PL2481210T3 - System i sposób detektora IR - Google Patents
System i sposób detektora IRInfo
- Publication number
- PL2481210T3 PL2481210T3 PL10751641T PL10751641T PL2481210T3 PL 2481210 T3 PL2481210 T3 PL 2481210T3 PL 10751641 T PL10751641 T PL 10751641T PL 10751641 T PL10751641 T PL 10751641T PL 2481210 T3 PL2481210 T3 PL 2481210T3
- Authority
- PL
- Poland
- Prior art keywords
- detector system
- detector
- Prior art date
Links
Classifications
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N3/00—Scanning details of television systems; Combination thereof with generation of supply voltages
- H04N3/10—Scanning details of television systems; Combination thereof with generation of supply voltages by means not exclusively optical-mechanical
- H04N3/14—Scanning details of television systems; Combination thereof with generation of supply voltages by means not exclusively optical-mechanical by means of electrically scanned solid-state devices
- H04N3/15—Scanning details of television systems; Combination thereof with generation of supply voltages by means not exclusively optical-mechanical by means of electrically scanned solid-state devices for picture signal generation
- H04N3/155—Control of the image-sensor operation, e.g. image processing within the image-sensor
- H04N3/1568—Control of the image-sensor operation, e.g. image processing within the image-sensor for disturbance correction or prevention within the image-sensor, e.g. biasing, blooming, smearing
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
- H04N25/40—Extracting pixel data from image sensors by controlling scanning circuits, e.g. by modifying the number of pixels sampled or to be sampled
- H04N25/46—Extracting pixel data from image sensors by controlling scanning circuits, e.g. by modifying the number of pixels sampled or to be sampled by combining or binning pixels
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
- H04N25/50—Control of the SSIS exposure
- H04N25/57—Control of the dynamic range
- H04N25/59—Control of the dynamic range by controlling the amount of charge storable in the pixel, e.g. modification of the charge conversion ratio of the floating node capacitance
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
- H04N25/60—Noise processing, e.g. detecting, correcting, reducing or removing noise
- H04N25/616—Noise processing, e.g. detecting, correcting, reducing or removing noise involving a correlated sampling function, e.g. correlated double sampling [CDS] or triple sampling
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
- H04N25/60—Noise processing, e.g. detecting, correcting, reducing or removing noise
- H04N25/62—Detection or reduction of noise due to excess charges produced by the exposure, e.g. smear, blooming, ghost image, crosstalk or leakage between pixels
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
- H04N25/70—SSIS architectures; Circuits associated therewith
- H04N25/76—Addressed sensors, e.g. MOS or CMOS sensors
- H04N25/77—Pixel circuitry, e.g. memories, A/D converters, pixel amplifiers, shared circuits or shared components
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
- H04N25/70—SSIS architectures; Circuits associated therewith
- H04N25/76—Addressed sensors, e.g. MOS or CMOS sensors
- H04N25/77—Pixel circuitry, e.g. memories, A/D converters, pixel amplifiers, shared circuits or shared components
- H04N25/771—Pixel circuitry, e.g. memories, A/D converters, pixel amplifiers, shared circuits or shared components comprising storage means other than floating diffusion
Landscapes
- Engineering & Computer Science (AREA)
- Multimedia (AREA)
- Signal Processing (AREA)
- Computer Vision & Pattern Recognition (AREA)
- Transforming Light Signals Into Electric Signals (AREA)
- Solid State Image Pick-Up Elements (AREA)
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| GB0916815.4A GB2474014B (en) | 2009-09-24 | 2009-09-24 | IR detection system and method |
| EP10751641.1A EP2481210B1 (en) | 2009-09-24 | 2010-08-31 | Ir detector system and method |
| PCT/EP2010/062759 WO2011036041A1 (en) | 2009-09-24 | 2010-08-31 | Ir detector system and method |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| PL2481210T3 true PL2481210T3 (pl) | 2020-09-07 |
Family
ID=41327557
