PL2533267T3 - Lampa rentgenowska i analizator fluorescencji rentgenowskiej wykorzystujący selektywne promieniowanie wzbudzające - Google Patents

Lampa rentgenowska i analizator fluorescencji rentgenowskiej wykorzystujący selektywne promieniowanie wzbudzające

Info

Publication number
PL2533267T3
PL2533267T3 PL11169419T PL11169419T PL2533267T3 PL 2533267 T3 PL2533267 T3 PL 2533267T3 PL 11169419 T PL11169419 T PL 11169419T PL 11169419 T PL11169419 T PL 11169419T PL 2533267 T3 PL2533267 T3 PL 2533267T3
Authority
PL
Poland
Prior art keywords
ray
excitation radiation
selective excitation
utilizing selective
fluorescence analyser
Prior art date
Application number
PL11169419T
Other languages
English (en)
Inventor
Heikki Sipilä
Original Assignee
Outotec Oyj
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Outotec Oyj filed Critical Outotec Oyj
Publication of PL2533267T3 publication Critical patent/PL2533267T3/pl

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
    • G01N23/223—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
    • C—CHEMISTRY; METALLURGY
    • C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
    • C23C14/22—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
    • C23C14/34—Sputtering
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J35/00—X-ray tubes
    • H01J35/02—Details
    • H01J35/04—Electrodes ; Mutual position thereof; Constructional adaptations therefor
    • H01J35/08—Anodes; Anti cathodes
    • H01J35/10—Rotary anodes; Arrangements for rotating anodes; Cooling rotary anodes
    • H01J35/108—Substrates for and bonding of emissive target, e.g. composite structures
    • C—CHEMISTRY; METALLURGY
    • C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
    • C23C14/06—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the coating material
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J2235/00—X-ray tubes
    • H01J2235/08—Targets (anodes) and X-ray converters
    • H01J2235/086—Target geometry
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J35/00—X-ray tubes
    • H01J35/02—Details
    • H01J35/04—Electrodes ; Mutual position thereof; Constructional adaptations therefor
    • H01J35/08—Anodes; Anti cathodes
    • H01J35/10—Rotary anodes; Arrangements for rotating anodes; Cooling rotary anodes

Landscapes

  • Chemical & Material Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Biochemistry (AREA)
  • General Physics & Mathematics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Engineering & Computer Science (AREA)
  • Organic Chemistry (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Metallurgy (AREA)
  • Mechanical Engineering (AREA)
  • Materials Engineering (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Measurement Of Radiation (AREA)
PL11169419T 2011-06-10 2011-06-10 Lampa rentgenowska i analizator fluorescencji rentgenowskiej wykorzystujący selektywne promieniowanie wzbudzające PL2533267T3 (pl)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
EP20110169419 EP2533267B1 (en) 2011-06-10 2011-06-10 X-ray tube and X-ray fluorescence analyser utilizing selective excitation radiation

Publications (1)

Publication Number Publication Date
PL2533267T3 true PL2533267T3 (pl) 2014-09-30

Family

ID=44543003

Family Applications (1)

Application Number Title Priority Date Filing Date
PL11169419T PL2533267T3 (pl) 2011-06-10 2011-06-10 Lampa rentgenowska i analizator fluorescencji rentgenowskiej wykorzystujący selektywne promieniowanie wzbudzające

Country Status (9)

Country Link
US (1) US9070530B2 (pl)
EP (1) EP2533267B1 (pl)
AU (1) AU2012203317B2 (pl)
CA (1) CA2778477A1 (pl)
ES (1) ES2478090T3 (pl)
PL (1) PL2533267T3 (pl)
PT (1) PT2533267E (pl)
RS (1) RS53452B (pl)
ZA (1) ZA201204417B (pl)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102015210681B4 (de) * 2015-06-11 2017-02-23 Siemens Healthcare Gmbh Vorrichtung zur Erzeugung von Bremsstrahlung
RU2603846C2 (ru) * 2015-06-24 2016-12-10 Общество с ограниченной ответственностью "ИжРапид" (ООО "ИжРапид") Рентгеновская трубка
DE102017202309B3 (de) * 2017-02-14 2017-07-13 Universität Zu Lübeck Messvorrichtung für Röntgenphotonen
WO2020034002A1 (en) * 2018-08-17 2020-02-20 Microtrace Pty Limited Apparatus for the measurement of mineral slurries
CA3209745A1 (en) 2021-02-24 2022-09-01 Paul D. Sheldon Apparatus and method for inspection of a material

Family Cites Families (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5148462A (en) * 1991-04-08 1992-09-15 Moltech Corporation High efficiency X-ray anode sources
JPH06188092A (ja) * 1992-12-17 1994-07-08 Hitachi Ltd Ｘ線発生用タ−ゲットとｘ線源とｘ線撮像装置
US5651047A (en) * 1993-01-25 1997-07-22 Cardiac Mariners, Incorporated Maneuverable and locateable catheters
JP3191554B2 (ja) * 1994-03-18 2001-07-23 株式会社日立製作所 Ｘ線撮像装置
FI102697B1 (fi) 1997-06-26 1999-01-29 Metorex Int Oy Polarisoitua herätesäteilyä hyödyntävä röntgenfluoresenssimittausjärjestely ja röntgenputki
JP4777539B2 (ja) * 2001-05-29 2011-09-21 エスアイアイ・ナノテクノロジー株式会社 複合ｘ線分析装置
US6829329B1 (en) * 2002-01-17 2004-12-07 Varian Medical Systems Technologies, Inc. Target for a stationary anode in an x-ray tube
FI20021255L (fi) * 2002-06-27 2003-12-28 Metorex Internat Oy Suoraan konversioon perustuva kuvaava röntgendetektori
EP1988564A4 (en) * 2006-02-01 2011-04-20 Toshiba Electron Tubes & Devic X-RAY SOURCE AND FLUORESCENCE X-RAY ANALYSIS DEVICE
JP4878311B2 (ja) * 2006-03-03 2012-02-15 キヤノン株式会社 マルチｘ線発生装置
CN101589441A (zh) * 2007-01-26 2009-11-25 皇家飞利浦电子股份有限公司 由与阳极板相同的材料制成的保谱足跟效应补偿过滤器
US8428222B2 (en) * 2007-04-20 2013-04-23 General Electric Company X-ray tube target and method of repairing a damaged x-ray tube target

Also Published As

Publication number Publication date
CA2778477A1 (en) 2012-12-15
AU2012203317A1 (en) 2013-01-10
PT2533267E (pt) 2014-07-15
AU2012203317B2 (en) 2015-04-09
RS53452B (sr) 2014-12-31
US20120321038A1 (en) 2012-12-20
ZA201204417B (en) 2013-05-29
ES2478090T3 (es) 2014-07-18
US9070530B2 (en) 2015-06-30
EP2533267B1 (en) 2014-04-23
EP2533267A1 (en) 2012-12-12

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