PL2589954T3 - Urządzenie do wykrywania przedmiotów i sposób ich wykrywania - Google Patents

Urządzenie do wykrywania przedmiotów i sposób ich wykrywania

Info

Publication number
PL2589954T3
PL2589954T3 PL10854001T PL10854001T PL2589954T3 PL 2589954 T3 PL2589954 T3 PL 2589954T3 PL 10854001 T PL10854001 T PL 10854001T PL 10854001 T PL10854001 T PL 10854001T PL 2589954 T3 PL2589954 T3 PL 2589954T3
Authority
PL
Poland
Prior art keywords
articles
detection
detection device
detection method
articles detection
Prior art date
Application number
PL10854001T
Other languages
English (en)
Inventor
Yigang Yang
Tiezhu Li
Qinjian Zhang
Yi Zhang
Yingkang Jin
Qinghao Chen
Yuanjing Li
Yinong Liu
Original Assignee
Univ Tsinghua
Nuctech Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Univ Tsinghua, Nuctech Co Ltd filed Critical Univ Tsinghua
Publication of PL2589954T3 publication Critical patent/PL2589954T3/pl

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01VGEOPHYSICS; GRAVITATIONAL MEASUREMENTS; DETECTING MASSES OR OBJECTS; TAGS
    • G01V5/00Prospecting or detecting by the use of ionising radiation, e.g. of natural or induced radioactivity
    • G01V5/20Detecting prohibited goods, e.g. weapons, explosives, hazardous substances, contraband or smuggled objects
    • G01V5/22Active interrogation, i.e. by irradiating objects or goods using external radiation sources, e.g. using gamma rays or cosmic rays
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/04Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
    • G01N23/046Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material using tomography, e.g. computed tomography [CT]
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/04Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
    • G01N23/05Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material using neutrons
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01VGEOPHYSICS; GRAVITATIONAL MEASUREMENTS; DETECTING MASSES OR OBJECTS; TAGS
    • G01V5/00Prospecting or detecting by the use of ionising radiation, e.g. of natural or induced radioactivity
    • G01V5/20Detecting prohibited goods, e.g. weapons, explosives, hazardous substances, contraband or smuggled objects
    • G01V5/22Active interrogation, i.e. by irradiating objects or goods using external radiation sources, e.g. using gamma rays or cosmic rays
    • G01V5/222Active interrogation, i.e. by irradiating objects or goods using external radiation sources, e.g. using gamma rays or cosmic rays measuring scattered radiation
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00Investigating materials by wave or particle radiation
    • G01N2223/40Imaging
    • G01N2223/419Imaging computed tomograph

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Chemical & Material Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Geophysics (AREA)
  • Biochemistry (AREA)
  • General Life Sciences & Earth Sciences (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Theoretical Computer Science (AREA)
  • Radiology & Medical Imaging (AREA)
  • Pulmonology (AREA)
  • Engineering & Computer Science (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Measurement Of Radiation (AREA)
PL10854001T 2010-06-30 2010-12-28 Urządzenie do wykrywania przedmiotów i sposób ich wykrywania PL2589954T3 (pl)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
CN201010223292.7A CN102313752B (zh) 2010-06-30 2010-06-30 物品检测设备及其检测方法
PCT/CN2010/080369 WO2012000298A1 (zh) 2010-06-30 2010-12-28 物品检测设备及其检测方法
EP10854001.4A EP2589954B1 (en) 2010-06-30 2010-12-28 Articles detection device and detection method thereof

Publications (1)

Publication Number Publication Date
PL2589954T3 true PL2589954T3 (pl) 2016-04-29

Family

ID=45401360

Family Applications (1)

Application Number Title Priority Date Filing Date
PL10854001T PL2589954T3 (pl) 2010-06-30 2010-12-28 Urządzenie do wykrywania przedmiotów i sposób ich wykrywania

Country Status (5)

Country Link
US (1) US8406375B2 (pl)
EP (1) EP2589954B1 (pl)
CN (1) CN102313752B (pl)
PL (1) PL2589954T3 (pl)
WO (1) WO2012000298A1 (pl)

