PL2796897T3 - Detektor półprzewodnikowy - Google Patents

Detektor półprzewodnikowy

Info

Publication number: PL2796897T3
Authority: PL; Poland
Prior art keywords: semiconductor detector; detector; semiconductor
Prior art date: 2013-04-26

Application number

PL14150977T

Other languages

English (en)

Inventor

Yuanjing Li

Lan Zhang

Yulan Li

Yinong Liu

Jianqiang Fu

Hao Jiang

Zhi DENG

Tao Xue

Wei Zhang

Jun Li

Original Assignee

Tsinghua University

Nuctech Company Limited

Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)

2013-04-26

Filing date

2014-01-13

Publication date

2019-12-31

2013-04-26 Priority claimed from CN 201320218487 external-priority patent/CN203204163U/zh

2013-04-26 Priority claimed from CN2013101493976A external-priority patent/CN103235332A/zh

2014-01-13 Application filed by Tsinghua University, Nuctech Company Limited filed Critical Tsinghua University

2019-12-31 Publication of PL2796897T3 publication Critical patent/PL2796897T3/pl

Links

239000004065 semiconductor Substances 0.000 title 1

Classifications

- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
- G01T1/36—Measuring spectral distribution of X-rays or of nuclear radiation spectrometry
- G01T1/366—Measuring spectral distribution of X-rays or of nuclear radiation spectrometry with semi-conductor detectors
- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
- G01T1/16—Measuring radiation intensity
- G01T1/24—Measuring radiation intensity with semiconductor detectors
- G01T1/241—Electrode arrangements, e.g. continuous or parallel strips or the like
- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T3/00—Measuring neutron radiation
- G01T3/08—Measuring neutron radiation with semiconductor detectors

Landscapes

Physics & Mathematics (AREA)
Spectroscopy & Molecular Physics (AREA)
Health & Medical Sciences (AREA)
Life Sciences & Earth Sciences (AREA)
General Physics & Mathematics (AREA)
High Energy & Nuclear Physics (AREA)
Molecular Biology (AREA)
Measurement Of Radiation (AREA)

PL14150977T 2013-04-26 2014-01-13 Detektor półprzewodnikowy PL2796897T3 (pl)

Applications Claiming Priority (3)

Application Number	Priority Date	Filing Date	Title
CN 201320218487 CN203204163U (zh)	2013-04-26	2013-04-26	一种半导体探测器
CN2013101493976A CN103235332A (zh)	2013-04-26	2013-04-26	一种半导体探测器
EP14150977.8A EP2796897B1 (en)	2013-04-26	2014-01-13	Semiconductor detector

Publications (1)

Publication Number	Publication Date
PL2796897T3 true PL2796897T3 (pl)	2019-12-31

Family

ID=49989516

Family Applications (1)

Application Number	Title	Priority Date	Filing Date
PL14150977T PL2796897T3 (pl)	2013-04-26	2014-01-13	Detektor półprzewodnikowy

Country Status (4)

Country	Link
US (1)	US9766354B2 (pl)
EP (1)	EP2796897B1 (pl)
PL (1)	PL2796897T3 (pl)
WO (1)	WO2014172822A1 (pl)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number	Priority date	Publication date	Assignee	Title
US9618633B2 (en) *	2015-04-21	2017-04-11	Toshiba Medical Systems Corporation	Side-electrodes for a Faraday cage on a photon-counting detector array
DE102015116270B4 (de)	2015-09-25	2018-02-15	Deutsches Elektronen-Synchrotron Desy	Sensor zur Detektion von geladenen Teilchen und Photonen
DE102016203861A1 (de) *	2016-03-09	2017-09-14	Siemens Healthcare Gmbh	Konverterelement mit Leitelement
CN118839582B (zh) *	2024-06-25	2025-05-23	西安中核核仪器股份有限公司	一种圆角式高纯锗探测器的高精度表征方法

Family Cites Families (15)

