PL2757354T3 - Detekcja sił elektrostatycznych - Google Patents
Detekcja sił elektrostatycznychInfo
- Publication number
- PL2757354T3 PL2757354T3 PL13152156T PL13152156T PL2757354T3 PL 2757354 T3 PL2757354 T3 PL 2757354T3 PL 13152156 T PL13152156 T PL 13152156T PL 13152156 T PL13152156 T PL 13152156T PL 2757354 T3 PL2757354 T3 PL 2757354T3
- Authority
- PL
- Poland
- Prior art keywords
- detection
- electrostatic forces
- electrostatic
- forces
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01G—WEIGHING
- G01G21/00—Details of weighing apparatus
- G01G21/28—Frames, Housings
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01G—WEIGHING
- G01G23/00—Auxiliary devices for weighing apparatus
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01G—WEIGHING
- G01G23/00—Auxiliary devices for weighing apparatus
- G01G23/01—Testing or calibrating of weighing apparatus
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01G—WEIGHING
- G01G23/00—Auxiliary devices for weighing apparatus
- G01G23/14—Devices for determining tare weight or for cancelling out the tare by zeroising, e.g. mechanically operated
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01G—WEIGHING
- G01G9/00—Methods of, or apparatus for, the determination of weight, not provided for in groups G01G1/00 - G01G7/00
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P74/00—Testing or measuring during manufacture or treatment of wafers, substrates or devices
- H10P74/20—Testing or measuring during manufacture or treatment of wafers, substrates or devices characterised by the properties tested or measured, e.g. structural or electrical properties
- H10P74/203—Structural properties, e.g. testing or measuring thicknesses, line widths, warpage, bond strengths or physical defects
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
- Investigating Or Analyzing Materials By The Use Of Electric Means (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| EP13152156.9A EP2757354B1 (de) | 2013-01-22 | 2013-01-22 | Detektion elektrostatischer Kräfte |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| PL2757354T3 true PL2757354T3 (pl) | 2016-03-31 |
Family
ID=47832880
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| PL13152156T PL2757354T3 (pl) | 2013-01-22 | 2013-01-22 | Detekcja sił elektrostatycznych |
Country Status (5)
| Country | Link |
|---|---|
| US (1) | US9194736B2 (pl) |
| EP (1) | EP2757354B1 (pl) |
| JP (1) | JP6271262B2 (pl) |
| CN (1) | CN103940500B (pl) |
| PL (1) | PL2757354T3 (pl) |
Families Citing this family (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP6418019B2 (ja) * | 2015-03-17 | 2018-11-07 | 株式会社島津製作所 | 電子天秤 |
| JP6708265B2 (ja) * | 2017-01-17 | 2020-06-10 | 株式会社島津製作所 | 電子天秤 |
| CN108627227B (zh) * | 2017-05-10 | 2019-06-25 | 新疆畜牧科学院畜牧业质量标准研究所 | 应用静电荷互斥毛绒称重器测量毛绒样品质量的方法 |
| CN108627226B (zh) * | 2017-05-10 | 2024-06-07 | 新疆畜牧科学院畜牧业质量标准研究所 | 电场同性静电荷互斥式毛绒称重器 |
| DE102019135276A1 (de) * | 2019-12-19 | 2021-06-24 | James Bradley | Vorrichtung zur Messung des Füllinhalts flüssigkeitsgefüllter Behältnisse |
| DE102021104307B4 (de) * | 2021-02-23 | 2025-03-13 | Sartorius Lab Instruments Gmbh & Co. Kg | Verfahren zum Betrieb einer Waage mit Ionisator |
Family Cites Families (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CH678570A5 (en) * | 1989-07-19 | 1991-09-30 | Mettler Toledo Ag | Wind shield for chemical weighing balance - has outer weighing space and internal chamber enclosing scales |
| CH683715A5 (de) * | 1992-06-05 | 1994-04-29 | Mettler Toledo Ag | Präzisionswaage. |
| DE20018310U1 (de) | 1999-11-08 | 2001-03-29 | Sartorius AG, 37075 Göttingen | Analysenwaage zur Wägung von elektrostatisch aufgeladenem Wägegut |
| GB0016562D0 (en) * | 2000-07-05 | 2000-08-23 | Metryx Limited | Apparatus and method for investigating semiconductor wafers |
| DE102005013441A1 (de) * | 2004-12-22 | 2006-07-06 | Micro-Epsilon Messtechnik Gmbh & Co Kg | Sensor mit kapazitivem Messprinzip |
| DE502006005574D1 (de) * | 2006-01-27 | 2010-01-21 | Mettler Toledo Ag | Verfahren und Vorrichtung zum Betrieb einer Waage |
| GB0719469D0 (en) * | 2007-10-04 | 2007-11-14 | Metryx Ltd | Measurement apparatus and method |
| JP5317747B2 (ja) * | 2009-02-16 | 2013-10-16 | 株式会社エー・アンド・デイ | 除電機能を有する電子秤 |
-
2013
- 2013-01-22 PL PL13152156T patent/PL2757354T3/pl unknown
- 2013-01-22 EP EP13152156.9A patent/EP2757354B1/de active Active
-
2014
- 2014-01-20 US US14/159,081 patent/US9194736B2/en active Active
- 2014-01-21 JP JP2014008261A patent/JP6271262B2/ja active Active
- 2014-01-21 CN CN201410027768.8A patent/CN103940500B/zh active Active
Also Published As
| Publication number | Publication date |
|---|---|
| EP2757354B1 (de) | 2015-09-30 |
| CN103940500A (zh) | 2014-07-23 |
| JP6271262B2 (ja) | 2018-01-31 |
| JP2014142341A (ja) | 2014-08-07 |
| US20140202775A1 (en) | 2014-07-24 |
| EP2757354A1 (de) | 2014-07-23 |
| US9194736B2 (en) | 2015-11-24 |
| CN103940500B (zh) | 2018-04-24 |
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