PL3188194T3 - Kolimator oraz zawierający go system kontroli - Google Patents

Kolimator oraz zawierający go system kontroli

Info

Publication number
PL3188194T3
PL3188194T3 PL16191080T PL16191080T PL3188194T3 PL 3188194 T3 PL3188194 T3 PL 3188194T3 PL 16191080 T PL16191080 T PL 16191080T PL 16191080 T PL16191080 T PL 16191080T PL 3188194 T3 PL3188194 T3 PL 3188194T3
Authority
PL
Poland
Prior art keywords
collimator
same
inspection system
inspection
Prior art date
Application number
PL16191080T
Other languages
English (en)
Inventor
Kejun Kang
Ying Li
Jianmin Li
Yulan Li
Guoping ZHU
Original Assignee
Tsinghua University
Nuctech Company Limited
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tsinghua University, Nuctech Company Limited filed Critical Tsinghua University
Publication of PL3188194T3 publication Critical patent/PL3188194T3/pl

Links

Classifications

    • G—PHYSICS
    • G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21K—HANDLING OF PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
    • G21K1/00—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating
    • G21K1/02—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating using diaphragms, collimators
    • G21K1/04—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating using diaphragms, collimators using variable diaphragms, shutters, choppers
    • G21K1/043—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating using diaphragms, collimators using variable diaphragms, shutters, choppers changing time structure of beams by mechanical means, e.g. choppers, spinning filter wheels
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
    • G—PHYSICS
    • G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21K—HANDLING OF PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
    • G21K1/00—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating
    • G21K1/02—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating using diaphragms, collimators
    • G21K1/04—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating using diaphragms, collimators using variable diaphragms, shutters, choppers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01V—GEOPHYSICS; GRAVITATIONAL MEASUREMENTS; DETECTING MASSES OR OBJECTS; TAGS
    • G01V5/00—Prospecting or detecting by the use of ionising radiation, e.g. of natural or induced radioactivity
    • G01V5/20—Detecting prohibited goods, e.g. weapons, explosives, hazardous substances, contraband or smuggled objects
    • G01V5/22—Active interrogation, i.e. by irradiating objects or goods using external radiation sources, e.g. using gamma rays or cosmic rays
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/03—Investigating materials by wave or particle radiation by transmission
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/10—Different kinds of radiation or particles
    • G01N2223/101—Different kinds of radiation or particles electromagnetic radiation
    • G01N2223/1013—Different kinds of radiation or particles electromagnetic radiation gamma
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/10—Different kinds of radiation or particles
    • G01N2223/101—Different kinds of radiation or particles electromagnetic radiation
    • G01N2223/1016—X-ray
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/10—Different kinds of radiation or particles
    • G01N2223/106—Different kinds of radiation or particles neutrons
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/30—Accessories, mechanical or electrical features
    • G01N2223/316—Accessories, mechanical or electrical features collimators
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/30—Accessories, mechanical or electrical features
    • G01N2223/33—Accessories, mechanical or electrical features scanning, i.e. relative motion for measurement of successive object-parts
    • G01N2223/3301—Accessories, mechanical or electrical features scanning, i.e. relative motion for measurement of successive object-parts beam is modified for scan, e.g. moving collimator
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/30—Accessories, mechanical or electrical features
    • G01N2223/33—Accessories, mechanical or electrical features scanning, i.e. relative motion for measurement of successive object-parts
    • G01N2223/3302—Accessories, mechanical or electrical features scanning, i.e. relative motion for measurement of successive object-parts object and detector fixed
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/60—Specific applications or type of materials
    • G01N2223/66—Specific applications or type of materials multiple steps inspection, e.g. coarse/fine

Landscapes

  • Physics & Mathematics (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • General Engineering & Computer Science (AREA)
  • Engineering & Computer Science (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Geophysics (AREA)
  • Health & Medical Sciences (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • General Life Sciences & Earth Sciences (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Measurement Of Radiation (AREA)
  • Apparatus For Radiation Diagnosis (AREA)
  • Radiation-Therapy Devices (AREA)
  • Radar Systems Or Details Thereof (AREA)
PL16191080T 2015-12-28 2016-09-28 Kolimator oraz zawierający go system kontroli PL3188194T3 (pl)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
CN201511001491.2A CN105403580B (zh) 2015-12-28 2015-12-28 准直器和检查系统
EP16191080.7A EP3188194B1 (en) 2015-12-28 2016-09-28 Collimator and inspection system having the same

Publications (1)

Publication Number Publication Date
PL3188194T3 true PL3188194T3 (pl) 2021-02-08

Family

ID=55469200

Family Applications (1)

Application Number Title Priority Date Filing Date
PL16191080T PL3188194T3 (pl) 2015-12-28 2016-09-28 Kolimator oraz zawierający go system kontroli

Country Status (9)

Country Link
US (1) US10658088B2 (pl)
EP (1) EP3188194B1 (pl)
CN (1) CN105403580B (pl)
BR (1) BR112017025677B1 (pl)
EA (1) EA201792410A1 (pl)
MY (1) MY198131A (pl)
PL (1) PL3188194T3 (pl)
SG (1) SG11201709938UA (pl)
WO (1) WO2017113834A1 (pl)