* Cited by examiner, † Cited by third party
Publication number	Priority date	Publication date	Assignee	Title
GB1559664A (en) *	1977-02-17	1980-01-23	Tokyo Shibaura Electric Co	Semiconductor radiation detector
US6037595A (en)	1995-10-13	2000-03-14	Digirad Corporation	Radiation detector with shielding electrode
IL119075A (en) *	1996-08-14	1999-11-30	Imarad Imaging Systems Ltd	Semiconductor detector
US6175120B1 (en)	1998-05-08	2001-01-16	The Regents Of The University Of Michigan	High-resolution ionization detector and array of such detectors
US6069360A (en) *	1998-05-08	2000-05-30	Lund; James C.	Method and apparatus for electron-only radiation detectors from semiconductor materials
JP3900992B2 (ja) *	2002-04-02	2007-04-04	株式会社日立製作所	放射線検出器及び放射線検査装置
US7589324B2 (en)	2006-12-21	2009-09-15	Redlen Technologies	Use of solder mask as a protective coating for radiation detector
US7888651B2 (en) *	2007-05-21	2011-02-15	The Board Of Trustees Of The Leland Stanford Junior University	Method and system for using tissue-scattered coincidence photons for imaging
CN101577284B (zh)	2008-05-09	2011-04-13	同方威视技术股份有限公司	用于测量辐射的半导体探测器及成像装置
CN101576516B (zh) *	2008-05-09	2011-12-21	同方威视技术股份有限公司	气体辐射探测器及辐射成像系统
JP5155808B2 (ja) *	2008-10-08	2013-03-06	株式会社日立製作所	半導体放射線検出器および核医学診断装置
US20100252744A1 (en)	2009-04-06	2010-10-07	Koninklijke Philips Electronics N.V.	Radiation detector with a plurality of electrode systems
US20110108703A1 (en)	2009-11-10	2011-05-12	Orbotech Medical Solutions Ltd.	Segmented guard strip
CN203204163U (zh)	2013-04-26	2013-09-18	清华大学	一种半导体探测器
CN103235332A (zh) *	2013-04-26	2013-08-07	清华大学	一种半导体探测器

2013
- 2013-12-09 WO PCT/CN2013/001520 patent/WO2014172822A1/zh not_active Ceased
2014
- 2014-01-10 US US14/152,332 patent/US9766354B2/en active Active
- 2014-01-13 EP EP14150977.8A patent/EP2796897B1/en active Active
- 2014-01-13 PL PL14150977T patent/PL2796897T3/pl unknown

Also Published As

Publication number	Publication date
EP2796897B1 (en)	2019-04-17
EP2796897A1 (en)	2014-10-29
WO2014172822A1 (zh)	2014-10-30
US20140319635A1 (en)	2014-10-30
US9766354B2 (en)	2017-09-19

Publication	Publication Date	Title
TWI563660B (en)	2016-12-21	Semiconductor device
SG11201604650SA (en)	2016-07-28	Semiconductor device
SG10201707381WA (en)	2017-10-30	Semiconductor device
GB201313601D0 (en)	2013-09-11	Sensitive detector
GB201315208D0 (en)	2013-10-09	Compound semiconductor structure
GB2520762B (en)	2018-04-04	Gamma-ray detector
GB201510735D0 (en)	2015-08-05	Semiconductor device
PL2948319T3 (pl)	2016-12-30	Urządzenie blokujące
SG11201603049WA (en)	2016-05-30	Semiconductor device fabrication
GB2514556B (en)	2020-05-06	Locking device
GB201315698D0 (en)	2013-10-16	Heat detector
SG11201603413PA (en)	2016-05-30	Semiconductor device
EP2944004A4 (en)	2016-11-16	ERROR PROBABILITY DETECTOR
PL3042365T3 (pl)	2018-09-28	Czujnik temperatury
PL2862991T3 (pl)	2017-09-29	Urządzenie ryglujące
IL225872A (en)	2015-03-31	Photo detector semi-conductor with barrier
TWI563515B (en)	2016-12-21	Semiconductor device
GB2512202B (en)	2015-05-27	An object detector
GB201601645D0 (en)	2016-03-16	Radiation detectors
PL2796897T3 (pl)	2019-12-31	Detektor półprzewodnikowy
GB201310476D0 (en)	2013-07-24	Scintillator
SG10201404283UA (en)	2015-03-30	Semiconductor structure
GB2520247B (en)	2015-12-09	Edge Detector
PL2778325T3 (pl)	2021-07-26	Urządzenie ryglujące
EP3054320A4 (en)	2016-09-28	RADIATION DETECTOR