PL2646194T3 - Sposób oddzielania warstwy powierzchniowej kryształu półprzewodnikowego za pomocą wiązki laserowej prostopadłej do płaszczyzny rozdziału - Google Patents
Sposób oddzielania warstwy powierzchniowej kryształu półprzewodnikowego za pomocą wiązki laserowej prostopadłej do płaszczyzny rozdziałuInfo
- Publication number
- PL2646194T3 PL2646194T3 PL11844036T PL11844036T PL2646194T3 PL 2646194 T3 PL2646194 T3 PL 2646194T3 PL 11844036 T PL11844036 T PL 11844036T PL 11844036 T PL11844036 T PL 11844036T PL 2646194 T3 PL2646194 T3 PL 2646194T3
- Authority
- PL
- Poland
- Prior art keywords
- separating
- laser beam
- surface layer
- semiconductor crystal
- separation plane
- Prior art date
Links
Classifications
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
- B23K26/00—Working by laser beam, e.g. welding, cutting or boring
- B23K26/50—Working by transmitting the laser beam through or within the workpiece
- B23K26/57—Working by transmitting the laser beam through or within the workpiece the laser beam entering a face of the workpiece from which it is transmitted through the workpiece material to work on a different workpiece face, e.g. for effecting removal, fusion splicing, modifying or reforming
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
- B23K26/00—Working by laser beam, e.g. welding, cutting or boring
- B23K26/0006—Working by laser beam, e.g. welding, cutting or boring taking account of the properties of the material involved
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
- B23K26/00—Working by laser beam, e.g. welding, cutting or boring
- B23K26/02—Positioning or observing the workpiece, e.g. with respect to the point of impact; Aligning, aiming or focusing the laser beam
- B23K26/06—Shaping the laser beam, e.g. by masks or multi-focusing
- B23K26/062—Shaping the laser beam, e.g. by masks or multi-focusing by direct control of the laser beam
- B23K26/0622—Shaping the laser beam, e.g. by masks or multi-focusing by direct control of the laser beam by shaping pulses
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
- B23K26/00—Working by laser beam, e.g. welding, cutting or boring
- B23K26/36—Removing material
- B23K26/362—Laser etching
- B23K26/364—Laser etching for making a groove or trench, e.g. for scribing a break initiation groove
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
- B23K26/00—Working by laser beam, e.g. welding, cutting or boring
- B23K26/36—Removing material
- B23K26/38—Removing material by boring or cutting
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
- B23K26/00—Working by laser beam, e.g. welding, cutting or boring
- B23K26/36—Removing material
- B23K26/40—Removing material taking account of the properties of the material involved
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
- B23K26/00—Working by laser beam, e.g. welding, cutting or boring
- B23K26/50—Working by transmitting the laser beam through or within the workpiece
- B23K26/53—Working by transmitting the laser beam through or within the workpiece for modifying or reforming the material inside the workpiece, e.g. for producing break initiation cracks
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B28—WORKING CEMENT, CLAY, OR STONE
- B28D—WORKING STONE OR STONE-LIKE MATERIALS
- B28D5/00—Fine working of gems, jewels, crystals, e.g. of semiconductor material; apparatus or devices therefor
- B28D5/0005—Fine working of gems, jewels, crystals, e.g. of semiconductor material; apparatus or devices therefor by breaking, e.g. dicing
- B28D5/0011—Fine working of gems, jewels, crystals, e.g. of semiconductor material; apparatus or devices therefor by breaking, e.g. dicing with preliminary treatment, e.g. weakening by scoring
