PL2728386T3 - Aparat do kontroli fal milimetrowych - Google Patents

Aparat do kontroli fal milimetrowych

Info

Publication number
PL2728386T3
PL2728386T3 PL14153154T PL14153154T PL2728386T3 PL 2728386 T3 PL2728386 T3 PL 2728386T3 PL 14153154 T PL14153154 T PL 14153154T PL 14153154 T PL14153154 T PL 14153154T PL 2728386 T3 PL2728386 T3 PL 2728386T3
Authority
PL
Poland
Prior art keywords
millimeter
inspection apparatus
wave inspection
wave
inspection
Prior art date
Application number
PL14153154T
Other languages
English (en)
Inventor
Zhiqiang Chen
Ziran Zhao
Yuanjing Li
Wanlong Wu
Yinong Liu
Li Zhang
Dong Lin
Zongjun Shen
Xilei Luo
Zhimin Zheng
Yingkang Jin
Shuo CAO
Bin Sang
Original Assignee
Tsinghua University
Nuctech Company Limited
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tsinghua University, Nuctech Company Limited filed Critical Tsinghua University
Publication of PL2728386T3 publication Critical patent/PL2728386T3/pl

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01V—GEOPHYSICS; GRAVITATIONAL MEASUREMENTS; DETECTING MASSES OR OBJECTS; TAGS
    • G01V8/00—Prospecting or detecting by optical means
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01V—GEOPHYSICS; GRAVITATIONAL MEASUREMENTS; DETECTING MASSES OR OBJECTS; TAGS
    • G01V8/00—Prospecting or detecting by optical means
    • G01V8/005—Prospecting or detecting by optical means operating with millimetre waves, e.g. measuring the black losey radiation
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
    • G01J5/10—Radiation pyrometry, e.g. infrared or optical thermometry using electric radiation detectors
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01K—MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
    • G01K11/00—Measuring temperature based upon physical or chemical changes not covered by groups G01K3/00, G01K5/00, G01K7/00 or G01K9/00
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01K—MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
    • G01K11/00—Measuring temperature based upon physical or chemical changes not covered by groups G01K3/00, G01K5/00, G01K7/00 or G01K9/00
    • G01K11/006—Measuring temperature based upon physical or chemical changes not covered by groups G01K3/00, G01K5/00, G01K7/00 or G01K9/00 using measurement of the effect of a material on microwaves or longer electromagnetic waves, e.g. measuring temperature via microwaves emitted by the object
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N22/00—Investigating or analysing materials by the use of microwaves or radio waves, i.e. electromagnetic waves with a wavelength of one millimetre or more

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Electromagnetism (AREA)
  • Analytical Chemistry (AREA)
  • Geophysics (AREA)
  • Health & Medical Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • General Life Sciences & Earth Sciences (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Radiation Pyrometers (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Radar Systems Or Details Thereof (AREA)
PL14153154T 2010-06-30 2010-12-29 Aparat do kontroli fal milimetrowych PL2728386T3 (pl)

Applications Claiming Priority (4)

Application Number Priority Date Filing Date Title
CN201010223333.2A CN102313907B (zh) 2010-06-30 2010-06-30 毫米波检查设备
PCT/CN2010/080429 WO2011079790A1 (zh) 2010-06-30 2010-12-29 毫米波检查设备
EP14153154.1A EP2728386B1 (en) 2010-06-30 2010-12-29 Millimeter-wave inspection apparatus
EP10838372.0A EP2589990B1 (en) 2010-06-30 2010-12-29 Millimeter wave detection apparatus

Publications (1)

Publication Number Publication Date
PL2728386T3 true PL2728386T3 (pl) 2019-09-30

Family

ID=44226179

Family Applications (2)

Application Number Title Priority Date Filing Date
PL14153154T PL2728386T3 (pl) 2010-06-30 2010-12-29 Aparat do kontroli fal milimetrowych
PL10838372T PL2589990T3 (pl) 2010-06-30 2010-12-29 Aparat do kontroli fal milimetrowych

Family Applications After (1)

Application Number Title Priority Date Filing Date
PL10838372T PL2589990T3 (pl) 2010-06-30 2010-12-29 Aparat do kontroli fal milimetrowych

Country Status (8)

Country Link
US (1) US8513615B2 (pl)
EP (2) EP2589990B1 (pl)
JP (1) JP5802267B2 (pl)
KR (1) KR101515060B1 (pl)
CN (1) CN102313907B (pl)
PL (2) PL2728386T3 (pl)
RU (1) RU2521781C1 (pl)
WO (1) WO2011079790A1 (pl)

