PL1580295T3 - Urządzenie do rozpylania reaktywnego - Google Patents
Urządzenie do rozpylania reaktywnegoInfo
- Publication number
- PL1580295T3 PL1580295T3 PL04017807T PL04017807T PL1580295T3 PL 1580295 T3 PL1580295 T3 PL 1580295T3 PL 04017807 T PL04017807 T PL 04017807T PL 04017807 T PL04017807 T PL 04017807T PL 1580295 T3 PL1580295 T3 PL 1580295T3
- Authority
- PL
- Poland
- Prior art keywords
- reactive sputtering
- sputtering
- control
- keeping
- independent
- Prior art date
Links
- 238000005546 reactive sputtering Methods 0.000 title abstract 3
- 239000007789 gas Substances 0.000 abstract 2
- 238000000034 method Methods 0.000 abstract 1
- 238000004544 sputter deposition Methods 0.000 abstract 1
Classifications
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/0021—Reactive sputtering or evaporation
- C23C14/0036—Reactive sputtering
- C23C14/0042—Controlling partial pressure or flow rate of reactive or inert gases with feedback of measurements
Landscapes
- Chemical & Material Sciences (AREA)
- Physics & Mathematics (AREA)
- Fluid Mechanics (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Engineering & Computer Science (AREA)
- Materials Engineering (AREA)
- Mechanical Engineering (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- Physical Vapour Deposition (AREA)
- Glass Compositions (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| DE102004014855A DE102004014855A1 (de) | 2004-03-26 | 2004-03-26 | Einrichtung zum reaktiven Sputtern |
| EP04017807A EP1580295B1 (de) | 2004-03-26 | 2004-07-28 | Einrichtung zum reaktiven Sputtern |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| PL1580295T3 true PL1580295T3 (pl) | 2008-10-31 |
Family
ID=33016575
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| PL04017807T PL1580295T3 (pl) | 2004-03-26 | 2004-07-28 | Urządzenie do rozpylania reaktywnego |
Country Status (8)
| Country | Link |
|---|---|
| US (1) | US20050211550A1 (pl) |
| EP (1) | EP1580295B1 (pl) |
| JP (1) | JP2005281851A (pl) |
| CN (1) | CN100457962C (pl) |
| AT (1) | ATE397678T1 (pl) |
| DE (2) | DE102004014855A1 (pl) |
| PL (1) | PL1580295T3 (pl) |
| TW (1) | TWI283711B (pl) |
Families Citing this family (11)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20020177135A1 (en) | 1999-07-27 | 2002-11-28 | Doung Hau H. | Devices and methods for biochip multiplexing |
| CN102224561B (zh) | 2008-11-24 | 2014-12-31 | 欧瑞康先进科技股份有限公司 | 射频溅射配置 |
| CN101497990B (zh) * | 2009-03-10 | 2011-07-20 | 中国南玻集团股份有限公司 | 溅射镀膜装置 |
| DK2509100T3 (da) * | 2011-04-06 | 2019-11-04 | Viavi Solutions Inc | Integreret anode og aktiveret reaktiv gaskilde til anvendelse i en magnetron-sputtering-enhed |
| DE102014103732A1 (de) * | 2014-01-09 | 2015-07-09 | Von Ardenne Gmbh | Sputteranordnung und Verfahren zum geregelten reaktiven Sputtern |
| DE102014103735A1 (de) * | 2014-01-09 | 2015-07-23 | Von Ardenne Gmbh | Sputteranordnung und Verfahren zum geregelten reaktiven Sputtern |
| DE102014103746A1 (de) * | 2014-01-09 | 2015-07-09 | Von Ardenne Gmbh | Sputteranordnung und Verfahren zum geregelten reaktiven Sputtern |
| JP6775972B2 (ja) * | 2016-03-17 | 2020-10-28 | 芝浦メカトロニクス株式会社 | 成膜装置及び成膜方法 |