-
- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B29/00—Single crystals or homogeneous polycrystalline material with defined structure characterised by the material or by their shape
- C30B29/10—Inorganic compounds or compositions
- C30B29/40—AIIIBV compounds wherein A is B, Al, Ga, In or Tl and B is N, P, As, Sb or Bi
- C30B29/403—AIII-nitrides
- C30B29/406—Gallium nitride
-
- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B33/00—After-treatment of single crystals or homogeneous polycrystalline material with defined structure
- C30B33/06—Joining of crystals
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
- B23K2101/00—Articles made by soldering, welding or cutting
- B23K2101/36—Electric or electronic devices
- B23K2101/40—Semiconductor devices
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
- B23K2103/00—Materials to be soldered, welded or cut
- B23K2103/50—Inorganic materials other than metals or composite materials
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
- B23K2103/00—Materials to be soldered, welded or cut
- B23K2103/50—Inorganic materials other than metals or composite materials
- B23K2103/56—Inorganic materials other than metals or composite materials being semiconducting
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10H—INORGANIC LIGHT-EMITTING SEMICONDUCTOR DEVICES HAVING POTENTIAL BARRIERS
- H10H20/00—Individual inorganic light-emitting semiconductor devices having potential barriers, e.g. light-emitting diodes [LED]
- H10H20/01—Manufacture or treatment
- H10H20/011—Manufacture or treatment of bodies, e.g. forming semiconductor layers
- H10H20/018—Bonding of wafers
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Optics & Photonics (AREA)
- Mechanical Engineering (AREA)
- Chemical & Material Sciences (AREA)
- Plasma & Fusion (AREA)
- Materials Engineering (AREA)
- General Chemical & Material Sciences (AREA)
- Oil, Petroleum & Natural Gas (AREA)
- Crystallography & Structural Chemistry (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- Inorganic Chemistry (AREA)
- Laser Beam Processing (AREA)
- Crystals, And After-Treatments Of Crystals (AREA)
- Semiconductor Lasers (AREA)
- Mechanical Treatment Of Semiconductor (AREA)
- Recrystallisation Techniques (AREA)
- Led Devices (AREA)
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| RU2010148544/02A RU2459691C2 (ru) | 2010-11-29 | 2010-11-29 | Способ отделения поверхностного слоя полупроводникового кристалла (варианты) |
| PCT/RU2011/000943 WO2012074439A2 (en) | 2010-11-29 | 2011-11-29 | Method of separating surface layer of semiconductor crystal (variations) |
| EP11844036.1A EP2646194B1 (en) | 2010-11-29 | 2011-11-29 | Method of separating surface layer of semiconductor crystal using a laser beam perpendicular to the separating plane |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| PL2646194T3 true PL2646194T3 (pl) | 2018-06-29 |
Family
ID=46172448
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| PL11844036T PL2646194T3 (pl) | 2010-11-29 | 2011-11-29 | Sposób oddzielania warstwy powierzchniowej kryształu półprzewodnikowego za pomocą wiązki laserowej prostopadłej do płaszczyzny rozdziału |
Country Status (6)
| Country | Link |
|---|---|
| US (2) | US10828727B2 (pl) |
| EP (1) | EP2646194B1 (pl) |
| CN (1) | CN103459082B (pl) |
| PL (1) | PL2646194T3 (pl) |
| RU (1) | RU2459691C2 (pl) |
| WO (1) | WO2012074439A2 (pl) |
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| ITAN20130232A1 (it) * | 2013-12-05 | 2015-06-06 | Munoz David Callejo | Metodo per ottenere una pluralita' di lamine da un lingotto di materiale con struttura monocristallina |