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| PL10751641T PL2481210T3 (pl) | 2009-09-24 | 2010-08-31 | System i sposób detektora IR |
Country Status (7)
| Country | Link |
|---|---|
| US (1) | US9060141B2 (pl) |
| EP (1) | EP2481210B1 (pl) |
| ES (1) | ES2793675T3 (pl) |
| GB (1) | GB2474014B (pl) |
| IL (1) | IL218734A0 (pl) |
| PL (1) | PL2481210T3 (pl) |
| WO (1) | WO2011036041A1 (pl) |
Families Citing this family (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| FR2979485B1 (fr) | 2011-08-26 | 2016-09-09 | E2V Semiconductors | Capteur d'image a regroupement de pixels |
| CN107924927B (zh) * | 2015-08-04 | 2022-04-19 | 新唐科技日本株式会社 | 固体摄像装置 |
| JP6809542B2 (ja) | 2017-01-31 | 2021-01-06 | 株式会社ニコン | 撮像素子および撮像装置 |
| JP6809543B2 (ja) * | 2017-01-31 | 2021-01-06 | 株式会社ニコン | 撮像素子および電子カメラ |
| FR3064869B1 (fr) | 2017-03-28 | 2019-05-03 | Commissariat A L'energie Atomique Et Aux Energies Alternatives | Capteur d'images |
| US10681289B2 (en) | 2018-04-25 | 2020-06-09 | L3 Cincinnati Electronics Corporation | Designs and methods of multi-function digital readout integrated circuits with an embedded programmable gate array |
| WO2022248972A1 (ja) * | 2021-05-27 | 2022-12-01 | 株式会社半導体エネルギー研究所 | 半導体装置、表示装置、及び電子機器 |
| CN115002365B (zh) * | 2022-05-26 | 2024-04-09 | 中国电子科技集团公司第四十四研究所 | 一种ccd高光谱成像超高动态循环曝光控制方法及系统 |
| CN116055826B (zh) * | 2022-11-15 | 2024-04-19 | 中国航空工业集团公司洛阳电光设备研究所 | 一种基于面阵探测器的时空结合等效积分时间延长方法 |
| CN117939319B (zh) * | 2024-03-22 | 2024-06-04 | 中国科学院云南天文台 | 一种短波红外探测器的优化采样方法及系统 |
Family Cites Families (14)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE69318455T2 (de) * | 1992-03-18 | 1998-10-01 | Sony Corp | Festkörperbildaufnahmevorrichtung |
| US5512750A (en) * | 1994-06-03 | 1996-04-30 | Martin Marietta Corporation | A-dual band IR sensor having two monolithically integrated staring detector arrays for simultaneous, coincident image readout |
| US5757008A (en) * | 1995-11-08 | 1998-05-26 | Nikon Corporation | Infrared-ray image sensor |
| US5990506A (en) * | 1996-03-20 | 1999-11-23 | California Institute Of Technology | Active pixel sensors with substantially planarized color filtering elements |
| US5986510A (en) | 1998-01-09 | 1999-11-16 | Reticon Corporation | Method and apparatus for amplifying input signals in one of multiple modes of resolution |
| JP3890207B2 (ja) * | 2001-06-25 | 2007-03-07 | キヤノン株式会社 | 撮像装置および撮像システム |
| TW589862B (en) * | 2001-12-11 | 2004-06-01 | Pixart Imaging Inc | Image capturing device and method |
| US7408572B2 (en) * | 2002-07-06 | 2008-08-05 | Nova Research, Inc. | Method and apparatus for an on-chip variable acuity imager array incorporating roll, pitch and yaw angle rates measurement |
| JP2004087898A (ja) * | 2002-08-28 | 2004-03-18 | Fujitsu Ltd | 画像信号読み出し回路 |
| KR100680469B1 (ko) * | 2005-01-31 | 2007-02-08 | 매그나칩 반도체 유한회사 | 인접한 화소들 사이의 센싱노드들이 공유된 씨모스 이미지센서 |
| US7768562B2 (en) * | 2006-10-10 | 2010-08-03 | Micron Technology, Inc. | Method, apparatus and system providing imager vertical binning and scaling using column parallel sigma-delta digital conversion |
| WO2008096434A1 (ja) * | 2007-02-08 | 2008-08-14 | Fujitsu Limited | 信号読み出し方法、信号読み出し回路及びイメージセンサ |
| US7674648B2 (en) * | 2007-03-21 | 2010-03-09 | Eastman Kodak Company | Extended dynamic range using variable sensitivity pixels |
| WO2008131313A2 (en) * | 2007-04-18 | 2008-10-30 | Invisage Technologies, Inc. | Materials systems and methods for optoelectronic devices |
-
2009
- 2009-09-24 GB GB0916815.4A patent/GB2474014B/en active Active
-
2010
- 2010-08-31 ES ES10751641T patent/ES2793675T3/es active Active
- 2010-08-31 WO PCT/EP2010/062759 patent/WO2011036041A1/en not_active Ceased
- 2010-08-31 US US13/393,765 patent/US9060141B2/en active Active
- 2010-08-31 PL PL10751641T patent/PL2481210T3/pl unknown
- 2010-08-31 EP EP10751641.1A patent/EP2481210B1/en active Active
-
2012
- 2012-03-19 IL IL218734A patent/IL218734A0/en active IP Right Grant
Also Published As
| Publication number | Publication date |
|---|---|
| US20120154597A1 (en) | 2012-06-21 |
| EP2481210B1 (en) | 2020-03-18 |
| IL218734A0 (en) | 2012-06-28 |
| EP2481210A1 (en) | 2012-08-01 |
| GB0916815D0 (en) | 2009-11-04 |
| GB2474014A (en) | 2011-04-06 |
| US9060141B2 (en) | 2015-06-16 |
| GB2474014B (en) | 2015-04-15 |
| ES2793675T3 (es) | 2020-11-16 |
| WO2011036041A1 (en) | 2011-03-31 |
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