flaws in conveyed flat sheet or rod

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Engineering & Computer Science (AREA)
  • Textile Engineering (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)

Abstract

Przedmiotem zgłoszenia jest system przechwytywania obrazów zawierający kamerę liniową (12) przystosowaną do przechwytywania liniowego pola widzenia (20), oświetlacz (14) ciemnego pola i oświetlacz (16) jasnego pola oświetlający pole widzenia (20), w którym elementy są rozmieszczone w taki sposób, że względem płaszczyzny odniesienia (M), która jest prostopadła do powierzchni elementów arkuszowych przechodzących przez pole widzenia (20), gdzie są przechwytywane obrazy, płaszczyzna optyczna kamery liniowej (12) jest ustawiona pod kątem (?) wynoszącym około 10° do 30°, korzystnie 20°, względem płaszczyzny odniesienia (M), płaszczyzna optyczna oświetlacza (14) ciemnego pola jest usytuowana pod kątem (ß) wynoszącym w przybliżeniu 30° do 60°, korzystnie 45°, względem płaszczyzny odniesienia (M), a płaszczyzna optyczna oświetlacza (16) jasnego pola jest usytuowana pod kątem (?) około 20° do 40°, korzystnie 30°, względem płaszczyzny odniesienia (M), oświetlacz (16) jasnego pola ma kąt otwarcia pomiędzy 50° a 110°, korzystnie pomiędzy 80° a 90°. Przedmiotem zgłoszenia jest również stanowisko kontroli jakości z systemem przechwytywania obrazów.
PL127953U 2016-05-30 2017-05-17 System przechwytywania obrazów i stanowisko kontroli jakości z systemem przechwytywania obrazów PL127953U1 (pl)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
DE202016102851.5U DE202016102851U1 (de) 2016-05-30 2016-05-30 Bildaufnahmesystem und Qualitätskontrollstation mit Bildaufnahmesystem
PCT/EP2017/025133 WO2017207114A1 (en) 2016-05-30 2017-05-17 Image capturing system and quality inspection system with image capturing system

Publications (1)

Publication Number Publication Date
PL127953U1 true PL127953U1 (pl) 2019-07-29

Family

ID=56852912

Family Applications (1)

Application Number Title Priority Date Filing Date
PL127953U PL127953U1 (pl) 2016-05-30 2017-05-17 System przechwytywania obrazów i stanowisko kontroli jakości z systemem przechwytywania obrazów

Country Status (9)

Country Link
CN (1) CN209589870U (pl)
AT (1) AT16584U1 (pl)
CZ (1) CZ32481U1 (pl)
DE (1) DE202016102851U1 (pl)
ES (1) ES1224499Y (pl)
PL (1) PL127953U1 (pl)
SK (1) SK9053Y1 (pl)
TR (1) TR201817920U4 (pl)
WO (1) WO2017207114A1 (pl)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102022113313A1 (de) 2022-05-25 2023-11-30 Mb Automation Gmbh & Co. Kg Vorrichtung und verfahren zum sensorbasierten inspizieren eines objekts
WO2025261964A1 (de) 2024-06-17 2025-12-26 Koenig & Bauer Ag Vorrichtung zur inspektion einer oberfläche eines eine beschichtung auf einem trägersubstrat aufweisenden produktes, inspektionssystem mit einer solchen vorrichtung sowie maschine
DE102024116944A1 (de) * 2024-06-17 2025-12-18 Koenig & Bauer Ag Vorrichtung zur Inspektion einer Oberfläche eines eine Beschichtung auf einem Trägersubstrat aufweisenden Produktes, Inspektionssystem mit einer solchen Vorrichtung sowie Maschine
DE102024116942B4 (de) * 2024-06-17 2026-06-18 Koenig & Bauer Ag Vorrichtung zur automatischen optischen Inspektion eines entlang einer Transportstrecke bewegten bahnförmigen oder bogenförmigen mindestens eine Beschichtung aufweisenden Produktes
DE102024116943A1 (de) * 2024-06-17 2025-12-18 Koenig & Bauer Ag Vorrichtung zur Inspektion einer Oberfläche eines eine Beschichtung auf einem Trägersubstrat aufweisenden Produktes, Inspektionssystem mit einer solchen Vorrichtung sowie Maschine
CN118670274B (zh) * 2024-08-22 2024-10-25 山东泓邦工具有限公司 一种五金工具生产尺寸检测装置

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6327374B1 (en) * 1999-02-18 2001-12-04 Thermo Radiometrie Oy Arrangement and method for inspection of surface quality
JP3686329B2 (ja) * 2000-08-22 2005-08-24 シーシーエス株式会社 表面検査用照明装置及び表面検査装置
US20050122509A1 (en) * 2002-07-18 2005-06-09 Leica Microsystems Semiconductor Gmbh Apparatus for wafer inspection
DE102004004761A1 (de) * 2004-01-30 2005-09-08 Leica Microsystems Semiconductor Gmbh Vorrichtung und Verfahren zur Inspektion eines Wafers
DE102007007828B4 (de) * 2007-02-16 2011-02-24 Bst International Gmbh Verfahren und Vorrichtung zum Beleuchten eines Druckbildes auf einer Materialbahn
JP5806808B2 (ja) * 2010-08-18 2015-11-10 倉敷紡績株式会社 撮像光学検査装置
DE102011113670A1 (de) * 2011-09-20 2013-03-21 Schott Ag Beleuchtungsvorrichtung, Inspektionsvorrichtung und Inspektionsverfahren für die optische Prüfung eines Objekts

Also Published As

Publication number Publication date
TR201817920U4 (tr) 2021-05-21
SK501342018U1 (sk) 2020-11-03
SK9053Y1 (sk) 2021-02-24
WO2017207114A1 (en) 2017-12-07
ES1224499Y (es) 2019-04-26
DE202016102851U1 (de) 2016-08-11
ES1224499U (es) 2019-02-06
CZ32481U1 (cs) 2019-01-22
AT16584U1 (de) 2020-02-15
CN209589870U (zh) 2019-11-05

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