| US9687936B2 (en) * | 2013-12-17 | 2017-06-27 | Corning Incorporated | Transparent material cutting with ultrafast laser and beam optics |
| DE102015000449A1 (de) | 2015-01-15 | 2016-07-21 | Siltectra Gmbh | Festkörperteilung mittels Stoffumwandlung |
| JP2016015447A (ja) * | 2014-07-03 | 2016-01-28 | パナソニックIpマネジメント株式会社 | ウエハの製造方法および装置 |
| EP4122633B1 (de) * | 2014-11-27 | 2025-03-19 | Siltectra GmbH | Festkörperteilung mittels stoffumwandlung |
| CN107000125B (zh) * | 2014-11-27 | 2022-08-12 | 西尔特克特拉有限责任公司 | 基于激光器的分离方法 |
| JP6395633B2 (ja) | 2015-02-09 | 2018-09-26 | 株式会社ディスコ | ウエーハの生成方法 |
| JP6395632B2 (ja) | 2015-02-09 | 2018-09-26 | 株式会社ディスコ | ウエーハの生成方法 |
| JP6429715B2 (ja) | 2015-04-06 | 2018-11-28 | 株式会社ディスコ | ウエーハの生成方法 |
| JP6425606B2 (ja) | 2015-04-06 | 2018-11-21 | 株式会社ディスコ | ウエーハの生成方法 |
| JP6494382B2 (ja) | 2015-04-06 | 2019-04-03 | 株式会社ディスコ | ウエーハの生成方法 |
| DE102015006971A1 (de) | 2015-04-09 | 2016-10-13 | Siltectra Gmbh | Verfahren zum verlustarmen Herstellen von Mehrkomponentenwafern |
| KR101944657B1 (ko) * | 2015-06-01 | 2019-01-31 | 에바나 테크놀로지스, 유에이비 | 분할된 레이저 빔들을 이용한 반도체 워크피스의 레이저 스크라이빙 방법 |
| JP6472333B2 (ja) | 2015-06-02 | 2019-02-20 | 株式会社ディスコ | ウエーハの生成方法 |
| JP6482423B2 (ja) | 2015-07-16 | 2019-03-13 | 株式会社ディスコ | ウエーハの生成方法 |
| JP6482425B2 (ja) * | 2015-07-21 | 2019-03-13 | 株式会社ディスコ | ウエーハの薄化方法 |
| JP6472347B2 (ja) * | 2015-07-21 | 2019-02-20 | 株式会社ディスコ | ウエーハの薄化方法 |
| CN105058605B (zh) * | 2015-08-02 | 2017-08-29 | 河南鸿昌电子有限公司 | 一种线切割机和半导体晶棒的线切割方法 |
| DE102016000051A1 (de) * | 2016-01-05 | 2017-07-06 | Siltectra Gmbh | Verfahren und Vorrichtung zum planaren Erzeugen von Modifikationen in Festkörpern |
| JP6654435B2 (ja) * | 2016-01-07 | 2020-02-26 | 株式会社ディスコ | ウエーハ生成方法 |
| US11130200B2 (en) | 2016-03-22 | 2021-09-28 | Siltectra Gmbh | Combined laser treatment of a solid body to be split |
| JP6690983B2 (ja) | 2016-04-11 | 2020-04-28 | 株式会社ディスコ | ウエーハ生成方法及び実第2のオリエンテーションフラット検出方法 |
| CN109314166A (zh) * | 2016-06-03 | 2019-02-05 | 创光科学株式会社 | 氮化物半导体紫外线发光装置及其制造方法 |
| US10978311B2 (en) | 2016-12-12 | 2021-04-13 | Siltectra Gmbh | Method for thinning solid body layers provided with components |
| JP6858587B2 (ja) | 2017-02-16 | 2021-04-14 | 株式会社ディスコ | ウエーハ生成方法 |
| JP6935224B2 (ja) * | 2017-04-25 | 2021-09-15 | 株式会社ディスコ | ウエーハの生成方法 |
| JP6904793B2 (ja) * | 2017-06-08 | 2021-07-21 | 株式会社ディスコ | ウエーハ生成装置 |
| US10840141B2 (en) * | 2018-06-18 | 2020-11-17 | Shin-Etsu Engineering Co., Ltd. | Workpiece-separating device and workpiece-separating method |
| JP2020061398A (ja) * | 2018-10-05 | 2020-04-16 | 株式会社ディスコ | ウエーハの加工方法 |
| JP7120903B2 (ja) | 2018-10-30 | 2022-08-17 | 浜松ホトニクス株式会社 | レーザ加工装置及びレーザ加工方法 |
| WO2020090902A1 (ja) * | 2018-10-30 | 2020-05-07 | 浜松ホトニクス株式会社 | レーザ加工装置及びレーザ加工方法 |
| US11897056B2 (en) | 2018-10-30 | 2024-02-13 | Hamamatsu Photonics K.K. | Laser processing device and laser processing method |
| JPWO2020090918A1 (ja) | 2018-10-30 | 2021-09-24 | 浜松ホトニクス株式会社 | レーザ加工装置 |
| EP4053881B1 (en) * | 2019-10-29 | 2024-10-09 | Kyocera Corporation | Semiconductor element and method for producing semiconductor element |
| CN112582285B (zh) * | 2020-12-15 | 2023-07-25 | 青岛歌尔微电子研究院有限公司 | 封装结构的减薄方法 |
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| NL7609815A (nl) * | 1976-09-03 | 1978-03-07 | Philips Nv | Werkwijze voor het vervaardigen van een half- geleiderinrichting en halfgeleiderinrichting vervaardigd met behulp van de werkwijze. |
| US4546231A (en) * | 1983-11-14 | 1985-10-08 | Group Ii Manufacturing Ltd. | Creation of a parting zone in a crystal structure |
| WO1997029509A1 (en) * | 1996-02-09 | 1997-08-14 | Philips Electronics N.V. | Laser separation of semiconductor elements formed in a wafer of semiconductor material |
