PL2479556T3 - Urządzenie i sposób wykrywania obcego materiału w akumulatorach typu woreczkowego - Google Patents

Urządzenie i sposób wykrywania obcego materiału w akumulatorach typu woreczkowego

Info

Publication number
PL2479556T3
PL2479556T3 PL10815662T PL10815662T PL2479556T3 PL 2479556 T3 PL2479556 T3 PL 2479556T3 PL 10815662 T PL10815662 T PL 10815662T PL 10815662 T PL10815662 T PL 10815662T PL 2479556 T3 PL2479556 T3 PL 2479556T3
Authority
PL
Poland
Prior art keywords
foreign material
type battery
pouch type
detecting foreign
detecting
Prior art date
Application number
PL10815662T
Other languages
English (en)
Inventor
Eun Ju Lee
Seung Yeob Park
Ho Sub Jung
Jin-Young Park
Young Joon Shin
Original Assignee
Lg Chem, Ltd.
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Lg Chem, Ltd. filed Critical Lg Chem, Ltd.
Publication of PL2479556T3 publication Critical patent/PL2479556T3/pl

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/94Investigating contamination, e.g. dust
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02PCLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION OR PROCESSING OF GOODS
    • Y02P70/00Climate change mitigation technologies in the production process for final industrial or consumer products
    • Y02P70/50Manufacturing or production processes characterised by the final manufactured product

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Secondary Cells (AREA)
PL10815662T 2009-09-14 2010-09-14 Urządzenie i sposób wykrywania obcego materiału w akumulatorach typu woreczkowego PL2479556T3 (pl)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
KR1020090086679A KR20110029011A (ko) 2009-09-14 2009-09-14 파우치형 전지 내의 이물질 검출장치
EP10815662.1A EP2479556B1 (en) 2009-09-14 2010-09-14 Apparatus and method for detecting foreign material in pouch type battery
PCT/KR2010/006256 WO2011031117A2 (ko) 2009-09-14 2010-09-14 파우치형 전지 내의 이물질 검출장치 및 방법

Publications (1)

Publication Number Publication Date
PL2479556T3 true PL2479556T3 (pl) 2021-12-27

Family

ID=43732985

Family Applications (1)

Application Number Title Priority Date Filing Date
PL10815662T PL2479556T3 (pl) 2009-09-14 2010-09-14 Urządzenie i sposób wykrywania obcego materiału w akumulatorach typu woreczkowego

Country Status (6)

Country Link
US (1) US8441647B2 (pl)
EP (1) EP2479556B1 (pl)
JP (1) JP5768298B2 (pl)
KR (1) KR20110029011A (pl)
PL (1) PL2479556T3 (pl)
WO (1) WO2011031117A2 (pl)

Families Citing this family (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2015065178A (ja) * 2014-12-02 2015-04-09 日本電気株式会社 フィルム外装電池の製造方法
TWI705244B (zh) * 2018-07-31 2020-09-21 由田新技股份有限公司 半導體瑕疵檢測設備
KR102889054B1 (ko) 2020-07-31 2025-11-20 주식회사 엘지에너지솔루션 이물 검출 장치 및 검출 방법
KR20220135696A (ko) 2021-03-31 2022-10-07 에스케이온 주식회사 배터리셀 검사 장치 및 이를 포함하는 배터리셀 검사 시스템
DE102022116388A1 (de) * 2022-06-30 2024-01-04 Bayerische Motoren Werke Aktiengesellschaft Verfahren zum Überprüfen von Energiespeichereinheiten auf Fremdkörper
US12163438B2 (en) * 2022-08-11 2024-12-10 Rtx Corporation Detection of gas turbine engine blade abnormalities based on light reflections
KR20240159324A (ko) * 2023-04-28 2024-11-05 에스케이온 주식회사 파우치형 이차전지의 폴딩부 검사 방법 및 검사 장치
KR20250144593A (ko) 2024-03-27 2025-10-13 주식회사 엘지에너지솔루션 전극 표면 분석 방법 및 전극 표면 분석 시스템
KR20250170337A (ko) 2024-05-28 2025-12-05 주식회사 엘지에너지솔루션 전극 표면 분석 방법 및 전극 표면 분석 시스템

Family Cites Families (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS63218847A (ja) * 1987-03-09 1988-09-12 Nok Corp 表面欠陥検査方法
JPS6469023A (en) * 1987-09-10 1989-03-15 Fujitsu Ltd Inspection device for surface of wafer
JP2997034B2 (ja) * 1990-11-27 2000-01-11 日立電子エンジニアリング株式会社 カラーフィルタの埋没異物検出方法および異物検査装置
JP2560599B2 (ja) * 1992-12-28 1996-12-04 東洋製罐株式会社 積層板の凹凸検査方法及び検査装置
JPH06265477A (ja) * 1993-03-12 1994-09-22 Sony Corp 物品表面の検査方法
JPH09178450A (ja) * 1995-12-26 1997-07-11 Ntn Corp カラーフィルタの欠陥検出装置
US5963328A (en) * 1997-08-28 1999-10-05 Nissan Motor Co., Ltd. Surface inspecting apparatus
US6042966A (en) * 1998-01-20 2000-03-28 Valence Technology, Inc. Battery terminal insulation
JP2000098621A (ja) * 1998-09-25 2000-04-07 Dainippon Printing Co Ltd 露光装置
KR100484812B1 (ko) * 2002-09-03 2005-04-22 엘지전자 주식회사 이미지 센서를 이용한 표면 검사방법 및 검사장치
KR101182956B1 (ko) * 2004-09-22 2012-09-18 삼성에스디아이 주식회사 전극 집전체의 검사장치 및 이를 이용한 검사방법
US7424902B2 (en) * 2004-11-24 2008-09-16 The Boeing Company In-process vision detection of flaw and FOD characteristics
JP2007078404A (ja) * 2005-09-12 2007-03-29 Mitsubishi Electric Corp 太陽電池パネル検査装置
US7564544B2 (en) * 2006-03-22 2009-07-21 3i Systems Corporation Method and system for inspecting surfaces with improved light efficiency

Also Published As

Publication number Publication date
EP2479556A2 (en) 2012-07-25
WO2011031117A2 (ko) 2011-03-17
JP5768298B2 (ja) 2015-08-26
EP2479556A4 (en) 2017-03-22
US8441647B2 (en) 2013-05-14
EP2479556B1 (en) 2021-09-08
WO2011031117A3 (ko) 2011-09-01
JP2013504768A (ja) 2013-02-07
KR20110029011A (ko) 2011-03-22
US20110090507A1 (en) 2011-04-21

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