PL2122375T3 - Urządzenie testujące do testowania próbek do badań w warunkach temperatury - Google Patents

Urządzenie testujące do testowania próbek do badań w warunkach temperatury

Info

Publication number
PL2122375T3
PL2122375T3 PL08707065T PL08707065T PL2122375T3 PL 2122375 T3 PL2122375 T3 PL 2122375T3 PL 08707065 T PL08707065 T PL 08707065T PL 08707065 T PL08707065 T PL 08707065T PL 2122375 T3 PL2122375 T3 PL 2122375T3
Authority
PL
Poland
Prior art keywords
testing
thermal conditions
under thermal
samples under
test device
Prior art date
Application number
PL08707065T
Other languages
English (en)
Inventor
Horst-Dieter Linnerbauer
Original Assignee
Draexlmaier Lisa Gmbh
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Draexlmaier Lisa Gmbh filed Critical Draexlmaier Lisa Gmbh
Publication of PL2122375T3 publication Critical patent/PL2122375T3/pl

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
    • G01R31/281—Specific types of tests or tests for a specific type of fault, e.g. thermal mapping, shorts testing
    • G01R31/2817—Environmental-, stress-, or burn-in tests
    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05D—SYSTEMS FOR CONTROLLING OR REGULATING NON-ELECTRIC VARIABLES
    • G05D23/00—Control of temperature
    • G05D23/19—Control of temperature characterised by the use of electric means
    • G05D23/1927—Control of temperature characterised by the use of electric means using a plurality of sensors
    • G05D23/193—Control of temperature characterised by the use of electric means using a plurality of sensors sensing the temperaure in different places in thermal relationship with one or more spaces
    • G05D23/1932—Control of temperature characterised by the use of electric means using a plurality of sensors sensing the temperaure in different places in thermal relationship with one or more spaces to control the temperature of a plurality of spaces
    • G05D23/1934—Control of temperature characterised by the use of electric means using a plurality of sensors sensing the temperaure in different places in thermal relationship with one or more spaces to control the temperature of a plurality of spaces each space being provided with one sensor acting on one or more control means

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Remote Sensing (AREA)
  • Automation & Control Theory (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Testing Resistance To Weather, Investigating Materials By Mechanical Methods (AREA)
  • Investigating Or Analyzing Materials Using Thermal Means (AREA)
PL08707065T 2007-02-15 2008-01-16 Urządzenie testujące do testowania próbek do badań w warunkach temperatury PL2122375T3 (pl)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
DE102007007529A DE102007007529A1 (de) 2007-02-15 2007-02-15 Testvorrichtung zum Testen von Prüflingen unter Temperatur
PCT/EP2008/000296 WO2008098654A1 (de) 2007-02-15 2008-01-16 Testvorrichtung zum testen von prüflingen unter temperatur
EP08707065A EP2122375B1 (de) 2007-02-15 2008-01-16 Testvorrichtung zum testen von prüflingen unter temperatur

Publications (1)

Publication Number Publication Date
PL2122375T3 true PL2122375T3 (pl) 2012-03-30

Family

ID=38266186

Family Applications (1)

Application Number Title Priority Date Filing Date
PL08707065T PL2122375T3 (pl) 2007-02-15 2008-01-16 Urządzenie testujące do testowania próbek do badań w warunkach temperatury

Country Status (7)

Country Link
EP (1) EP2122375B1 (pl)
AT (1) ATE508372T1 (pl)
DE (2) DE102007007529A1 (pl)
PL (1) PL2122375T3 (pl)
PT (1) PT2122375E (pl)
SI (1) SI2122375T1 (pl)
WO (1) WO2008098654A1 (pl)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102012008999B3 (de) 2012-05-04 2013-10-10 HKR Seuffer Automotive GmbH & Co. KG Verfahren zur Steuerung einer Leistungszufuhr und Vorrichtung
EP3783375A1 (de) 2019-08-19 2021-02-24 Dyconex AG Heiss-e-test für unbestückte leiterplatten

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE4031793A1 (de) * 1990-10-08 1992-04-16 Allen Bradley Gmbh Verfahren und vorrichtung zum voraltern von halbleiterbaugruppen (bestueckten leiterplatten), insbesondere speicherprogrammierbaren steuerungskomponenten
JP3412114B2 (ja) * 1995-07-26 2003-06-03 株式会社アドバンテスト Ｉｃ試験装置

Also Published As

Publication number Publication date
EP2122375B1 (de) 2011-05-04
SI2122375T1 (sl) 2011-09-30
WO2008098654A1 (de) 2008-08-21
DE502008003424D1 (de) 2011-06-16
ATE508372T1 (de) 2011-05-15
EP2122375A1 (de) 2009-11-25
DE102007007529A1 (de) 2007-08-16
PT2122375E (pt) 2011-07-29

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