Families Citing this family (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN103728324B (zh) * 2013-12-18 2016-08-17 中国原子能科学研究院 一种核燃料组件高能x射线无损检测装置
CN104062308B (zh) * 2014-07-04 2017-02-15 天津三英精密仪器有限公司 一种岩石无损矿物成分检测方法
CN105445290A (zh) * 2014-09-02 2016-03-30 同方威视技术股份有限公司 X射线产品质量在线检测装置
CN104792805B (zh) * 2015-04-16 2017-09-12 中国原子能科学研究院 一种透射探测器和插值数据计算方法
CN106353828B (zh) * 2015-07-22 2018-09-21 清华大学 在安检系统中估算被检查物体重量的方法和装置
PL3371774T3 (pl) * 2015-11-05 2022-01-03 Volpara Health Technologies Limited Sposób kwantyfikacji obrazów
US9528952B1 (en) * 2016-05-17 2016-12-27 Westinghouse Electric Company Llc Pulsed neutron generated prompt gamma emission measurement system for surface defect detection and analysis
US11243327B2 (en) * 2016-05-30 2022-02-08 Southern Innovation International Pty Ltd System and method for material characterization
CN110199209B (zh) 2016-07-28 2021-07-30 德国史密斯海曼简化股份公司 散射成像
GB2555564B (en) * 2016-07-28 2020-09-09 Smiths Heimann Sas Scatter imaging
GB2552535B (en) * 2016-07-28 2020-09-09 Smiths Heimann Sas Detection of scatter radiation
EP3435325A1 (en) * 2017-07-26 2019-01-30 Koninklijke Philips N.V. Scatter correction for dark field imaging
WO2020093232A1 (en) * 2018-11-06 2020-05-14 Shenzhen Xpectvision Technology Co., Ltd. A Backscatter X-ray System
CN113887572B (zh) * 2021-09-10 2025-05-30 中国核电工程有限公司 一种基于灵敏度包覆的评定核系统相似性方法
CN116699669A (zh) * 2023-07-13 2023-09-05 合肥综合性国家科学中心能源研究院(安徽省能源实验室) 一种iv型钢箱放射性固体废物无损检测系统
CN117571543B (zh) * 2024-01-16 2024-04-09 清华大学 一种利用X/γ射线在线测量散状物料真密度的方法及系统
CN118311072A (zh) * 2024-05-31 2024-07-09 清华大学 一种利用散射和吸收信息的x射线能谱成像定量分析方法

Family Cites Families (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
SU707403A1 (ru) * 1978-05-30 1981-06-15 Научно-Исследовательский Институт Ядерной Физикиэлектроники И Автоматики При Tomckom Орденаоктябрьской Революции И Ордена Трудового Ккрасного Знамени Политехническом Институте Им.C.M.Кирова Способ рационального измерени плотности
FR2442042A1 (fr) * 1978-11-27 1980-06-20 Labo Electronique Physique Procede et appareil d'examen tomographique par exploration de milieux aux rayons x ou gamma
WO1992003722A1 (en) * 1990-08-15 1992-03-05 Massachusetts Institute Of Technology Detection of explosives and other materials using resonance fluorescence, resonance absorption, and other electromagnetic processes with bremsstrahlung radiation
WO1998020366A1 (en) * 1996-11-08 1998-05-14 American Science And Engineering, Inc. Coded aperture x-ray imaging system
CA2348150C (en) * 2000-05-25 2007-03-13 Esam M.A. Hussein Non-rotating x-ray system for three-dimensional, three-parameter imaging
CN1164928C (zh) * 2001-09-21 2004-09-01 清华大学 一种X或γ辐射成像无损检测方法与装置
CN1179207C (zh) * 2001-11-27 2004-12-08 丹东东方测控技术有限公司 电子对湮没辐射效应大块矿石品位在线检测方法及其系统
US7078699B2 (en) * 2002-10-04 2006-07-18 Varian Medical Systems Technologies, Inc. Imaging apparatus and method with event sensitive photon detection
SE0302900L (sv) 2003-11-03 2005-05-04 Xcounter Ab Koherent spridningsavbildning
DE102005024892B3 (de) * 2005-05-31 2006-09-28 Yxlon International Security Gmbh Gantry zur Aufnahme einer Röntgenquelle und Verfahren zur Überprüfung eines Prüfteils mittels Röntgenstrahlung
US20090168958A1 (en) * 2008-01-02 2009-07-02 Cristina Francesca Cozzini Apparatus and method for identifying components in a container
CN101629917B (zh) * 2008-07-16 2011-09-14 清华大学 一种测量物质有效原子序数的方法和装置
US8588370B2 (en) * 2010-06-30 2013-11-19 Tsinghua University Article inspection device and inspection method

Also Published As

Publication number Publication date
EP2589954A4 (en) 2013-11-20
EP2589954B1 (en) 2015-07-01
CN102313752B (zh) 2014-07-23
WO2012000298A1 (zh) 2012-01-05
CN102313752A (zh) 2012-01-11
US8406375B2 (en) 2013-03-26
US20120207271A1 (en) 2012-08-16
EP2589954A1 (en) 2013-05-08

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