| JP4659300B2 (ja) * | 2000-09-13 | 2011-03-30 | 浜松ホトニクス株式会社 | レーザ加工方法及び半導体チップの製造方法 |
| JP2002255580A (ja) | 2000-12-27 | 2002-09-11 | Nippon Sheet Glass Co Ltd | ロッドレンズ母材の切断方法及び同切断方法に用いるレンズブロック |
| KR100820689B1 (ko) * | 2001-08-10 | 2008-04-10 | 미쓰보시 다이야몬도 고교 가부시키가이샤 | 취성재료기판의 모따기 방법 및 모따기 장치 |
| JP2003168820A (ja) * | 2001-12-03 | 2003-06-13 | Sony Corp | 剥離方法、レーザー光の照射方法及びこれらを用いた素子の製造方法 |
| JP4175636B2 (ja) | 2003-10-31 | 2008-11-05 | 株式会社日本製鋼所 | ガラスの切断方法 |
| US7148075B2 (en) * | 2004-06-05 | 2006-12-12 | Hui Peng | Vertical semiconductor devices or chips and method of mass production of the same |
| JP4604594B2 (ja) * | 2004-07-30 | 2011-01-05 | 株式会社デンソー | 半導体基板の製造方法 |
| US20080061043A1 (en) | 2004-10-01 | 2008-03-13 | Masahiro Fujii | Scribing Method for Brittle Material and Scribing Apparatus |
| JP2006150385A (ja) | 2004-11-26 | 2006-06-15 | Canon Inc | レーザ割断方法 |
| US7682937B2 (en) | 2005-11-25 | 2010-03-23 | Advanced Laser Separation International B.V. | Method of treating a substrate, method of processing a substrate using a laser beam, and arrangement |
| WO2007087354A2 (en) * | 2006-01-24 | 2007-08-02 | Baer Stephen C | Cleaving wafers from silicon crystals |
| US9362439B2 (en) * | 2008-05-07 | 2016-06-07 | Silicon Genesis Corporation | Layer transfer of films utilizing controlled shear region |
| US8293619B2 (en) * | 2008-08-28 | 2012-10-23 | Silicon Genesis Corporation | Layer transfer of films utilizing controlled propagation |
| US7727790B2 (en) * | 2007-01-30 | 2010-06-01 | Goldeneye, Inc. | Method for fabricating light emitting diodes |
| DE102007018080B3 (de) * | 2007-04-17 | 2008-06-19 | Eisele, Christopher, Dr. | Verfahren und Vorrichtung zur Herstellung von dünnen Scheiben oder Folien aus Halbleiterkörpern |
| US8623137B1 (en) * | 2008-05-07 | 2014-01-07 | Silicon Genesis Corporation | Method and device for slicing a shaped silicon ingot using layer transfer |
| JP2008201143A (ja) * | 2008-06-02 | 2008-09-04 | Denso Corp | 工作物の切断方法 |
| DE102009005303A1 (de) * | 2009-01-16 | 2010-07-22 | BIAS - Bremer Institut für angewandte Strahltechnik GmbH | Verfahren zum Separieren eines Halbleiter-Wafer von einem Halbleiterkristall |
| JP2010283339A (ja) * | 2009-05-02 | 2010-12-16 | Semiconductor Energy Lab Co Ltd | 光電変換装置及びその作製方法 |
| US8986497B2 (en) * | 2009-12-07 | 2015-03-24 | Ipg Photonics Corporation | Laser lift off systems and methods |
| DE102010030358B4 (de) * | 2010-06-22 | 2014-05-22 | Osram Opto Semiconductors Gmbh | Verfahren zum Abtrennen einer Substratscheibe |
| RU2013102422A (ru) * | 2010-07-12 | 2014-08-20 | ФАЙЛЭЙСЕР ЮЭс-Эй ЭлЭлСи | Способ обработки материалов с использованием филаментации |
-
2010
- 2010-11-29 RU RU2010148544/02A patent/RU2459691C2/ru active
-
2011
- 2011-11-29 PL PL11844036T patent/PL2646194T3/pl unknown
- 2011-11-29 US US13/990,359 patent/US10828727B2/en active Active
- 2011-11-29 EP EP11844036.1A patent/EP2646194B1/en active Active
- 2011-11-29 CN CN201180066293.8A patent/CN103459082B/zh active Active
- 2011-11-29 WO PCT/RU2011/000943 patent/WO2012074439A2/en not_active Ceased
-
2019
- 2019-01-30 US US16/262,453 patent/US11103960B2/en active Active
Also Published As
| Publication number | Publication date |
|---|---|
| CN103459082A (zh) | 2013-12-18 |
| EP2646194B1 (en) | 2018-01-10 |
| EP2646194A2 (en) | 2013-10-09 |
| US10828727B2 (en) | 2020-11-10 |
| CN103459082B (zh) | 2016-08-31 |
| WO2012074439A4 (en) | 2013-02-28 |
| WO2012074439A3 (en) | 2012-11-29 |
| RU2010148544A (ru) | 2012-06-10 |
| WO2012074439A2 (en) | 2012-06-07 |
| US20190160598A1 (en) | 2019-05-30 |
| US11103960B2 (en) | 2021-08-31 |
| RU2459691C2 (ru) | 2012-08-27 |
| US20130248500A1 (en) | 2013-09-26 |
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