| JP6734711B2 (ja) * | 2016-06-29 | 2020-08-05 | 株式会社アルバック | 成膜方法 |
| CN109628907B (zh) * | 2019-01-16 | 2024-01-30 | 佛山市佛欣真空技术有限公司 | 一种用于真空镀膜机的多抽气口布局 |
| TWI799766B (zh) * | 2020-12-16 | 2023-04-21 | 進化光學有限公司 | 使用濺鍍技術製作半導體薄膜之方法 |
Family Cites Families (12)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4201645A (en) * | 1978-06-26 | 1980-05-06 | Robert J. Ferran | Closed-loop sputtering system and method of operating same |
| DE3609503A1 (de) * | 1985-03-22 | 1986-10-02 | Canon K.K., Tokio/Tokyo | Heizwiderstandselement und heizwiderstand unter verwendung desselben |
| JPH01268859A (ja) * | 1988-04-20 | 1989-10-26 | Casio Comput Co Ltd | 透明導電膜の形成方法および形成装置 |
| JPH01312851A (ja) * | 1988-06-10 | 1989-12-18 | Fujitsu Ltd | 半導体装置の製造方法 |
| US4849081A (en) * | 1988-06-22 | 1989-07-18 | The Boc Group, Inc. | Formation of oxide films by reactive sputtering |
| DE4106770C2 (de) * | 1991-03-04 | 1996-10-17 | Leybold Ag | Verrichtung zum reaktiven Beschichten eines Substrats |
| DE4109018C2 (de) * | 1991-03-20 | 2002-02-28 | Unaxis Deutschland Holding | Vorrichtung zum Beschichten eines Substrats |
| DE59207306D1 (de) * | 1991-04-12 | 1996-11-14 | Balzers Hochvakuum | Verfahren und Anlage zur Beschichtung mindestens eines Gegenstandes |
| DE4311360C2 (de) * | 1993-04-06 | 2002-10-24 | Applied Films Gmbh & Co Kg | Anordnung zum reaktiven Abscheiden von Werkstoffen als Dünnfilm durch Mittelfrequenz-Kathodenzerstäubung |
| US5703436A (en) * | 1994-12-13 | 1997-12-30 | The Trustees Of Princeton University | Transparent contacts for organic devices |
| DE19610012B4 (de) * | 1996-03-14 | 2005-02-10 | Unaxis Deutschland Holding Gmbh | Verfahren zur Stabilisierung eines Arbeitspunkts beim reaktiven Zerstäuben in einer Sauerstoff enthaltenden Atmosphäre |
| KR20010005515A (ko) * | 1997-03-21 | 2001-01-15 | 어플라이드 필름즈 코포레이션 | 산화 마그네슘 스퍼터링 장치 |
-
2004
- 2004-03-26 DE DE102004014855A patent/DE102004014855A1/de not_active Withdrawn
- 2004-07-28 AT AT04017807T patent/ATE397678T1/de not_active IP Right Cessation
- 2004-07-28 EP EP04017807A patent/EP1580295B1/de not_active Expired - Lifetime
- 2004-07-28 DE DE502004007316T patent/DE502004007316D1/de not_active Expired - Lifetime
- 2004-07-28 PL PL04017807T patent/PL1580295T3/pl unknown
- 2004-08-12 US US10/918,749 patent/US20050211550A1/en not_active Abandoned
- 2004-08-31 TW TW093126125A patent/TWI283711B/zh not_active IP Right Cessation
- 2004-09-01 JP JP2004253970A patent/JP2005281851A/ja not_active Ceased
- 2004-09-01 CN CNB2004100749702A patent/CN100457962C/zh not_active Expired - Fee Related
Also Published As
| Publication number | Publication date |
|---|---|
| CN1673409A (zh) | 2005-09-28 |
| TWI283711B (en) | 2007-07-11 |
| EP1580295B1 (de) | 2008-06-04 |
| DE102004014855A1 (de) | 2004-10-21 |
| US20050211550A1 (en) | 2005-09-29 |
| ATE397678T1 (de) | 2008-06-15 |
| CN100457962C (zh) | 2009-02-04 |
| EP1580295A1 (de) | 2005-09-28 |
| JP2005281851A (ja) | 2005-10-13 |
| DE502004007316D1 (de) | 2008-07-17 |
| TW200532040A (en) | 2005-10-01 |
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