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JP2013167529A (ja) * 2012-02-15 2013-08-29 Maspro Denkoh Corp 電波撮像装置
JP2013246138A (ja) * 2012-05-29 2013-12-09 Maspro Denkoh Corp 携帯型マイクロ波測定装置
CN103576144B (zh) * 2012-08-10 2016-01-13 南京理工大学 短毫米波交流辐射成像装置
CN103901498B (zh) * 2012-12-26 2016-09-14 中国电子科技集团公司第五十研究所 增强被动太赫兹成像效果的系统
CN103256979A (zh) * 2013-05-29 2013-08-21 南京信息工程大学 一种双通道夜气辉成像温度光度计及光强和温度探测方法
DE102013225283B4 (de) 2013-12-09 2023-04-27 Rohde & Schwarz GmbH & Co. Kommanditgesellschaft Verfahren und Vorrichtung zum Erfassen einer Rundumansicht
CN104076358B (zh) * 2014-07-02 2016-09-28 北京遥感设备研究所 一种被动式毫米波成像安检设备
RU2563581C1 (ru) * 2014-07-15 2015-09-20 Общество с ограниченной ответственностью "АПСТЕК Лабс" Способ дистанционного определения диэлектрической проницаемости диэлектрического объекта
CN104459822A (zh) 2014-12-05 2015-03-25 同方威视技术股份有限公司 人体安全检查设备
FR3034527B1 (fr) * 2015-04-02 2019-11-01 Microwave Characterization Center Dispositif d'imagerie et procede d'imagerie correspondant
CN104931816B (zh) * 2015-05-31 2018-01-05 南京理工大学 一种纤维织物的毫米波辐射特性测量装置及测量方法
CN104849294A (zh) * 2015-06-05 2015-08-19 公安部第三研究所 一种基于极高频脉冲电磁波的物品查探装置
CN105675042B (zh) * 2015-12-28 2018-08-10 同方威视技术股份有限公司 射线标定装置及其操作方法、辐射成像系统及其操作方法
CN106344061B (zh) * 2016-08-08 2019-09-17 东软医疗系统股份有限公司 多叶光栅叶片运动位置控制装置、方法及直线加速度器
CN106441593A (zh) * 2016-09-29 2017-02-22 中国检验检疫科学研究院 温度探测头、温度探测设备和温度探测方法
CN109730635A (zh) * 2018-12-21 2019-05-10 杭州新瀚光电科技有限公司 一种太赫兹波与远红外融合成像系统
CN109856696B (zh) * 2018-12-29 2024-10-29 同方威视技术股份有限公司 毫米波/太赫兹波成像设备及人体或物品检测方法
CN109870740B (zh) * 2018-12-29 2024-03-01 清华大学 毫米波/太赫兹波成像设备及其反射板调节装置
CN109870738B (zh) * 2018-12-29 2024-06-14 清华大学 毫米波/太赫兹波成像设备及其校正方法
CN109828313B (zh) * 2018-12-29 2023-11-24 清华大学 毫米波/太赫兹波成像设备及对人体或物品的检测方法
CN109444978B (zh) * 2018-12-29 2024-02-02 清华大学 毫米波/太赫兹波成像设备及对人体或物品的检测方法
CN109521492B (zh) * 2018-12-29 2024-11-15 同方威视技术股份有限公司 毫米波/太赫兹波安检仪及其反射板扫描驱动装置
EP3904916B1 (en) * 2018-12-29 2024-11-06 Tsinghua University Millimeter wave/terahertz wave imaging apparatus, and detection method thereof
CN110389388B (zh) * 2019-08-06 2020-11-13 哈尔滨工业大学 机械联动扫描式被动毫米波成像装置
CN111077415B (zh) * 2019-12-04 2024-12-13 浙江红相科技股份有限公司 一种基于全日盲技术的紫外成像仪
CN111998810B (zh) * 2020-09-10 2025-06-06 深圳市博铭维技术股份有限公司 一种竖井支管检测装置
CN112698314B (zh) * 2020-12-07 2023-06-23 四川写正智能科技有限公司 一种基于毫米波雷达传感器的儿童智能健康管理方法
US11567015B2 (en) * 2020-12-30 2023-01-31 Boulder Environmental Sciences and Technology Systems for passive microwave remote sensing and their calibration methods

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Also Published As

Publication number Publication date
WO2011079790A1 (zh) 2011-07-07
EP2589990A4 (en) 2013-05-08
CN102313907B (zh) 2014-04-09
PL2589990T3 (pl) 2019-02-28
JP2013535010A (ja) 2013-09-09
CN102313907A (zh) 2012-01-11
US8513615B2 (en) 2013-08-20
RU2521781C1 (ru) 2014-07-10
EP2589990B1 (en) 2018-08-15
EP2728386B1 (en) 2019-04-03
EP2589990A1 (en) 2013-05-08
KR20130057452A (ko) 2013-05-31
US20120085909A1 (en) 2012-04-12
KR101515060B1 (ko) 2015-04-24
EP2728386A1 (en) 2014-05-07
JP5802267B2 (ja) 2015-10-28

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