PL2327281T3 - Systemy i sposoby wykorzystywania źródła promieniowania rentgenowskiego o modulowanym natężeniu - Google Patents

Systemy i sposoby wykorzystywania źródła promieniowania rentgenowskiego o modulowanym natężeniu

Info

Publication number
PL2327281T3
PL2327281T3 PL09807013T PL09807013T PL2327281T3 PL 2327281 T3 PL2327281 T3 PL 2327281T3 PL 09807013 T PL09807013 T PL 09807013T PL 09807013 T PL09807013 T PL 09807013T PL 2327281 T3 PL2327281 T3 PL 2327281T3
Authority
PL
Poland
Prior art keywords
systems
methods
ray source
modulated intensity
modulated
Prior art date
Application number
PL09807013T
Other languages
English (en)
Inventor
Willem G.J. Langeveld
William A. Johnson
Roger D. Owen
George Schonberg Russell
Original Assignee
Rapiscan Laboratories, Inc.
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Rapiscan Laboratories, Inc. filed Critical Rapiscan Laboratories, Inc.
Publication of PL2327281T3 publication Critical patent/PL2327281T3/pl

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01VGEOPHYSICS; GRAVITATIONAL MEASUREMENTS; DETECTING MASSES OR OBJECTS; TAGS
    • G01V5/00Prospecting or detecting by the use of ionising radiation, e.g. of natural or induced radioactivity
    • G01V5/20Detecting prohibited goods, e.g. weapons, explosives, hazardous substances, contraband or smuggled objects
    • G01V5/22Active interrogation, i.e. by irradiating objects or goods using external radiation sources, e.g. using gamma rays or cosmic rays
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/04Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01VGEOPHYSICS; GRAVITATIONAL MEASUREMENTS; DETECTING MASSES OR OBJECTS; TAGS
    • G01V5/00Prospecting or detecting by the use of ionising radiation, e.g. of natural or induced radioactivity
    • G01V5/20Detecting prohibited goods, e.g. weapons, explosives, hazardous substances, contraband or smuggled objects
    • G01V5/281Detecting prohibited goods, e.g. weapons, explosives, hazardous substances, contraband or smuggled objects detecting special nuclear material [SNM], e.g. Uranium-235, Uranium-233 or Plutonium-239
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00Investigating materials by wave or particle radiation
    • G01N2223/03Investigating materials by wave or particle radiation by transmission
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00Investigating materials by wave or particle radiation
    • G01N2223/10Different kinds of radiation or particles
    • G01N2223/101Different kinds of radiation or particles electromagnetic radiation
    • G01N2223/1016X-ray
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00Investigating materials by wave or particle radiation
    • G01N2223/20Sources of radiation
    • G01N2223/201Sources of radiation betatron
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00Investigating materials by wave or particle radiation
    • G01N2223/50Detectors
    • G01N2223/501Detectors array
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00Investigating materials by wave or particle radiation
    • G01N2223/60Specific applications or type of materials
    • G01N2223/626Specific applications or type of materials radioactive material

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Geophysics (AREA)
  • General Life Sciences & Earth Sciences (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Analytical Chemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Biochemistry (AREA)
  • Chemical & Material Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • X-Ray Techniques (AREA)
  • Apparatus For Radiation Diagnosis (AREA)
PL09807013T 2008-08-11 2009-06-12 Systemy i sposoby wykorzystywania źródła promieniowania rentgenowskiego o modulowanym natężeniu PL2327281T3 (pl)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US8781008P 2008-08-11 2008-08-11
EP09807013.9A EP2327281B1 (en) 2008-08-11 2009-06-12 Systems and methods for using an intensity-modulated x-ray source
PCT/US2009/047292 WO2010019311A2 (en) 2008-08-11 2009-06-12 Systems and methods for using an intensity-modulated x-ray source

Publications (1)

Publication Number Publication Date
PL2327281T3 true PL2327281T3 (pl) 2018-10-31

Family

ID=41652970

Family Applications (2)

Application Number Title Priority Date Filing Date
PL09807013T PL2327281T3 (pl) 2008-08-11 2009-06-12 Systemy i sposoby wykorzystywania źródła promieniowania rentgenowskiego o modulowanym natężeniu
PL17194449T PL3287773T3 (pl) 2008-08-11 2009-06-12 Systemy i sposoby wykorzystywania źródła promieniowania rentgenowskiego o modulowanym natężeniu

Family Applications After (1)

Application Number Title Priority Date Filing Date
PL17194449T PL3287773T3 (pl) 2008-08-11 2009-06-12 Systemy i sposoby wykorzystywania źródła promieniowania rentgenowskiego o modulowanym natężeniu

Country Status (7)

Country Link
US (3) US8054937B2 (pl)
EP (2) EP3287773B1 (pl)
JP (1) JP6000549B2 (pl)
CN (2) CN102440078A (pl)
HK (2) HK1251298A1 (pl)
PL (2) PL2327281T3 (pl)
WO (1) WO2010019311A2 (pl)

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Also Published As

Publication number Publication date
US20100034355A1 (en) 2010-02-11
US20120257719A1 (en) 2012-10-11
US20130329855A1 (en) 2013-12-12
CN102440078A (zh) 2012-05-02
US8054937B2 (en) 2011-11-08
JP2012510043A (ja) 2012-04-26
PL3287773T3 (pl) 2021-10-25
CN107782751A (zh) 2018-03-09
CN107782751B (zh) 2021-10-26
EP2327281A4 (en) 2015-03-18
EP2327281B1 (en) 2017-11-29
HK1251656A1 (zh) 2019-02-01
US8781067B2 (en) 2014-07-15
US8437448B2 (en) 2013-05-07
HK1251298A1 (en) 2019-01-25
WO2010019311A2 (en) 2010-02-18
EP3287773B1 (en) 2021-03-03
WO2010019311A3 (en) 2012-05-24
EP3287773A1 (en) 2018-02-28
EP2327281A2 (en) 2011-06-01
JP6000549B2 (ja) 2016-09-28

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