Families Citing this family (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN105403580B (zh) 2015-12-28 2018-10-09 清华大学 准直器和检查系统
CN105903124B (zh) * 2016-06-30 2019-08-13 东软医疗系统股份有限公司 一种准直器
CN106841249A (zh) * 2017-04-12 2017-06-13 北京君和信达科技有限公司 透射式辐射成像系统
CN107807137A (zh) * 2017-10-25 2018-03-16 同方威视技术股份有限公司 前准直器以及扫描成像设备
CN107796838B (zh) * 2017-10-25 2024-09-20 同方威视技术股份有限公司 后准直器以及扫描成像设备
CN108375592A (zh) * 2018-03-27 2018-08-07 许昌瑞示电子科技有限公司 射线检测设备及系统、安装架、横梁、准直器及其组件
CN109273131B (zh) * 2018-10-31 2024-07-02 同方威视技术股份有限公司 准直器组件和射线检测设备
CN109659061B (zh) * 2018-12-27 2020-06-23 中国原子能科学研究院 发散角连续可调的中子准直器结构及其标定方法
KR20220062040A (ko) 2019-09-12 2022-05-13 올쏘스캔 인코포레이티드 무단 시준을 갖는 미니 c-아암 촬상 시스템
CN111407304B (zh) * 2020-03-31 2020-11-13 汕头市超声仪器研究所有限公司 一种x射线源的屏蔽准直结构
CN111773558B (zh) * 2020-07-01 2021-05-11 苏州雷泰医疗科技有限公司 一种使用光栅伺服剂量率的方法、装置及放射治疗设备
KR102876076B1 (ko) * 2020-12-09 2025-10-23 한국해양과학기술원 방사선 콜리메이팅 시스템
CN114764071B (zh) * 2020-12-31 2025-09-09 同方威视技术股份有限公司 射线发射装置和辐射检查设备
CN112890845A (zh) * 2021-03-31 2021-06-04 武汉联影生命科学仪器有限公司 Ct准直装置及具有该ct准直装置的ct设备
CN115798775A (zh) * 2021-09-09 2023-03-14 同方威视技术股份有限公司 射线准直设备和辐射检查设备
US20250325240A1 (en) * 2024-04-17 2025-10-23 United Imaging Healthcare North America, Inc. Imaging systems, methods, and apparatus thereof

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US2570820A (en) 1950-05-29 1951-10-09 Philips Lab Inc X-ray cone assembly
US3151245A (en) * 1961-11-21 1964-09-29 High Voltage Engineering Corp X-ray beam collimating apparatus
US3829701A (en) * 1973-01-29 1974-08-13 Picker Corp Radiation collimator
FR2524655B1 (fr) * 1982-04-02 1985-10-18 Cgr Mev Bloc limiteur partiel d'un faisceau de rayonnement et collimateur comportant de tels blocs
US5165106A (en) * 1991-06-06 1992-11-17 Siemens Medical Laboratories, Inc. Contour collimator
US5493596A (en) * 1993-11-03 1996-02-20 Annis; Martin High-energy X-ray inspection system
US5666393A (en) * 1994-02-17 1997-09-09 Annis; Martin Method and apparatus for reducing afterglow noise in an X-ray inspection system
US5748703A (en) * 1994-03-22 1998-05-05 Cosman; Eric R. Dynamic collimator for a linear accelerator
JPH11248650A (ja) * 1998-03-06 1999-09-17 Mac Science:Kk Ｘ線回折顕微装置
DE10244898B4 (de) 2002-09-26 2010-04-29 Siemens Ag Einblendvorrichtung und Computertomographiegerät mit einer strahlerseitigen Einblendvorrichtung
WO2008110977A1 (en) * 2007-03-13 2008-09-18 Philips Intellectual Property & Standards Gmbh Add-on-x-ray-collimator for non-symmetrical beam collimation
US20080298546A1 (en) 2007-05-31 2008-12-04 General Electric Company Cargo container inspection method
CA2723719A1 (en) * 2008-05-08 2009-11-12 L-3 Communications Security And Detection Systems, Inc. Adaptive scanning in an imaging system
US20100119033A1 (en) * 2008-11-12 2010-05-13 The Methodist Hospital Research Institute Intensity-modulated, cone-beam computed tomographic imaging system, methods, and apparatus
RU2393633C1 (ru) 2009-03-10 2010-06-27 Открытое акционерное общество "Концерт "Созвездие" Устройство декодирования турбокодов
JP2012007935A (ja) * 2010-06-23 2012-01-12 Sumitomo Electric Ind Ltd Ｘ線回折装置
CN202013328U (zh) * 2010-12-31 2011-10-19 同方威视技术股份有限公司 一种背散射成像用射线束的扫描装置
CN102824186A (zh) * 2012-08-29 2012-12-19 丰盛科技集团有限公司 计算机断层扫描系统中小感兴趣区域的x射线准直器及其扫描成像方法
CN104464871B (zh) * 2014-12-30 2017-11-21 同方威视技术股份有限公司 射线过滤装置和双能x射线检查系统
CN205263000U (zh) * 2015-12-28 2016-05-25 清华大学 准直器和检查系统
CN105403580B (zh) 2015-12-28 2018-10-09 清华大学 准直器和检查系统

Also Published As

Publication number Publication date
BR112017025677A2 (pt) 2018-08-07
CN105403580A (zh) 2016-03-16
WO2017113834A1 (zh) 2017-07-06
BR112017025677B1 (pt) 2021-07-13
CN105403580B (zh) 2018-10-09
US10658088B2 (en) 2020-05-19
US20170186507A1 (en) 2017-06-29
MY198131A (en) 2023-08-06
EP3188194B1 (en) 2020-09-02
EP3188194A2 (en) 2017-07-05
EP3188194A3 (en) 2017-11-15
SG11201709938UA (en) 2017-12-28
EA201792410A1 (ru) 2018-03-30

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